Nominal PbSe nano-islands on PbTe : Grown by MBE, analyzed by AFM and TEM

• Nominal PbSe nano-islands were grown in the Stranski-Krustanow mode on (111) oriented PbTe/BaF 2 pseudo-substrates by molecular beam epitaxy (MBE). The number density and morphology of these islands were assessed by means of atomic force microscopy (AFM). Transmission electron microscopy (TEM) was employed to determine the strain state and cryslallographic structure of these islands. On the basis of both AFM and TEM analyses, we distinguish between different groups of tensibly strained islands. The suggestion is made to use such nano-islands as part of nanometrology standards for scanning probe microscopy.

Ämnesord

TEKNIK OCH TEKNOLOGIER  -- Materialteknik (hsv//swe)

ENGINEERING AND TECHNOLOGY  -- Materials Engineering (hsv//eng)

Nyckelord

Atomic ordering

Nanometrology

Scanning probe microscopy

Strain state

Atomic force microscopy

Crystal orientation

Crystal structure

Crystallography

Lead compounds

Molecular beam epitaxy

Morphology

Semiconductor quantum dots

Strain

Transmission electron microscopy

Wetting

Nanostructured materials

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