| 1. |
- Afrasiabi, Roodabeh, et al.
(författare)
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Microwave mediated synthesis of semiconductor quantum dots
- 2012
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Ingår i: Physica Status Solidi. C, Current topics in solid state physics. - : Wiley. - 1610-1634 .- 1610-1642. ; 9:7, s. 1551-1556
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Tidskriftsartikel (refereegranskat)abstract
- Colloidal quantum dots (QD) have tuneable optoelectronic properties and can be easily handled by simple solution processing techniques, making them very attractive for a wide range of applications. Over the past decade synthesis of morphology controlled high quality (crystalline, monodisperse) colloidal QDs by thermal decomposition of organometallic precursors has matured and is well studied. Recently, synthesis of colloidal QDs by microwave irradiation as heating source is being studied due to the inherently different mechanisms of heat transfer, when compared to solvent convection based heating. Under microwave irradiation, polar precursor molecules directly absorb the microwave energy and heat up more efficiently. Here we report synthesis of colloidal II-VI semiconductor QDs (CdS, CdSe, CdTe) by microwave irradiation and compare it with conventional synthesis based on convection heating. Our findings show that QD synthesis by microwave heating is more efficient and the chalcogenide precursor strongly absorbs the microwave radiation shortening the reaction time and giving a high reaction yield.
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| 2. |
- Berlind, Torun, 1965-, et al.
(författare)
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Effects of ion concentration on refractive indices offluids measured by the minimum deviation technique
- 2008
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Ingår i: Physica Status Solidi. C, Current topics in solid state physics. - Weinheim : WILEY-VCH Verlag GmbH & Co. KGaA. - 1610-1634 .- 1610-1642. ; 5:5, s. 1249-1252
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Tidskriftsartikel (refereegranskat)abstract
- The prism minimum deviation technique has been used to measure the fluid dependence of refractive indices. Fluids with varying ion concentration (0 to 1.0 M) and varying protein concentration (0.01-10 mg/ml) have been examined and the measurements show that these parameters influence the refractive index values. Also it is shown by simulations that it is important to take the change of refractive index of the fluid into account when evaluating insitu protein adsorption measurements.
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| 3. |
- Bi, Zhaoxia, et al.
(författare)
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InN quantum dots on GaN nanowires grown by MOVPE
- 2014
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Ingår i: physica status solidi (c). - : Wiley. - 1862-6351 .- 1610-1642 .- 1610-1634. ; 11, s. 421-424
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Tidskriftsartikel (refereegranskat)abstract
- In this work, growth of InN quantum dots (QDs) on GaN nanowires (NWs) by metal-organic vapour phase epitaxy is demonstrated, illustrating the feasibility to combine 0D and 1D structures for nitride semiconductors. Selective area growth was used to generate arrays of c-oriented GaN NWs using Si3N4 as the mask material. In general, InN QDs tend to form at the NW edges between the m-plane side facets, but the QD growth can also be tuned to the side facets by controlling the growth temperature and the growth rate. TEM characterization reveals that I1-type stacking faults are formed in the QDs and originate from the misfit dislocations at the InN/GaN interface. Photoluminescence measurement at 4 K shows that the peak shifts to high energy with reduced dot size. (C) 2014 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim
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| 4. |
- Chulapakorn, Thawatchart, 1988-, et al.
(författare)
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MeV ion irradiation effects on the luminescence properties of Si-implanted SiO2-thin films
- 2016
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Ingår i: Physica Status Solidi (C) Current Topics in Solid State Physics. - : Wiley-VCH Verlagsgesellschaft. - 1862-6351 .- 1610-1634 .- 1610-1642. ; 13:10-12, s. 921-926
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Tidskriftsartikel (refereegranskat)abstract
- The effects of MeV heavy ion irradiation at varying fluence and flux on excess Si, introduced in SiO2 by keV ion implantation, are investigated by photoluminescence (PL). From the PL peak wavelength (λ) and decay lifetime (τ), two PL sources are distinguished: i) quasi-direct recombination of excitons of Si-nanoparticles (SiNPs), appearing after thermal annealing (λ > 720 nm, τ ∼ μs), and ii) fast-decay PL, possibly due to oxide-related defects (λ ∼ 575-690 nm, τ ∼ ns). The fast-decay PL (ii) observed before and after ion irradiation is induced by ion implantation. It is found that this fast-decay luminescence decreases for higher irradiation fluence of MeV heavy ions. After thermal annealing (forming SiNPs), the SiNP PL is reduced for samples irradiated by MeV heavy ions but found to stabilize at higher level for higher irradiation flux; the (ii) band vanishes as a result of annealing. The results are discussed in terms of the influence of electronic and nuclear stopping powers.
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| 5. |
- Dagnelund, Daniel, et al.
(författare)
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Effect of thermal annealing on defects in post-growth hydrogenated GaNP
- 2013
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Ingår i: Physica Status Solidi. C, Current topics in solid state physics. - : John Wiley & Sons. - 1610-1634 .- 1610-1642. ; 10:4, s. 561-563
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Tidskriftsartikel (refereegranskat)abstract
- Effect of thermal annealing on paramagnetic centers in post-growth hydrogenated GaN0.0081P0.9919 epilayer is examined by means of photoluminescence and optically detected magnetic resonance (ODMR) techniques. In recent studies, several Ga-interstitial (Gai) related centers were found to be activated by the presence of hydrogen in the hydrogenated GaNP alloys. These centers compete with near-band edge radiative recombination. Annealing at 400 ºC in Ar-ambient is found to cause quenching of the Gai-related ODMR signals that were activated by post-growth hydrogenation. We tentatively ascribe this effect to dissociation of the H-Gai complexes and subsequent out-diffusion of H.
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| 6. |
- Darakchieva, V., et al.
(författare)
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Phonons in strained AlGaN/GaN superlattices
- 2007
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Ingår i: Physica Status Solidi. C, Current topics in solid state physics. - : Wiley. - 1610-1634 .- 1610-1642. ; 4:1, s. 170-174
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Tidskriftsartikel (refereegranskat)abstract
- Phonons in strained AlGaN/GaN superlattices (SLs) with constant periods but different Al composition have been studied using a combination of infrared spectroscopic ellipsometry and Raman scattering spectroscopy. The following SL modes were identified: i) AlGaN localized E1(TO) modes identified for the first time and AlGaN localized A1 (LO) phonons; ii) GaN localized E2, E1(TO) and A1(LO) phonons; iii) delocalized E1(LO) phonons; iv) A1(TO) phonon; v) two modes around 660 cm-1 and 594-625 cm-1, respectively, not predicted by theory. The effects of strain and composition on the phonon frequencies were established and discussed.
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| 7. |
- Eberlein, T.A.G., et al.
(författare)
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Movement and pinning of dislocations in SiC
- 2007
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Ingår i: Physica Status Solidi. C, Current topics in solid state physics. - : Wiley. - 1610-1634 .- 1610-1642. ; 4:8, s. 2923-2928
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Tidskriftsartikel (refereegranskat)abstract
- SiC bipolar devices show a degradation under forward-biased operation due to the formation and rapid propagation of stacking faults in the active region of the device. It is believed that the observed rapid stacking fault growth is due to a recombination-enhanced dislocation glide (REDG) mechanism at the bordering partial dislocations having either Si or C core atoms. We investigated the effect of charge on the dislocation kinks and found that only silicon kinks have a deep filled band above the valence band. Trapping of holes into this band permits dislocation glide at room temperature. This mechanism is distinct from REDG as it requires only holes to be trapped at a Si partial and not in addition electrons in stacking fault states. We furthermore looked at the pinning of dislocations by nitrogen and boron and found a strong pinning of the C core by N and of the Si core by B.
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| 8. |
- Fokine, Michael, 1970-, et al.
(författare)
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Spectral features of specular reflection from nanoparticle films
- 2010
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Ingår i: Physica Status Solidi. C, Current topics in solid state physics. - : Wiley. - 1610-1634 .- 1610-1642. ; 8:9, s. 2673-2675
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Tidskriftsartikel (refereegranskat)abstract
- In this work we analyze the internal reflection (Fresnel reflection) from Au nanoparticles on the end face of optical fibers. We demonstrate that changes in the refractive index of the surrounding medium can be detected by shifts in the reflection spectra associated with changes in the Localized Surface Plasmon Resonance of the Au-Nanoparticles. The spectral response is simulated using a model based on the interference in multilayer structures and can be described by transfer-matrix method.
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| 9. |
- Gogova, D., et al.
(författare)
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HVPE GaN substrates : growth and characterization
- 2010
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Ingår i: Physica Status Solidi. C, Current topics in solid state physics. - : Wiley. - 1610-1634 .- 1610-1642. ; 7:7-8, s. 1756-1759
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Tidskriftsartikel (refereegranskat)abstract
- GaN substrates with low dislocation densities were prepared by halide vapor-phase epitaxy (HVPE) on c-plane sapphire and by means of a post-growth laser-induced lift-off or natural stress-induced (self-) separation process. The HVPE growth on InGaN/GaN buffer layers and subsequent self-separation method was seen as advantageous, in comparison with the laser-induced lift-off one, in terms of lower cost and better crystalline quality of the GaN material obtained. (© 2010 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim)
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| 10. |
- Grini, Sigbjörn, et al.
(författare)
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Secondary ion mass spectrometry as a tool to study selenium gradient in Cu2ZnSn(S,Se)4
- 2017
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Ingår i: Physica Status Solidi. C, Current topics in solid state physics. - : Wiley. - 1610-1634 .- 1610-1642. ; :6
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Tidskriftsartikel (refereegranskat)abstract
- Secondary ion mass spectrometry (SIMS) has been utilized to study compositional gradients in compound-sputtered and annealed Cu2ZnSn(S,Se)(4) (CZTSSe). SIMS image depth profiling shows a non-uniform spatial distribution of selenium and supports a mechanism where selenization is accompanied by grain growth rather than substitution of selenium for sulfur. Furthermore, SIMS depth profiles of S and Se using O-2(+) primary ions and detecting molecular ions of the MCs+ type using Cs+ primary ions have been compared, where a linear relationship between the sulfur and selenium concentration suitable for compositional analysis is observed for concentrations with an Se/(S+Se) ratio in the range from 0.25 to 0.65. 3D image of the spatial Se distribution in a 20 x 20 mu m(2) grid measured with SIMS image depth profiling.
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