| 1. |
- Arnaudov, B, et al.
(författare)
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Energy position of near-band-edge emission spectra of InN epitaxial layers with different doping levels
- 2004
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Ingår i: Physical Review B. Condensed Matter and Materials Physics. - 1098-0121 .- 1550-235X. ; 69:11
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Tidskriftsartikel (refereegranskat)abstract
- We studied the shape and energy position of near-band-edge photoluminescence spectra of InN epitaxial layers with different doping levels. We found that the experimental spectra of InN layers with moderate doping level can be nicely interpreted in the frames of the "free-to-bound" recombination model in degenerate semiconductors. For carrier concentrations above n>5x10(18) cm(-3) the emission spectra can also be modeled satisfactorily, but a contribution due to a pushing up of nonequilibrium holes over the thermal delocalization level in the valence band tails should be considered in the model. The emission spectra of samples with low doping level were instead explained as a recombination from the bottom of the conduction band to a shallow acceptor assuming the same value of the acceptor binding energy estimated from the spectra of highly doped samples. Analyzing the shape and energy position of the free-electron recombination spectra we determined the carrier concentrations responsible for the emissions and found that the fundamental band gap energy of InN is E-g=692+/-2 meV for an effective mass at the conduction-band minimum m(n0)=0.042m(0).
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| 2. |
- Arnaudov, B., et al.
(författare)
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Free-to-bound radiative recombination in highly conducting InN epitaxial layers
- 2004
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Ingår i: Superlattices and Microstructures. - : Elsevier BV. - 0749-6036 .- 1096-3677. ; 36:4-6, s. 563-571
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Tidskriftsartikel (refereegranskat)abstract
- We present a theoretical simulation of near-band-edge emission spectra of highly conducting n-InN assuming the model of 'free-to-bound' radiative recombination (FBRR) of degenerate electrons from the conduction band with nonequilibrium holes located in the valence band tails. We also study experimental photoluminescence (PL) spectra of highly conducting InN epitaxial layers grown by MBE and MOVPE with electron concentrations in the range (7.7 × 1017-6 × 1018) cm-3 and find that the energy positions and shape of the spectra depend on the impurity concentration. By modeling the experimental PL spectra of the InN layers we show that spectra can be nicely interpreted in the framework of the FBRR model with specific peculiarities for different doping levels. Analyzing simultaneously the shape and energy position of the InN emission spectra we determine the fundamental bandgap energy of InN to vary between Eg = 692 meV for effective mass mn0 = 0.042m0 and Eg =710 meV for mn0 = 0.1m0. © 2004 Elsevier Ltd. All rights reserved.
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| 3. |
- Arnaudov, B, et al.
(författare)
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Hall effect data analysis of GaN n(+)n structures
- 2002
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Ingår i: Physica status solidi. B, Basic research. - 0370-1972 .- 1521-3951. ; 234:3, s. 872-876
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Tidskriftsartikel (refereegranskat)abstract
- We develop a model for analysis of Hall effect data of GaN structures composed of sublayers with different thicknesses and contacts placed on the top surface, We analysed the contributions of the conductivity of every sublayer of a planar sample taking into account the fact that the sample sublayers are partially connected in parallel to each other by series resistances formed in areas lying below the contacts from the upper layer. Correction factors, which reduce the contribution of the underlying layers to the measured whole sample conductivity, are obtained from the equations relevant to the respective equivalent circuit.
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| 4. |
- Arnaudov, B., et al.
(författare)
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Magnetic-field-induced localization of electrons in InGaN/GaN multiple quantum wells
- 2003
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Ingår i: Applied Physics Letters. - : AIP Publishing. - 0003-6951 .- 1077-3118. ; 83:13, s. 2590-2592
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Tidskriftsartikel (refereegranskat)abstract
- A study was performed on the magnetic-field-induced localization of electrons in InGaN/GaN multiple quantum wells (MQW). A stepwise behavior of both the Hall coefficient and magnetoresistivity was observed. The peculiarities were explained by a magnetic-field-induced localization of electrons in a two-dimensional (2D) potential relief of the InGaN MQW.
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| 5. |
- Arnaudov, B, et al.
(författare)
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Modeling of the free-electron recombination band in emission spectra of highly conducting n-GaN
- 2001
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Ingår i: Physical Review B. Condensed Matter and Materials Physics. - 1098-0121 .- 1550-235X. ; 64:4
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Tidskriftsartikel (refereegranskat)abstract
- We simulate the spectral distribution of the free-electron recombination band in optical emission spectra of GaN with a free-carrier concentration in the range of 5 x 10(17)-1 x 10(20) cm(-3). The influence of several factors, such as nonparabolicity, electron-electron interaction. and electron-impurity interaction on both the spectral and energy position and the effective gap narrowing are taken into account. The calculated properties of the free-electron-related emission bands are used to interpret the experimental photoluminescence and cathodoluminescence spectra of GaN epitaxial layers.
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| 6. |
- Arnaudov, B, et al.
(författare)
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Multilayer model for Hall effect data analysis of semiconductor structures with step-changed conductivity
- 2003
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Ingår i: Physical Review B. Condensed Matter and Materials Physics. - 1098-0121 .- 1550-235X. ; 67:4
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Tidskriftsartikel (refereegranskat)abstract
- We present a multilayer model for analysis of Hall effect data of semiconductor structures composed of sublayers with different thicknesses and contacts placed on the top surface. Based on the circuit theory we analyze the contributions of the conductivity of every sublayer and derive general expressions for the conductivity and carrier mobility of a multilayer planar sample. The circuit analysis is performed taking into account the fact that the sample sublayers are partially connected in parallel to each other by series resistances formed in areas lying below the contacts from each upper layer. In order to solve the inverse problem of determining the electrical parameters of one of the sublayers, a procedure for analysis of the Hall effect data is proposed. The model is simplified for a structure composed of two layers with the same type of conductivity, and is used to determine the electrical parameters of GaN films grown on relatively thick GaN buffers.
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| 7. |
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| 8. |
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| 9. |
- Evtimova, S, et al.
(författare)
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Effect of carrier concentration on the microhardness of GaN layers
- 2003
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Ingår i: Journal of materials science. Materials in electronics. - 0957-4522 .- 1573-482X. ; 14:10-12, s. 771-772
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Tidskriftsartikel (refereegranskat)abstract
- The paper presents a microhardness study of thick crack-free hydride vapor phase epitaxial GaN layers (not intentionally doped), and of thin metal-organic vapor phase epitaxial (MOVPE) GaN layers (undoped and Si-doped), grown on sapphire. A Vickers indentation method was used to determine the microhardness under applied loads up to 2 N. An increase in the microhardness was observed with decreasing carrier concentration and increasing mobility. A dip at an indentation depth of about 0.75 mum is observed in the microhardness profile in the MOVPE films, and is correlated with peculiarities in the spatially resolved cathodoluminescence spectra. The relationship between the mechanical and electrophysical parameters is discussed. (C) 2003 Kluwer Academic Publishers.
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| 10. |
- Monemar, Bo, et al.
(författare)
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Optical investigation of AlGaN/GaN quantum wells and superlattices
- 2004
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Ingår i: Physica status solidi. A, Applied research. - : Wiley. - 0031-8965 .- 1521-396X. ; 201:10, s. 2251-2258
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Tidskriftsartikel (refereegranskat)abstract
- We report a detailed optical study of several sets of multiple quantum wells (MQWs) in the AlGaN/GaN system, as well as AlN/GaN superlattice (SL) structures. In this study all materials were grown by MOCVD, as opposed to most previous studies where MBE was employed. In undoped MQWs discrete photoluminescence (PL) peaks related to discrete well width fluctuations by one full c lattice parameter are clearly observed. In doped samples this effect appears to be screened. While the recombination process in undoped samples is excitonic, in MQWs doped with Si above about 5 x 10(18) cm(-3) free electrons (a 2DEG) are dominant, and the PL process is a free electrons-localized hole transition at low temperatures. The hole localization prevails up to very high n-doping, as was previously observed in bulk GaN. The hole localization is demonstrated via several experiments, including results on PL transient decay times and LO phonon coupling. Near surface band bending, due mainly to dopant depletion in doped structures or interaction with surface states in case of higher Al content in barriers, influences the distribution of electron filling among the QWs, making a detailed modeling of the spectral shape somewhat ambiguous. It is found that AlN barriers promote a strong room temperature PL signal from the QWs, as opposed to the case with AlGaN barriers.
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