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- Mustjoki, S., et al.
(författare)
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Clonal expansion of T/NK-cells during tyrosine kinase inhibitor dasatinib therapy
- 2009
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Ingår i: Leukemia. - : Springer Science and Business Media LLC. - 1476-5551 .- 0887-6924. ; 23:8, s. 1398-1405
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Tidskriftsartikel (refereegranskat)abstract
- Dasatinib, a broad-spectrum tyrosine kinase inhibitor (TKI), predominantly targets BCR-ABL and SRC oncoproteins and also inhibits off-target kinases, which may result in unexpected drug responses. We identified 22 patients with marked lymphoproliferation in blood while on dasatinib therapy. Clonality and immunophenotype were analyzed and related clinical information was collected. An abrupt lymphocytosis (peak count range 4-20 x 10(9)/l) with large granular lymphocyte (LGL) morphology was observed after a median of 3 months from the start of therapy and it persisted throughout the therapy. Fifteen patients had a cytotoxic T-cell and seven patients had an NK-cell phenotype. All T-cell expansions were clonal. Adverse effects, such as colitis and pleuritis, were common (18 of 22 patients) and were preceded by LGL lymphocytosis. Accumulation of identical cytotoxic T cells was also detected in pleural effusion and colon biopsy samples. Responses to dasatinib were good and included complete, unexpectedly long-lasting remissions in patients with advanced leukemia. In a phase II clinical study on 46 Philadelphia chromosome-positive acute lymphoblastic leukemia, patients with lymphocytosis had superior survival compared with patients without lymphocytosis. By inhibiting immunoregulatory kinases, dasatinib may induce a reversible state of aberrant immune reactivity associated with good clinical responses and a distinct adverse effect profile. Leukemia (2009) 23, 1398-1405; doi:10.1038/leu.2009.46; published online 19 March 2009
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- Likonen, J., et al.
(författare)
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Beryllium accumulation at the inner divertor of JET
- 2005
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Ingår i: Journal of Nuclear Materials. - : Elsevier BV. - 0022-3115 .- 1873-4820. ; 337-39:03-jan, s. 60-64
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Tidskriftsartikel (refereegranskat)abstract
- MkIIGB divertor tiles exposed in JET for the 1998-2001 and 1999-2001 campaigns have been used to assess the amount of beryllium and carbon deposited at the inner divertor wall. Total amount of Be at the inner divertor tiles was determined and integrated toroidally. Results were compared with data obtained with optical spectroscopy and good agreement was obtained. The amount of deposited C was computed from the amount of deposited Be assuming that the Be/C ratio arriving in the divertor is the same as the Be/C ratio in the main chamber. On the basis of this analysis we would expect there to be similar to 0.4 kg of C deposited. This gives an average C deposition rate lower than during the MkIIA phase.
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- Likonen, J., et al.
(författare)
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Structural investigation of re-deposited layers in JET
- 2008
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Ingår i: Journal of Nuclear Materials. - : Elsevier BV. - 0022-3115 .- 1873-4820. ; 377:3, s. 486-491
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Tidskriftsartikel (refereegranskat)abstract
- JET Mk-II Gas Box divertor tiles exposed in 1998-2001 have been analysed with various ion beam techniques, secondary ion mass spectrometry (SIMS) and Raman spectroscopy. Inner divertor wall tiles removed in 2001 were covered with a duplex film. The inner layer was very rich in metallic impurities, with Be/C - 1 and H-isotopes only present at low concentrations. The outer layer contained higher concentrations of D than normal for plasma-facing surfaces in JET (D/C - 0.4), and Be/C - 0.14. Raman and SIMS analyses show that the deposited films on inner divertor tiles are hydrogenated amorphous carbon with low sp' fractions. The deposits have polymeric structure and low density. Both Raman scattering and SIMS indicate that films on inner divertor wall Tiles 1 and 3, and on floor Tile 4 have some differences in the chemical structure of the deposited films
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- Sammelselg, V, et al.
(författare)
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Study of thin oxide films by electron, ion and synchrotron radiation beams
- 2002
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Ingår i: Microchimica Acta. - : Springer Science and Business Media LLC. - 1436-5073 .- 0026-3672. ; 139:1-4, s. 165-169
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Tidskriftsartikel (refereegranskat)abstract
- Titanium oxide and zirconium oxide thin films deposited on silicon substrates were characterised using electron probe microanalysis (EPMA), Rutherford backscattering spectroscopy (RBS), time-of-flight elastic recoil detection analysis (TOF-ERDA) and scanning photoelectron microscopy (SPEM). The composition and mass thickness of the films were determined and the results of different methods compared. It was revealed that the synchrotron radiation used for SPEM studies caused considerable modification of zirconia films grown at low temperatures.
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