| 1. |
- Ballantyne, Kaye N., et al.
(author)
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Toward Male Individualization with Rapidly Mutating Y-Chromosomal Short Tandem Repeats
- 2014
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In: Human Mutation. - : John Wiley & Sons. - 1059-7794 .- 1098-1004. ; 35:8, s. 1021-1032
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Journal article (peer-reviewed)abstract
- Relevant for various areas of human genetics, Y-chromosomal short tandem repeats (Y-STRs) are commonly used for testing close paternal relationships among individuals and populations, and for male lineage identification. However, even the widely used 17-loci Yfiler set cannot resolve individuals and populations completely. Here, 52 centers generated quality-controlled data of 13 rapidly mutating (RM) Y-STRs in 14,644 related and unrelated males from 111 worldwide populations. Strikingly, greater than99% of the 12,272 unrelated males were completely individualized. Haplotype diversity was extremely high (global: 0.9999985, regional: 0.99836-0.9999988). Haplotype sharing between populations was almost absent except for six (0.05%) of the 12,156 haplotypes. Haplotype sharing within populations was generally rare (0.8% nonunique haplotypes), significantly lower in urban (0.9%) than rural (2.1%) and highest in endogamous groups (14.3%). Analysis of molecular variance revealed 99.98% of variation within populations, 0.018% among populations within groups, and 0.002% among groups. Of the 2,372 newly and 156 previously typed male relative pairs, 29% were differentiated including 27% of the 2,378 father-son pairs. Relative to Yfiler, haplotype diversity was increased in 86% of the populations tested and overall male relative differentiation was raised by 23.5%. Our study demonstrates the value of RMY-STRs in identifying and separating unrelated and related males and provides a reference database.
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| 2. |
- Oates, T W H, et al.
(author)
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Characterization of plasmonic effects in thin films and metamaterials using spectroscopic ellipsometry
- 2011
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In: Progress in Surface Science. - : Elsevier. - 0079-6816 .- 1878-4240. ; 86:11-12, s. 328-376
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Research review (peer-reviewed)abstract
- In this article, spectroscopic ellipsometry studies of plasmon resonances at metal-dielectric interfaces of thin films are reviewed. We show how ellipsometry provides valuable non-invasive amplitude and phase information from which one can determine the effective dielectric functions, and how these relate to the material nanostructure and define exactly the plasmonic characteristics of the system. There are three related plasmons that are observable using spectroscopic ellipsometry; volume plasmon resonances, surface plasmon polaritons and particle plasmon resonances. We demonstrate that the established method of exploiting surface plasmon polaritons for chemical and biological sensing may be enhanced using the ellipsometric phase information and provide a comprehensive theoretical basis for the technique. We show how the particle and volume plasmon resonances in the ellipsometric spectra of nanoparticle films are directly related to size, surface coverage and constituent dielectric functions of the nanoparticles. The regularly observed splitting of the particle plasmon resonance is theoretically described using modified effective medium theories within the framework of ellipsometry. We demonstrate the wealth of information available from real-time in situ spectroscopic ellipsometry measurements of metal film deposition, including the evolution of the plasmon resonances and percolation events. Finally, we discuss how generalized and Mueller matrix ellipsometry hold great potential for characterizing plasmonic metamaterials and sub-wavelength hole arrays.
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| 3. |
- Akerlind, C, et al.
(author)
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Optical properties and switching of a Rose Bengal derivative: A spectroscopic ellipsometry study
- 2011
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In: THIN SOLID FILMS. - : Elsevier Science B.V., Amsterdam.. - 0040-6090. ; 519:11, s. 3582-3586
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Journal article (peer-reviewed)abstract
- Optical properties in terms of the complex-valued dielectric function were determined for spin-coated films of a Rose Bengal derivative using variable angle of incidence spectroscopic ellipsometry in the visible and infrared wavelength regions. In addition, the thickness and roughness of the films were determined and related to the solution concentration of Rose Bengal. Switching between two different oxidation states of the Rose Bengal derivative was investigated. The two states were chemically induced by exposure to vapors of hydrochloric acid and ammonia, respectively. A substantial and reversible change of the optical properties of the films was observed.
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| 4. |
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| 5. |
- Ashkenov, N., et al.
(author)
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Infrared dielectric functions and phonon modes of high-quality ZnO films
- 2003
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In: Journal of Applied Physics. - : AIP Publishing. - 0021-8979 .- 1089-7550. ; 93:1, s. 126-133
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Journal article (peer-reviewed)abstract
- A study was performed on the phonon modes and infrared dielectric functions of high-quality ZnO thin films. The pulsed laser deposition technique was used to deposit the ZnO films on c-plane sapphire substrates and were investigated by high-resolution transmission electron microscopy, high-resolution x-ray diffraction and Rutherford backscattering experiments. The accurate long-wavelength dielectric constant limits of the films were also obtained and were compared with near-band-gap index-of-refraction data upon the Lyddane-Sachs-Teller relation for both film and bulk samples. It was found that the phonon modes of the film were highly consistent with those of the bulk sample.
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| 6. |
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| 7. |
- Bergström, L, et al.
(author)
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Estimation of Hamaker constants of ceramic materials from optical data using Lifshitz theory
- 1996
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In: Journal of The American Ceramic Society. - 0002-7820 .- 1551-2916. ; 79, s. 339-348
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Journal article (peer-reviewed)abstract
- The Hamaker constants of 8 different ceramic materials, 6H-SiC, tetragonal, partially stabilized-ZrO2 (3% Y2O3), b-Si3N4, a-Al2O3, Y2O3, sapphire (single crystal a-Al2O3), MgO, MgAl2O4, and fused silica, across air, water, and n-dodecane at room temperature and across silica at 2000 K have been calculated from optical data using Lifshitz theory. Spectroscopic ellipsometry was used to measure the photon energy dependence of the refractive index, n, and the extinction coefficient, k, in the visible and near-UV range on several important ceramic materials. This relatively simple, nondestructive technique has proved to yield reliable optical data on sintered, polycrystalline materials like Si3N4, SiC, ZrO2 and Al2O3. For the other materials, Y2O3, sapphire, MgO, MgAl2O4 and fused silica, optical data from the literature were used to calculate the Hamaker constants. The calculated Hamaker constants were estimated to be accurate within ± 10%.
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| 8. |
- Bergström, L, et al.
(author)
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Spectroscopic ellipsometry characterisation and estimation of the Hamaker constant of cellulose
- 1999
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In: Cellulose. - 0969-0239 .- 1572-882X. ; 6, s. 1-13
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Journal article (peer-reviewed)abstract
- Calculations of Hamaker constants using Lifshitz theory require the availability of accurate dielectric data, especially in the visible-ultraviolet region. We present spectroscopic ellipsometry data on well defined cellulose films of a limited thickness range (100–140 layers) deposited on an oxidised and hydrophobised silicon substrate. The spectral data, representing measurements from a perpendicular orientation to the fibre deposition direction, was used for estimates of the necessary spectral parameters, i.e. the oscillator strengths and characteristic frequencies in the UV-range. Our calculations show that cellulose has a relatively low Hamaker constant in air (58 zJ) and water (8.0 zJ). The implications for the surface energy estimates of cellulose and colloidal interactions between cellulose and various types of fillers and coating colours were discussed.
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| 9. |
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| 10. |
- Bukaluk, A., et al.
(author)
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Auger electron spectroscopy, ellipsometry and photoluminescence investigations of Zn1-XBeXSe alloys
- 2001
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In: Applied Surface Science. - 0169-4332 .- 1873-5584. ; 175-176, s. 531-537
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Journal article (peer-reviewed)abstract
- In this paper, properties of the Zn1-XBeXSe crystals grown from the melt by the high-pressure Bridgman method are reported. Spectroscopic ellipsometry has been used for determination of the complex dielectric function of Zn1-XBeXSe. On the basis of the photon energy dependence of the dielectric function, the energy gaps of alloys containing different beryllium concentrations have been evaluated. Measurements of the photoluminescence (PL) spectra allowed to find the excitonic gap in the investigated alloys. Auger electron spectroscopy (AES) with simultaneous argon ion sputtering has been used for determination of surface composition. AES investigations allowed to make predictions concerning distribution of particular elements in the samples. © 2001 Elsevier Science B.V.
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