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Sökning: WFRF:(Chao Weilun)

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1.
  • Brewer, Courtney A., et al. (författare)
  • High spatial resolution full-field microscopy using a desktop-size soft x-ray laser
  • 2007
  • Ingår i: Proceedings of SPIE. - : SPIE.
  • Konferensbidrag (refereegranskat)abstract
    • Images with nanoscale resolution were obtained in both transmission and reflection modes using a full-field microscope that is illuminated by an extremely compact λ = 46.9 nm (hv = 26.4 eV) soft x-ray laser. The microscope was used to image the surface of partially processed silicon semiconductor chips containing periodic patterns of polysilicon and metal lines. To characterize the microscope, modulation transfer functions were experimentally built for three different objective zone plates, and images with near-wavelength resolution were obtained.
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2.
  • Brewer, Courtney A., et al. (författare)
  • Single-shot extreme ultraviolet laser imaging of nanostructures with wavelength resolution
  • 2008
  • Ingår i: Optics Letters. - : Optical Society of America. - 0146-9592 .- 1539-4794. ; 33:5, s. 518-520
  • Tidskriftsartikel (refereegranskat)abstract
    • We have demonstrated near-wavelength resolution microscopy in the extreme ultraviolet. Images of 50 nm diameter nanotubes were obtained with a single ~1 ns duration pulse from a desktop-size 46.9 nm laser. We measured the modulation transfer function of the microscope for three different numerical aperture zone plate objectives, demonstrating that 54 nm half-period structures can be resolved. The combination of near-wavelength spatial resolution and high temporal resolution opens myriad opportunities in imaging, such as the ability to directly investigate dynamics of nanoscale structures.
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3.
  • Shapiro, David A., et al. (författare)
  • Chemical composition mapping with nanometre resolution by soft X-ray microscopy
  • 2014
  • Ingår i: Nature Photonics. - : Springer Science and Business Media LLC. - 1749-4885 .- 1749-4893. ; 8:10, s. 765-769
  • Tidskriftsartikel (refereegranskat)abstract
    • X-ray microscopy is powerful in that it can probe large volumes of material at high spatial resolution with exquisite chemical, electronic and bond orientation contrast1, 2, 3, 4, 5. The development of diffraction-based methods such as ptychography has, in principle, removed the resolution limit imposed by the characteristics of the X-ray optics6, 7, 8, 9, 10. Here, using soft X-ray ptychography, we demonstrate the highest-resolution X-ray microscopy ever achieved by imaging 5 nm structures. We quantify the performance of our microscope and apply the method to the study of delithiation in a nanoplate of LiFePO4, a material of broad interest in electrochemical energy storage11, 12. We calculate chemical component distributions using the full complex refractive index and demonstrate enhanced contrast, which elucidates a strong correlation between structural defects and chemical phase propagation. The ability to visualize the coupling of the kinetics of a phase transformation with the mechanical consequences is critical to designing materials with ultimate durability.
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  • Resultat 1-3 av 3

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