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Träfflista för sökning "WFRF:(Della Mea G.) "

Sökning: WFRF:(Della Mea G.)

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1.
  • De Julián Fernández, C., et al. (författare)
  • Study of the gas optical sensing properties of Au-polyimide nanocomposite films prepared by ion implantation
  • 2005
  • Ingår i: Sensors and actuators. B, Chemical. - : Elsevier BV. - 0925-4005 .- 1873-3077. ; 111-112:SUPPL., s. 225-229
  • Tidskriftsartikel (refereegranskat)abstract
    • Au-polyimide nanocomposites have been synthesized by implanting Au + ions in pyromellitic dianhydride-4,4′ oxydianiline polyimide films prepared by glow discharge vapor deposition polymerisation (GDVDP). A structural and optical characterization shows that Au clusters grow only implanting 5 × 1016 Au+/cm2. This sample class shows interesting dynamic optical absorption sensing responses towards methanol and ethanol vapors in the spectral range corresponding to the surface plasmon resonance (SPR) peak of the gold nanoparticles. Traditional surface plasmon resonance measurements performed onto virgin polyimide thin films in controlled atmosphere show a sensing activity due to a variation of the film thickness and of the real part of refractive index. The comparison of the results obtained onto virgin films and implanted ones suggests that the sensing mechanisms can be attributed both to the modification of polymer optical properties and to the chemical activity of gold nanoparticles. © 2005 Elsevier B.V. All rights reserved.
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2.
  • Guidi, V., et al. (författare)
  • Diffusion-equation approach to describe ionic mobility in nanostructured titania
  • 2005
  • Ingår i: Physical Review B. Condensed Matter and Materials Physics. - 1098-0121 .- 1550-235X. ; 72:15
  • Tidskriftsartikel (refereegranskat)abstract
    • The linear diffusion equation is proposed to provide a macroscopic description of ionic mobility in nanostructures. This approach has been demonstrated to account for diffusion processes in nanostructured titania-based films. The formulation of a classical diffusion inverse problem and the experimental determination of concentration profiles by Rutherford backscattering spectrometry were used for the purpose. The model has allowed the measurement of the diffusion coefficient of W and Mo impurities in titania. © 2005 The American Physical Society.
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3.
  • Scandale, W., et al. (författare)
  • Experimental study of the radiation emitted by 180-GeV/c electrons and positrons volume-reflected in a bent crystal
  • 2009
  • Ingår i: Physical Review A. Atomic, Molecular, and Optical Physics. - 1050-2947 .- 1094-1622. ; 79:1
  • Tidskriftsartikel (refereegranskat)abstract
    • The radiation emitted by 180-Ge/c volume-reflected electrons and positrons impinging on a bent crystal has been measured by the H8RD22 Collaboration on the H8 beamline at the CERN SPS. A dedicated spectrometer has been developed to measure high-energy photon spectra (up to ∼100 GeV) under volume reflection: photon and charged particle beams have been separated by a bending magnet and leptons were detected and tagged by microstrip silicon detectors and a Pb-scintillator sampling calorimeter. A comparison between the experimental and analytical data for the amorphous and volume-reflection cases is presented and the differences are discussed. © 2009 The American Physical Society.
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4.
  • Scandale, W., et al. (författare)
  • Observation of multiple volume reflection of ultrarelativistic protons by a sequence of several bent silicon crystals
  • 2009
  • Ingår i: Physical Review Letters. - 0031-9007 .- 1079-7114. ; 102:8
  • Tidskriftsartikel (refereegranskat)abstract
    • The interactions of 400 GeV protons with different sequences of bent silicon crystals have been investigated at the H8 beam line of the CERN Super Proton Synchrotron. The multiple volume reflection of the proton beam has been studied in detail on a five-crystal reflector measuring an angular beam deflection θ=52.96±0.14μrad. The efficiency was found larger than 80% for an angular acceptance at the reflector entrance of 70μrad, with a maximal efficiency value of ε=0.90±0.01±0.03. © 2009 The American Physical Society.
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5.
  • Scandale, W., et al. (författare)
  • Observation of nuclear dechanneling for high-energy protons in crystals
  • 2009
  • Ingår i: Physics Letters B. - : Elsevier BV. - 0370-2693 .- 1873-2445. ; 680:2, s. 129-132
  • Tidskriftsartikel (refereegranskat)abstract
    • Channeling in a short bent silicon crystal was investigated at the CERN SPS using 400-GeV/c protons with an angular spread much narrower than the critical channeling angle. Particle dechanneling due to multiple scattering on the atomic nuclei of the crystal was observed and its dechanneling length was measured to be about 1.5 mm. For a crystal with length comparable to such dechanneling length, an efficiency of 83.4% was recorded, which is close to the maximum value expected for a parallel beam and exceeds the previously known limitation of deflection efficiency for long crystals. © 2009 Elsevier B.V. All rights reserved.
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7.
  • Vomiero, Alberto, et al. (författare)
  • Application of ion beam analysis to the selective sublimation processing of thin films for gas sensing
  • 2006
  • Ingår i: Nuclear Instruments and Methods in Physics Research Section B. - : Elsevier BV. - 0168-583X .- 1872-9584. ; 249:1-2 SPEC. ISS., s. 302-305
  • Tidskriftsartikel (refereegranskat)abstract
    • Ion beam analysis was successfully applied to a novel technique, named selective sublimation process (SSP), for deposition of nanostructured gas-sensing films through reactive sputtering. The method consists of the co-deposition of a mixed oxide, one of which has a relatively low sublimation temperature. Annealing at suitable temperature causes the sublimation of the most volatile compound, leaving a layer with adjustable composition. The appropriate choice of thermal treatments and the consequent tailoring of the composition play a crucial role in the determination of the microstructural properties. We developed a model based on diffusion equations that provides a useful guide to control the deposition and processing parameters and we applied the model on the systems TiO2-WO3 and TiO2-MoO3. Rutherford backscattering (RBS) was demonstrated to be effective for the characterization of the diffusion and sublimation processes during SSP. Experimental results fully agree with theoretical prediction, and allowed the calculation of all the parameters involved in SSP. © 2006 Elsevier B.V. All rights reserved.
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8.
  • Vomiero, Alberto, et al. (författare)
  • Composition and resistivity changes of reactively sputtered W-Si-N thin films under vacuum annealing
  • 2006
  • Ingår i: Applied Physics Letters. - : AIP Publishing. - 0003-6951 .- 1077-3118. ; 88:3, s. 1-3
  • Tidskriftsartikel (refereegranskat)abstract
    • W-Si-N layers about 200 nm thick with different nitrogen content were reactively sputtered from a W5 Si3 target on oxidized silicon substrates. The thermal stability of the films' composition and resistivity was studied with ion beam analysis and four-point probe measurements. Upon vacuum annealing from 600 to 980 °C for 1.5 h, a sample with an initial 56 at. % of nitrogen gradually loses nitrogen down to 36%. This composition lies close to the W- Si3 N4 tie line. Concurrently, the room temperature resistivity decreases from 4.7 to about 2 mΩ cm. The composition changes only a little for a sample whose initial composition is near the W- Si3 N4 tie line and the resistivity changes significantly less than for the nitrogen-rich film. Interpretations are discussed. © 2006 American Institute of Physics.
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9.
  • Vomiero, Alberto, et al. (författare)
  • Structural properties of reactively sputtered W-Si-N thin films
  • 2007
  • Ingår i: Journal of Applied Physics. - : AIP Publishing. - 0021-8979 .- 1089-7550. ; 102:3
  • Tidskriftsartikel (refereegranskat)abstract
    • Tungsten-silicon-nitrogen, W-Si-N, ternary thin films have been reactively sputter deposited from W5 Si3 and W Si2 targets using several nitrogen partial pressures. The films have been thermal annealed in the 600-1000 °C temperature range and a wide region of the W-Si-N ternary phase diagram has been explored by changing the N2 Ar ratio during the deposition. Multitechnique approach was adopted for the analysis of the samples. Composition has been determined via ion beam analysis; chemical states were investigated using x-ray photoelectron spectroscopy (XPS); crystalline structure was studied using transmission electron microscopy (TEM) and x-ray diffraction (XRD) and surface morphology by scanning electron microscope. The films deposited in pure argon atmosphere are tungsten rich and approach the target contents as N2 Ar ratio is varied during deposition. Tungsten enrichment in the films is caused by resputtering of silicon which can be inhibited by the formation of silicon nitride, allowing films with SiW ratio closer to the target compositions. The higher capability to form nitrides with silicon than with tungsten favors enhancement of nitrogen content in samples deposited from the silicon rich target (W Si2). The samples with excess nitrogen content have shown losses of this element after thermal treatment. XPS measurements show a break of W-N bonds caused by thermal instability of tungsten nitrides. TEM and XRD revealed the segregation of tungsten in form of metallic or silicide nanoclusters in samples with low nitrogen content (W58 Si21 N21 and W24 Si42 N34). High amounts of nitrogen were revealed to be highly effective in inhibiting metallic cluster coalescence. Measurements of electrical resistivity of as deposited films were performed using four point probe technique. They were found to lie in the range between 0.4 and 79 m cm depending on sample composition. © 2007 American Institute of Physics.
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10.
  • Carturan, S., et al. (författare)
  • Formation of silver nanoclusters in transparent polyimides by Ag-K ion-exchange process
  • 2007
  • Ingår i: European Physical Journal D. - : Springer Science and Business Media LLC. - 1434-6060 .- 1434-6079. ; 42:2, s. 243-251
  • Tidskriftsartikel (refereegranskat)abstract
    • Silver nanoclusters embedded in two transparent fluorinated polyimides, 4,4'-hexafluoroisopropylidene diphthalic anhydride - 2,3,5,6-tetramethyl paraphenylene diamine (6FDA-DAD) and 3,3',4,4' - biphenyltetracarboxylic acid dianhydride - 1,1-bis(4-aminophenyl)-1-phenyl-2,2,2-trifluoroethane (BPDA-3F), have been produced by surface modification with KOH aqueous solution followed by K-assisted Ag doping and thermal reduction in hydrogen atmosphere. The reaction rate of the nucleophilic hydrolysis in KOH, studied by Fourier transform infrared spectroscopy (FT-IR) and Rutherford backscattering spectrometry (RBS), depends on the polyimide chemical structure. After ion-exchange in AgNO 3 solution and subsequent annealing, the polyimide structure recovery was monitored by FT-IR whereas the characteristic surface plasmon absorption band of silver nanoparticles was evidenced by optical absorption measurements. The structure of silver nanoclusters as related to size and size distribution in the different polyimide matrices was thoroughly investigated by Transmission electron microscopy (TEM) and X-ray diffraction (XRD). The collected data evidenced a uniform distribution of Ag clusters of nanometric size after thermal treatment at 300 °C in both polyimides. For the same ion-exchange treatment parameters and annealing temperature, XRD analyses evidenced the presence of crystallites with similar sizes. © EDP Sciences/Società Italiana di Fisica/Springer-Verlag 2007.
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