| 1. |
- Correa, J., et al.
(författare)
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On the Charge Collection Efficiency of the PERCIVAL Detector
- 2016
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Ingår i: Journal of Instrumentation. - : IOP. - 1748-0221 .- 1748-0221. ; 11:12
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Tidskriftsartikel (refereegranskat)abstract
- The PERCIVAL soft X-ray imager is being developed by DESY, RAL, Elettra, DLS, and PAL to address the challenges at high brilliance Light Sources such as new-generation Synchrotrons and Free Electron Lasers. Typical requirements for detector systems at these sources are high frame rates, large dynamic range, single-photon counting capability with low probability of false positives, high quantum efficiency, and (multi)-mega-pixel arrangements. PERCIVAL is a monolithic active pixel sensor, based on CMOS technology. It is designed for the soft X-ray regime and, therefore, it is post-processed in order to achieve high quantum efficiency in its primary energy range (250 eV to 1 keV) . This work will report on the latest experimental results on charge collection efficiency obtained for multiple back-side-illuminated test sensors during two campaigns, at the P04 beam-line at PETRA III, and the CiPo beam-line at Elettra, spanning most of the primary energy range as well as testing the performance for photon-energies below 250 eV . In addition, XPS surface analysis was used to cross-check the obtained results.
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| 2. |
- Lytvynenko, Y., et al.
(författare)
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Control of the asymmetric band structure in Mn2Au by a ferromagnetic driver layer
- 2023
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Ingår i: Physical Review B. - 2469-9950 .- 2469-9969. ; 108:10
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Tidskriftsartikel (refereegranskat)abstract
- Hard x-ray angle-resolved photoemission spectroscopy reveals the momentum-resolved band structure in an epitaxial Mn2Au(001) film capped by a 2-nm-thick ferromagnetic permalloy layer. By magnetizing the permalloy capping layer, the exceptionally strong exchange bias aligns the Néel vector in the Mn2Au(001) film accordingly. Uncompensated interface Mn magnetic moments in Mn2Au were identified as the origin of the exchange bias using x-ray magnetic circular dichroism in combination with photoelectron emission microscopy. Using time-of-flight momentum microscopy, we measure the asymmetry of the band structure, E(k)≠E(-k), in Mn2Au resulting from the homogeneous orientation of the Néel vector. Comparison with theory shows that the Néel vector, determined by the magnetic moment of the top Mn layer, is antiparallel to the permalloy magnetization. The experimental results demonstrate that hard x-ray photoemission spectroscopy can measure the band structure of epitaxial layers beneath a metallic capping layer and corroborate the asymmetric band structure in Mn2Au that was previously inferred only indirectly.
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| 3. |
- Långberg, Marie, et al.
(författare)
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Characterization of Native Oxide and Passive Film on Austenite/Ferrite Phases of Duplex Stainless Steel Using Synchrotron HAXPEEM
- 2019
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Ingår i: Journal of the Electrochemical Society. - : Electrochemical Society. - 0013-4651 .- 1945-7111. ; 166:11, s. C3336-C3340
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Tidskriftsartikel (refereegranskat)abstract
- A new measurement protocol was used for microscopic chemical analysis of surface oxide films with lateral resolution of 1 mu m. The native air-formed oxide and an anodic passive film on austenite and ferrite phases of a 25Cr-7Ni super duplex stainless steel were investigated using synchrotron hard X-ray photoemission electron microscopy (HAXPEEM). Pre-deposited Pt-markers, in combination with electron backscattering diffraction mapping (EBSD), allowed analysis of the native oxide on individual grains of the two phases and the passive film formed on the same area after electrochemical polarization of the sample. The results showed a certain difference in the composition of the surface films between the two phases. For the grains with (001) crystallographic face // sample surface, the native oxide film on the ferrite contained more Cr oxide than the austenite. Anodic polarization up to 1000 mV/(Ag/AgCl) in 1M NaCl solution at room temperature resulted in a growth of the Cr- and Fe-oxides, diminish of Cr-hydroxide, and an increased proportion of Fe3+ species. by ECS. This is an open access article distributed under the terms of the Creative Commons Attribution 4.0 License (CC BY, http://creativecommons.org/licenses/by/4.0/), which permits unrestricted reuse of the work in any medium, provided the original work is properly cited.
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| 4. |
- Långberg, Marie, 1988-, et al.
(författare)
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Lateral variation of the native passive film on super duplex stainless steel resolved by synchrotron hard X-ray photoelectron emission microscopy
- 2020
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Ingår i: Corrosion Science. - Stockholm, : Elsevier BV. - 0010-938X .- 1879-0496. ; 174
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Tidskriftsartikel (refereegranskat)abstract
- A native passive film on 25Cr-7Ni super duplex stainless steel was analyzed using synchrotron hard X-ray photoemission electron microscopy, focusing on variations between individual grains of ferrite and austenite phases. The film consists of an oxide inner layer and an oxyhydroxide outer layer, in total 2.3 nm thick. The Cr content is higher in the outer than the inner layer, ca. 80 % on average. The Cr content is higher on ferrite than austenite, whereas the thickness is rather uniform. The grain orientation has a small but detectable influence, ferrite (111) grains have a lower Cr content than other ferrite grains.
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| 5. |
- Schlueter, C., et al.
(författare)
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New HAXPES Applications at PETRA III
- 2018
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Ingår i: Synchrotron Radiation News. - : Informa UK Limited. - 0894-0886 .- 1931-7344. ; 31:4, s. 29-35
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Tidskriftsartikel (refereegranskat)
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| 6. |
- Schlueter, C., et al.
(författare)
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The new dedicated HAXPES beamline P22 at PETRAIII
- 2019
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Ingår i: 13th International Conference on Synchrotron Radiation Instrumentation (SRI2018). - : American Institute of Physics (AIP). - 9780735417823
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Konferensbidrag (refereegranskat)abstract
- A new undulator beamline (P22) for hard X-ray photoelectron spectroscopy (HAXPES) was built at PETRA III (DESY, Hamburg) to meet the increasing demand for HAXPES-based techniques. It provides four special instruments for high-resolution studies of the electronic and chemical structure of functional nano-materials and catalytic interfaces, with a focus on measurements under operando and/or ambient conditions: (i) a versatile solid-state spectroscopy setup with optional wide-angle lens and in-situ electrical characterization, (ii) a HAXPEEM instrument for sub-µm spectro-microscopy applications, (iii) an ambient pressure system (> 1 bar) for operando studies of catalytic reactions and (iv) a time-of-flight spectrometer as a full-field k-microscope for measurements of the 4D spectral function ρ(EB,k). The X-ray optics were designed to deliver high brightness photon flux within the HAXPES energy range 2.4 – 15 keV. An LN2-cooled double-crystal monochromator with interchangeable pairs of Si(111) and (311) crystals is optionally combined with a double channel-cut post-monochromator to generate X-rays with variable energy bandpass adapted to the needs of the experiment. Additionally, the beam polarization can be varied using a diamond phase plate integrated into the beamline. Adaptive beam focusing is realized by Be compound refractive lenses and/or horizontally deflecting mirrors down to a spot size of ∼20x17 µm2 with a flux of up to 1.1x1013 ph/s (for Si(111) at 6 keV).
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| 7. |
- Schönhense, G., et al.
(författare)
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Suppression of the vacuum space-charge effect in fs-photoemission by a retarding electrostatic front lens
- 2021
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Ingår i: Review of Scientific Instruments. - : American Institute of Physics (AIP). - 0034-6748 .- 1089-7623. ; 92:5
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Tidskriftsartikel (refereegranskat)abstract
- The performance of time-resolved photoemission experiments at fs-pulsed photon sources is ultimately limited by the e-e Coulomb interaction, downgrading energy and momentum resolution. Here, we present an approach to effectively suppress space-charge artifacts in momentum microscopes and photoemission microscopes. A retarding electrostatic field generated by a special objective lens repels slow electrons, retaining the k-image of the fast photoelectrons. The suppression of space-charge effects scales with the ratio of the photoelectron velocities of fast and slow electrons. Fields in the range from -20 to -1100 V/mm for E-kin = 100 eV to 4 keV direct secondaries and pump-induced slow electrons back to the sample surface. Ray tracing simulations reveal that this happens within the first 40 to 3 mu m above the sample surface for E-kin = 100 eV to 4 keV. An optimized front-lens design allows switching between the conventional accelerating and the new retarding mode. Time-resolved experiments at E-kin = 107 eV using fs extreme ultraviolet probe pulses from the free-electron laser FLASH reveal that the width of the Fermi edge increases by just 30 meV at an incident pump fluence of 22 mJ/cm(2) (retarding field -21 V/mm). For an accelerating field of +2 kV/mm and a pump fluence of only 5 mJ/cm(2), it increases by 0.5 eV (pump wavelength 1030 nm). At the given conditions, the suppression mode permits increasing the slow-electron yield by three to four orders of magnitude. The feasibility of the method at high energies is demonstrated without a pump beam at E-kin = 3830 eV using hard x rays from the storage ring PETRA III. The approach opens up a previously inaccessible regime of pump fluences for photoemission experiments.
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