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Träfflista för sökning "WFRF:(Kamiyama Satoshi) "

Sökning: WFRF:(Kamiyama Satoshi)

  • Resultat 1-10 av 11
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1.
  • Gulbinas, Karolis, et al. (författare)
  • Raman Scattering and Carrier Diffusion Study in Heavily Co-doped 6H-SiC Layers
  • 2014
  • Ingår i: IOP Conference Series. - : Institute of Physics Publishing (IOPP). - 1757-8981 .- 1757-899X. ; 56:1, s. 012005-
  • Tidskriftsartikel (refereegranskat)abstract
    • Thick 6H-SiC epilayers were grown using the fast sublimation method on low-off-axis substrates. They were co-doped with N and B impurities of ≈1019 cm−3 and (41016–51018) cm−3 concentration, respectively. The epilayers exhibited donor-acceptor pair (DAP) photoluminescence. The micro-Raman spectroscopic study exposed a compensated n-6H-SiC epilayer of common quality with some 3C-SiC inclusions. The compensation ratio of B through 200 μm thick epilayer varied in 20-30% range. The free carrier diffusivity was studied by transient grating technique at high injection level. The determined ambipolar diffusion coefficient at RT was found to decrease from 1.15 cm2/s to virtually 0 cm2/s with boron concentration increasing by two orders.
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2.
  • Jokubavicius, Valdas, et al. (författare)
  • Geometrical Control of 3C and 6H-SiC Nucleation on Low Off-Axis Substrates
  • 2011
  • Ingår i: Materials Science Forum. - 0255-5476 .- 1662-9752. ; 679-680, s. 103-106
  • Tidskriftsartikel (refereegranskat)abstract
    • Growth of 3C or 6H-SiC epilayers on low off-axis 6H-SiC substrates can be mastered by changing the size of the on axis plane formed by long terraces in the epilayer using geometrical control. The desired polytype can be selected in thick (~200 µm) layers of both 6H-SiC and 3C-SiC polytypes on substrates with off-orientation as low as 1.4 and 2 degrees. The resultant crystal quality of the 3C and the 6H-SiC epilayers, grown under the same process parameters, deteriorates when lowering the off-orientation of the substrate.
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3.
  • Jokubavicius, Valdas, et al. (författare)
  • On stabilization of 3C-SiC using low off-axis 6H-SiC substrates
  • 2012
  • Konferensbidrag (refereegranskat)abstract
    • Heteroepitaxial growth of 3C-SiC on 0.8 and 1.2 degree off-oriented 6H-SiC substrates was studied using a sublimation growth process. The 3C-SiC layers were grown at high growth rates with layer thickness up to 300 µm. The formation and the quality of 3C-SiC are influenced by the off-orientation of the substrate, the growth temperature (studied temperature range from 1750 oC to 1850oC), and the growth ambient (vacuum at 5*10-5 mbar and nitrogen at 5*10-1 mbar). The largest domains of 3C-SiC and the lowest number of double positioning boundaries were grown using nitrogen ambient and the highest growth temperature. The combined use of low off-axis substrate and high growth rate is a potential method to obtain material with bulk properties.
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4.
  • Kamiyama, Satoshi, et al. (författare)
  • Fluorescent SiC and its application to white light-emitting diodes
  • 2011
  • Ingår i: Journal of semiconductors. - : IOP Publishing. - 1674-4926. ; 32:1, s. 013004-1-013004-3
  • Tidskriftsartikel (refereegranskat)abstract
    • Fluorescent-SiC (f-SiC), which contains donor and acceptor impurities with optimum concentrations, has high conversion efficiency from NUV to visible light caused by donor-acceptor-pair (DAP) recombination. This material can be used as a substrate for a near UV light-emitting diode (LED) stack, and leads to monolithic white LED device with suitable spectral property for general lighting applications. In this paper, we describe basic technologies of the white LED, such as optical properties of f-SiC substrate, and epitaxial growth of NUV stack on the f-SiC substrate.
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5.
  • Kamiyama, Satoshi, et al. (författare)
  • White light-emitting diode based on fluorescent SiC
  • 2012
  • Ingår i: Thin Solid Films. - : Elsevier. - 0040-6090 .- 1879-2731. ; 522, s. 23-25
  • Tidskriftsartikel (refereegranskat)abstract
    • A monolithic white light-emitting diode (LED,) comprising a combination of a fluorescent-SiC (f-SiC) substrate and a nitride-based near-UV LED stack, is proposed. On the basis of the recombination of donor and acceptor pairs, the f-SiC substrate works as a phosphor for visible light emission. By employing the Fast Sublimation Growth Process method, the high-quality f-SiC substrate doped with N and B exhibited a nonradiative carrier lifetime of 55 mu s and an internal quantum efficiency (IQE) of 40%. With increasing donor and acceptor doping concentrations, a high IQE was estimated even at a high excitation level.
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6.
  • Lu, Weifang, et al. (författare)
  • White Light Emission from Fluorescent SiC with Porous Surface
  • 2017
  • Ingår i: Scientific Reports. - : NATURE PUBLISHING GROUP. - 2045-2322. ; 7
  • Tidskriftsartikel (refereegranskat)abstract
    • We report for the first time a NUV light to white light conversion in a N-B co-doped 6H-SiC (fluorescent SiC) layer containing a hybrid structure. The surface of fluorescent SiC sample contains porous structures fabricated by anodic oxidation method. After passivation by 20 nm thick Al2O3, the photoluminescence intensity from the porous layer was significant enhanced by a factor of more than 12. Using a porous layer of moderate thickness (similar to 10 mu m), high-quality white light emission was realized by combining the independent emissions of blue-green emission from the porous layer and yellow emission from the bulk fluorescent SiC layer. A high color rendering index of 81.1 has been achieved. Photoluminescence spectra in porous layers fabricated in both commercial n-type and lab grown N-B co-doped 6H-SiC show two emission peaks centered approximately at 460 nm and 530 nm. Such blue-green emission phenomenon can be attributed to neutral oxygen vacancies and interface C-related surface defects generated dring anodic oxidation process. Porous fluorescent SiC can offer a great flexibility in color rendering by changing the thickness of porous layer and bulk fluorescent layer. Such a novel approach opens a new perspective for the development of high performance and rare-earth element free white light emitting materials.
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7.
  • Ou, Yiyu, et al. (författare)
  • Donor-acceptor-pair emission characterization in N-B doped fluorescent SiC
  • 2011
  • Ingår i: Optical Materials Express. - : Optical Society of America. - 2159-3930. ; 1:8, s. 1439-1446
  • Tidskriftsartikel (refereegranskat)abstract
    • In the present work, we investigated donor-acceptor-pair emission in N-B doped fluorescent 6H-SiC, by means of photoluminescence, Raman spectroscopy, and angle-resolved photoluminescence. The photoluminescence results were interpreted by using a band diagram with Fermi-Dirac statistics. It is shown that with N and B concentrations in a range of 10(18) cm(-3) the samples exhibit the most intense luminescence when the concentration difference (n-type) is about 4.6 x 10(18) cm(-3). Raman spectroscopy studies further verified the doping type and concentrations for the samples. Furthermore, strong luminescence intensity in a large emission angle range was achieved from angle-resolved photoluminescence. The results indicate N-B doped fluorescent SiC as a good wavelength converter in white LEDs applications.
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8.
  • Sun, Jianwu, et al. (författare)
  • Effect of surface and interface recombination on carrier lifetime in 6H-SiC layers
  • 2013
  • Ingår i: SILICON CARBIDE AND RELATED MATERIALS 2012. - : Trans Tech Publications. ; , s. 490-493
  • Konferensbidrag (refereegranskat)abstract
    • Carrier lifetimes in 6H-SiC epilayers were investigated by using numerical simulations and micro-wave photoconductivity decay measurements. The measured carrier lifetimes were significantly increasing with an increased thickness up to 200 mu m while it stays almost constant in layers thicker than 200 mu m. From a comparison of the simulation and experimental results, we found that if the bulk lifetime in 6H-SiC is around a few microseconds, both the surface recombination and interface recombination influence the carrier lifetime in layers with thickness less than 200 mu m while only the surface recombination determines the carrier lifetime in layers with thickness more than 200 mu m. In samples with varying thicknesses, a bulk lifetime tau(B) = 2.93 mu s and carrier diffusion coefficient D= 2.87 cm(2)/s were derived from the linear fitting of reciprocal lifetime vs reciprocal square thickness.
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9.
  • Sun, Jianwu, et al. (författare)
  • Fluorescent silicon carbide as an ultraviolet-to-visible light converter by control of donor to acceptor recombinations
  • 2012
  • Ingår i: Journal of Physics D. - : Institute of Physics (IOP). - 0022-3727 .- 1361-6463. ; 45:23, s. 235107-
  • Tidskriftsartikel (refereegranskat)abstract
    • As an alternative to the conventional phosphors in white LEDs, a donor and acceptor co-doped fluorescent 6H-SiC can be used as an ultraviolet-to-visible light converter without any need of rare-earth metals. From experimental data we provide an explanation to how light can be obtained at room temperature by a balance of the donors and acceptors. A steady-state recombination rate model is used to demonstrate that the luminescence in fluorescent SiC can be enhanced by controlling the donor and acceptor doping levels. A doping criterion for optimization of this luminescence is thus proposed.
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10.
  • Sun, Jianwu, et al. (författare)
  • Microsecond carrier lifetimes in bulk-like 3C-SiC grown by sublimation epitaxy
  • 2013
  • Ingår i: Silicon Carbide and Related Materials 2012. - : Trans Tech Publications. - 9783037856246 ; , s. 315-318
  • Konferensbidrag (refereegranskat)abstract
    • High quality bulk-like 3C-SiC were grown on on-axis (0001) 6H-SiC substrate by sublimation epitaxy. The microwave photoconductivity decay mapping measurements revealed that this material shows considerable long carrier lifetimes varied from 3.519 to 7.834 mu s under the injection level of 3.5x10(12) cm(-2), which are comparable with the best carrier lifetimes in 4H-SiC layers. The mapping of high resolution x-ray diffraction obtained from the same region shows that smaller carrier lifetimes seem to correspond to the larger FWHM values and vice versa. This shows that long carrier lifetime obtained in 3C-SiC is due to the improvement of the crystal quality.
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