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- Bernard, L., et al.
(författare)
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Study of the morphology of organic ferroelectric diodes with combined scanning force and scanning transmission X-ray microscopy
- 2018
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Ingår i: Organic electronics. - : ELSEVIER SCIENCE BV. - 1566-1199 .- 1878-5530. ; 53, s. 242-248
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Tidskriftsartikel (refereegranskat)abstract
- Organic ferroelectric diodes attract increasing interest as they combine non-destructive data read-out and low cost fabrication, two requirements in the development of novel non-volatile memory elements. The macroscopic electrical characteristics and performances of such devices strongly depend on their structural properties. Various studies of their global microscopic morphology have already been reported. Here, a multi-technique approach including different scanning force and X-ray microscopies permitted to reveal and locally study nanometer-scale unexpected sub-structures within a P(VDF-TrFE):F8BT ferroelectric diode. The strong impact of these structures on the local polarizability of the ferroelectric is shown. Two alternative fabrication methods are proposed that prevent the formation of these structures and demonstrate improved macroscopic device performances such as endurance and ON/OFF ratio.
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| 2. |
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| 3. |
- Pilet, N., et al.
(författare)
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Piezoelectricity enhancement of P(VDF/TrFE) by X-ray irradiation
- 2016
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Ingår i: Organic electronics. - : ELSEVIER SCIENCE BV. - 1566-1199 .- 1878-5530. ; 37, s. 257-262
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Tidskriftsartikel (refereegranskat)abstract
- Organic electronics is becoming more and more important because the low level of fabrication and deposition complexity even at large scale makes it a good candidate for future low cost technological product development. P(VDF-TrFE) is a co-polymer of special interest due its ferroelectric property enabling usage in re-programmable non-volatile organic memory and magnetoelectric sensors. Piezo force microscopy (PFM) provides access to the technologically relevant ferroelectric polarisability and its remanent polarization via imaging of the piezoelectric property. Here we use PFM to show that piezoelectric response of a P(VDF-TrFE) film can be enhanced by up to 260 % after soft X-ray irradiation. This enhancement correlates with morphological change of part of the film, from amorphous to crystalline. An optimal irradiation dose is found above which the film gets eroded and the piezoelectric response gets lowered. (C) 2016 Elsevier B.V. All rights reserved.
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