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- Arwin, Hans, 1950-, et al.
(författare)
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Enhancement in ellipsometric thin film sensitivity near surface plasmon resonance conditions
- 2008
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Ingår i: Physica Status Solidi (a) applications and materials science. - : Wiley-VCH Verlagsgesellschaft. - 1862-6300 .- 1862-6319. ; 205:4, s. 817-820
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Tidskriftsartikel (refereegranskat)abstract
- Ellipsometry used in internal reflection mode exhibits enhanced thin film sensitivity if operated close to surface plasmon resonance conditions. Compared to conventional ellipsometry, the changes in the ellipsometric parameter Δ are several orders of magnitude larger. Here, the origin of this large sensitivity is discussed by analysing thin film approximations of the complex reflectance ratio. It is found that the thickness sensitivity in Δ is proportional to the inverse of the difference between the intrinsic and the radiation-induced damping of the surface plasmons.
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| 2. |
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| 3. |
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| 4. |
- Arwin, Hans, 1950-, et al.
(författare)
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Total Internal Reflection Ellipsometry : monitoring of proteins on thin metal films
- 2006
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Ingår i: Proteins on surfaces. - Berlin, Heidelberg : Springer Verlag. - 9185457167 - 9783540326588 - 9783540326571 ; , s. 105-118
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Bokkapitel (övrigt vetenskapligt/konstnärligt)abstract
- A measurement technique based on ellipsometry performed under conditions of total internal reflection is presented here. This technique is called total internal reflection ellipsometry (TIRE). When extended with the surface plasmon resonance effect, TIRE becomes a powerful tool for monitoring protein adsorption on thin metal films. A brief description of TIRE is presented here together with some examples of measurement system setups. Two examples of applications are included, followed by a short presentation of possible future applications of TIRE.
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| 5. |
- Arwin, Hans, 1950-, et al.
(författare)
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Total internal reflection ellipsometry : principles and applications
- 2004
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Ingår i: Applied Optics. - 0003-6935 .- 1539-4522. ; 43:15, s. 3028-3036
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Tidskriftsartikel (refereegranskat)abstract
- A concept for a measurement technique based on ellipsometry in conditions of total internal reflection is presented. When combined with surface plasmon resonance (SPR) effects, this technique becomes powerful for monitoring and analyzing adsorption and desorption on thin semitransparent metal films as well as for analyzing the semitransparent films themselves. We call this technique total internal reflection ellipsometry (TIRE). The theory of ellipsometry under total internal reflection combined with SPR is discussed for some simple cases. For more advanced cases and to prove the concept, simulations are performed with the Fresnel formalism. The use of TIRE is exemplified by applications in protein adsorption, corrosion monitoring, and adsorption from opaque liquids on metal surfaces. Simulations and experiments show greatly enhanced thin-film sensitivity compared with ordinary ellipsometry.
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| 8. |
- Berlind, Torun, 1965-, et al.
(författare)
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Formation and cross-linking of fibrinogen layers monitored with in situ spectroscopic ellipsometry
- 2010
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Ingår i: Colloids and Surfaces B. - : Elsevier BV. - 0927-7765 .- 1873-4367. ; 75:2, s. 410-417
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Tidskriftsartikel (övrigt vetenskapligt/konstnärligt)abstract
- Thick matrices of fibrinogen with incorporation of a matrix metalloproteinaseinhibitor were covalently bonded on functionalized silicon surfaces using an ethyl-3-dimethyl-aminopropyl-carbodiimide and N-hydroxy-succinimide affinity ligand couplingchemistry. The growth of the structure was followed in situ using dynamic ellipsometryand characterized at steady-state with spectroscopic ellipsometry. The growth wascompared with earlier work on ex situ growth of fibrinogen layers studied by singlewavelength ellipsometry. It is found that in situ growth and ex situ growth yield differentstructural properties of the formed protein matrix. Fibrinogen matrices with thicknessesup to 58 nm and surface mass densities of 1.6 μg/cm2 have been produced.
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| 9. |
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| 10. |
- Poksinski, Michal, et al.
(författare)
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Copper corrosion monitoring with total internal reflection ellipsometry
- 2003
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Ingår i: Journal of the Electrochemical Society. - : The Electrochemical Society. - 0013-4651 .- 1945-7111. ; 150:11, s. B536-B539
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Tidskriftsartikel (refereegranskat)abstract
- A technique for in situ monitoring of changes on surfaces of semitransparent thin films is presented. This technique combines ellipsometry and total internal reflection and is called total internal reflection ellipsometry. It utilizes the high surface sensitivity of ellipsometry and can be applied to detect and quantify very small changes on thin film surfaces. One example on an application is corrosion monitoring. The main advantage in comparison to ordinary ellipsometry is that measurements are done from the “back side” of the sample and thus the probe beam does not propagate through and will not be influenced by the media reacting with the surface. An overview of total internal reflection ellipsometry and results from corrosion monitoring on thin copper films are presented.
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