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Träfflista för sökning "WFRF:(Sernelius Bo) "

Sökning: WFRF:(Sernelius Bo)

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1.
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2.
  • Darakchieva, Vanya, et al. (författare)
  • Free electron behavior in InN : On the role of dislocations and surface electron accumulation
  • 2009
  • Ingår i: Applied Physics Letters. - : AIP Publishing. - 0003-6951 .- 1077-3118. ; 94:2, s. 022109-
  • Tidskriftsartikel (refereegranskat)abstract
    • The free electron behavior in InN is studied on the basis of decoupled bulk and surface accumulation electron densities in InN films measured by contactless optical Hall effect. It is shown that the variation in the bulk electron density with film thickness does not follow the models of free electrons generated by dislocation-associated nitrogen vacancies. This finding, further supported by transmission electron microscopy results, indicates the existence of a different thickness-dependent doping mechanism. Furthermore, we observe a noticeable dependence of the surface electron density on the bulk density, which can be exploited for tuning the surface charge in future InN based devices.
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3.
  • Darakchieva, Vanya, et al. (författare)
  • Unravelling the free electron behavior in InN
  • 2008
  • Ingår i: Optoelectronic and Microelectronic Materials and Devices, 2008. - : IEEE. - 9781424427161 ; , s. 90-97
  • Konferensbidrag (refereegranskat)abstract
    • Precise measurement of the optical Hall effect in InN using magneto-optical generalized ellipsometry at IR and THz wavelengths, allows us to decouple the surface accumulation and bulk electron densities in InN films by non-contact optical means and further to precisely measure the effective mass and mobilities for polarizations parallel and perpendicular to the optical axis. Studies of InN films with different thicknesses, free electron densities and surface orientations enable an intricate picture of InN free electron properties to emerge. Striking findings on the scaling factors of the bulk electron densities with film thickness further supported by transmission electron microscopy point to an additional thickness dependent doping mechanism unrelated to dislocations. Surface electron accumulation is observed to occur not only at polar but also at non-polar and semi-polar wurtzite InN, and zinc blende InN surfaces. The persistent surface electron density shows a complex behavior with bulk density and surface orientation. This behavior might be exploited for tuning the surface charge in InN.
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4.
  • Harati Zadeh, Hamid, 1964-, et al. (författare)
  • Photoluminescence study of Si-doped GaN/Al0.07Ga0.93N multiple quantum wells with different dopant position
  • 2004
  • Ingår i: Applied Physics Letters. - : AIP Publishing. - 0003-6951 .- 1077-3118. ; 84:25, s. 5071-5073
  • Tidskriftsartikel (refereegranskat)abstract
    • The Si-doped GaN/Al0.07Ga0.93N multiple quantum wells (MQW) were investigated, using photoluminescence (PL) and time-resolved (PL) measurements. The influence of Si doping on the emission energy and recombination dynamics of the MWQs were also investigated, with different dopant position in the wells. It was observed that the redshifted emission of the MQWs was attributed to the self-energy shift of the electron states due to the correlated motion of the electrons exposed to the fluctuating potential of the donor ions. It was also observed that the PL decay time of the sample was ∼760 ps, at low temperature.
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5.
  • Monemar, Bo, 1942-, et al. (författare)
  • Defect related issues in the "current roll-off" in InGaN based light emitting diodes
  • 2007
  • Ingår i: Applied Physics Letters. - : AIP Publishing. - 0003-6951 .- 1077-3118. ; 91, s. 181103-1-181103-3
  • Tidskriftsartikel (refereegranskat)abstract
    • Defect related contributions to the reduction of the internal quantum efficiency of InGaN-based multiple quantum well light emitting diodes under high forward bias conditions are discussed. Screening of localization potentials for electrons is an important process to reduce the localization at high injection. The possible role of threading dislocations in inducing a parasitic tunneling current in the device is discussed. Phonon-assisted transport of holes via tunneling at defect sites along dislocations is suggested to be involved, leading to a nonradiative parasitic process enhanced by a local temperature rise at high injection.
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6.
  • Monemar, Bo, et al. (författare)
  • Radiative recombination in In0.15Ga0.85N/GaN multiple quantum well structures
  • 1999
  • Ingår i: MRS Internet Journal of Nitride Semiconductor Research. - 1092-5783. ; 4:16
  • Tidskriftsartikel (refereegranskat)abstract
    • We present a study of the radiative recombination in In0.15Ga0.85N/GaN multiple quantum well samples, where the conditions of growth of the InGaN quantum layers were varied in terms of growth temperature (< 800 degrees C) and donor doping. The photoluminescence peak position varies strongly (over a range as large as 0.3 eV) with delay time after pulsed excitation, but also with donor doping and with excitation intensity. The peak position is mainly determined by the Stark effect induced by the piezoelectric field. In addition potential fluctuations, originating from segregation effects in the InGaN material, from interface roughness, and the strain fluctuations related to these phenomena, play an important role, and largely determine the width of the emission. These potential fluctuations may be as large as 0.2 eV in the present samples, and appear to be important for all studied growth temperatures for the InGaN layers. Screening effects from donor electrons and excited electron-hole pairs are important, and account for a large part of the spectral shift with donor doping (an upward shift of the photoluminescence peak up to 0.2 eV is observed for a Si donor density of 2 x 10(18) cm(-3) in the well), with excitation intensity and with delay time after pulsed excitation (also shifts up to 0.2 eV). We suggest a two-dimensional model for electron- and donor screening in this case, which is in reasonable agreement with the observed data, if rather strong localization potentials of short range (of the order 100 Angstrom) are present. The possibility that excitons as well as shallow donors are impact ionized by electrons in the rather strong lateral potential fluctuations present at this In composition is discussed.
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7.
  • Wongmanerod, S, et al. (författare)
  • Many-body effects in highly p-type modulation-doped GaAs/AlxGa1-xAs quantum wells
  • 2000
  • Ingår i: Physical Review B. Condensed Matter and Materials Physics. - 1098-0121 .- 1550-235X. ; 61:4, s. 2794-2798
  • Tidskriftsartikel (refereegranskat)abstract
    • Many-body effects have been optically investigated for modulation-doped quantum wells at high acceptor densities. The observed band-gap shrinkage, up to approximate to 20 meV, is consistent with calculations based on the Hartree and random-phase approximations including the finite well width effect. A recombination near the Fermi edge with light-hole character is strikingly enhanced at high acceptor densities. An interpretation based on carrier-carrier interaction is proposed. Finally, the exciton is found to be quenched for hole densities higher than approximate to 2x10(12) cm(-2).
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8.
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9.
  • Araujo, C. M., et al. (författare)
  • Electrical resistivity, MNM transition and band-gap narrowing of cubic GaN : Si
  • 2002
  • Ingår i: Microelectronics Journal. - 0026-2692. ; 33:4, s. 365-369
  • Tidskriftsartikel (refereegranskat)abstract
    • The electrical resistivity of the Si-donor cubic GaN is investigated theoretically at low temperature. The critical impurity concentration, N-c, for the metal-nonmetal transition is estimated in three different ways: from using the generalized Drude approach (GDA) for the resistivity; from the vanishing of the chemical potential calculated using the dielectric function model with a Lorentz-Lorenz correction; from finding the crossing point between the energy in the insulating and metallic states. The bandgap narrowing (BGN) has been determined theoretically and experimentally above the MNM transition, The experimental data have been obtained with photoluminescence measurements. Theoretical and experimental results are in rough agreement in the range of impurity concentration of interest.
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10.
  • Beyer, Jan, et al. (författare)
  • Strong suppression of spin generation at a Fano resonance in a semiconductor nanostructure
  • 2012
  • Annan publikation (övrigt vetenskapligt/konstnärligt)abstract
    • We observe remarkable, complete suppression of spin generation under optical excitation in a thin InAs/GaAs wetting layer close to the light-hole excitonic resonance, leading to zero electron spin polarization as monitored by adjacent InAs quantum dots. The suppression is attributed to efficient spin relaxation/scattering at the Fano resonance between the light-hole exciton states and the heavy-hole continuum of the wetting layer. The complete suppression is found to remain effective up to temperatures exceeding 100 K.
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