| 1. |
- Aberg, D, et al.
(författare)
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Implantation temperature dependent deep level defects in 4H-SiC
- 2001
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Ingår i: Materials Science Forum, Vols. 353-356. ; , s. 443-446
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Konferensbidrag (refereegranskat)abstract
- Deep level transient spectroscopy spectra of the near Z-defect region (150-350K) were investigated for B implanted samples of low doses (10(8)-10(9) cm(-2)). For 300 degreesC implantation, a level at an energy of 0.41 eV below the conduction hand edge was found, referred to as the S-level. The S-center was shown to form in both implanted and electron irradiated 4H-SiC, either after room temperature (R.T.) implantation followed by mild heat treatments or lung R.T. storage (several months) or after 200-300 degreesC implantations/irradiations. The S-center was found to anneal out at temperatures above 250 degreesC.
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| 2. |
- Bergman, JP, et al.
(författare)
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Characterisation and defects in silicon carbide
- 2002
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Ingår i: Materials Science Forum, Vols. 389-393.
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Konferensbidrag (refereegranskat)abstract
- In this work we present experimental results of several defects in 4H Sic that are of interest both from a fundamental and physical point of view. And also of great importance for device applications utilizing the Sic material. These defects include the temperature stable so called D1 defect, which is created after irradiation. This optical emission has been identified as an isoelectronic defect bound at a hole attractive pseudodonor, and we have been able to correlate this to the electrically observed hole trap HS1 seen in minority carrier transient spectroscopy (MCTS). It also includes the UD1 defect observed using absorption and FTIR and which is believed to be responsible for the semi-insulating behavior of material grown by the High temperature, HTCVD technique. Finally, we have described the formation and proper-ties of critical, generated defect in high power Sic bipolar devices. This is identified as a stacking fault in the Sic basal plane, using mainly white beam synchrotron Xray topography. The stacking fault is both optically and electrically active, by forming extended local potential reduction of the conduction band.
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| 3. |
- Bergman, Peder, et al.
(författare)
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Defects in 4H silicon carbide
- 2001
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Ingår i: Physica B, Vols. 308-310. ; , s. 675-679
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Konferensbidrag (refereegranskat)abstract
- We present experimental results related to several different intrinsic defects that in different ways influence the material properties and are therefore technologically important defects. This includes the so-called D1 defect which is created after irradiation and which is temperature stable. From the optical measurements we were able to identify the D1 bound exciton as an isoelectronic defect bound at a hole attractive pseudo-donor, and we have been able to correlate this to the electrically observed hole trap HS1 seen in minority carrier transient spectroscopy (MCTS). Finally, we describe the formation and properties of a critical, generated defect in high power SiC bipolar devices. It is identified as a stacking fault in the SiC basal plane. It can be seen as a local reduction of the carrier lifetime, in triangular or rectangular shape, which explains the enhanced forward voltage drop in the diodes. The entire stacking faults are also optically active as can be seen as dark triangles and rectangles in low temperature cathodo-luminescence, and the fault and their bounding partial dislocations are seen and identified using synchrotron topography. © 2001 Elsevier Science B.V. All rights reserved.
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| 4. |
- Bergman, Peder, et al.
(författare)
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The role of defects on optical and electrical properties of SiC
- 2000
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Konferensbidrag (refereegranskat)abstract
- In this work we describe some of the defects in SiC observable using different optical characterisation techniques. This includes photoluminescence measurements to determine the presence of different defects. We also show that optical techniques can be developed for mapping characterisation, which are useful both for routine measurements and for determine spatial variations and presence of defects over larger areas. One such example is the lifetime mappings on epitaxial layers on entire wafers, which has shown the importance of structural defects replicated into the epitaxial layer. Optical measurements have also been correlated to structural measurements from X-ray topography to demonstrate the importance of the structural defects
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| 5. |
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| 6. |
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| 7. |
- Buyanova, Irina, 1960-, et al.
(författare)
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Optical and electrical characterization of (Ga,Mn)N/InGaN multiquantum well light-emitting diodes
- 2004
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Ingår i: Journal of Electronic Materials. - : Springer Science and Business Media LLC. - 0361-5235 .- 1543-186X. ; 33:5, s. 467-471
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Tidskriftsartikel (refereegranskat)abstract
- (Ga,Mn)/N/InGaN multiquantum well (MQW) diodes were grown by molecular beam epitaxy (MBE). The current-voltage characteristics of the diodes show the presence of a parasitic junction between the (Ga,Mn)N and the n-GaN in the top contact layer due to the low conductivity of the former layer. Both the (Ga,Mn)N/InGaN diodes and control samples without Mn doping show no or very low (up to 10% at the lowest temperatures) optical (spin) polarization at zero field or 5 T, respectively. The observed polarization is shown to correspond to the intrinsic optical polarization of the InGaN MQW, due to population distribution between spin sublevels at low temperature, as separately studied by resonant optical excitation with a photon energy lower than the bandgap of both the GaN and (Ga,Mn)N. This indicates efficient losses in the studied structures of any spin polarization generated by optical spin orientation or electrical spin injection. The observed vanishing spin injection efficiency of the spin light-emitting diode (LED) is tentatively attributed to spin losses during the energy relaxation process to the ground state of the excitons giving rise to the light emission.
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| 8. |
- Carlsson, Fredrik, et al.
(författare)
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Electroluminescence from implanted and epitaxially grown pn-diodes
- 2000
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Ingår i: Materials Science Forum, Vols. 338-343. - : Trans Tech Publications Inc.. - 9780878498543 ; , s. 687-690
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Konferensbidrag (refereegranskat)abstract
- The electroluminescence from pn-diodes with (1) aluminum doped epitaxially grown, (2) aluminum implanted or (3) aluminum and boron implanted p-layer have been investigated. The temperature dependence for both the spectra and the decays of the major spectral components have been investigated at temperatures from 80 K to 550 K. The implanted diodes show implantation damage in the form of the D-1 center and lack of emission from the aluminum center. The epitaxial diodes show luminescence from the aluminum center. The band edge luminescence is visible above 150 K for the epitaxial diode and above 300 K for the implanted. The emission from deep boron can be seen in the aluminum and boron co-implanted diode and in the epitaxially grown diode that have an unintentional boron doping below 10(17) cm(-3).
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| 9. |
- Carlsson, Fredrik, et al.
(författare)
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Neutron irradiation of 4H SiC
- 2001
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Ingår i: Materials Science Forum, Vols. 353-356. ; , s. 555-558
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Konferensbidrag (refereegranskat)abstract
- The effect of neutron irradiation on 4H SiC epitaxial layers are studied. Several different doses of both fast and thermal neutrons have been used and the samples have been annealed from 500 degreesC to 2000 degreesC. The defect concentration dependence on the fast neutron flux and on the annealing temperature is investigated. At temperatures from 900 degreesC to 1300 degreesC new lines between 3960 Angstrom and 4270 Angstrom appear. They are similar in behavior to the E-A and D1 spectra and are assumed to be related to excitons bound to isoelectronic centers. After annealing at 2000 degreesC another new line appears at 3809 Angstrom. The similarity of this line with phosphorus in 6H makes us tentatively ascribe it to phosphorus.
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| 10. |
- Carlsson, Fredrik, et al.
(författare)
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Trapped carrier electroluminescence (TraCE) - A novel method for correlating electrical and optical measurements
- 2001
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Ingår i: Physica B, Vols. 308-310. ; , s. 1165-1168
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Konferensbidrag (refereegranskat)abstract
- SiC is a semiconductor with very good material properties for high power, high frequency and high temperature applications. During device fabrication irradiation with particles is often used, e.g., ion-implantation, which creates intrinsic defects. The most persistent defect in SiC is DI that appears after irradiation and subsequent high temperature annealing. A direct method called Trapped Carrier Electroluminescence (TraCE) for correlating minority carrier traps with luminescence measurements is presented. A semi-transparent Schottky diode under reverse bias is illuminated with a laser pulse of above band gap light to create minority carriers that are captured to traps in the space charge region. Majority carriers are introduced when the reverse bias is removed and the space charge region is reduced. The majority carriers recombine with the trapped minority carriers and the emitted light from the recombination is detected. TraCE has been used to study and correlate the DI bound exciton luminescence from intrinsic defects in SiC with an electrically observed hole trap HS1. © 2001 Elsevier Science B.V. All rights reserved.
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