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- Vermeulen, B., et al.
(författare)
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Automatic generation of breakpoint hardware for silicon debug
- 2004
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Ingår i: Proceedings of the 41st Design Automation Conference. - New York, NY, USA : IEEE Computer Society. - 1581138288 ; , s. 514-517
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Konferensbidrag (refereegranskat)abstract
- Scan-based silicon debug is a technique that can be used to help find design errors in prototype silicon more quickly. One part of this technique involves the inclusion of break-point modules during the design stage of the chip. This paper focuses on an innovative approach to automatically generate breakpoint modules by means of a breakpoint description language. This language is illustrated using an example, and experimental results are presented that show the efficiency and effectiveness of this new method for generating breakpoint hardware.
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