| 1. |
|
|
| 2. |
- Arwin, Hans, 1950-, et al.
(författare)
-
Infrared ellipsometry studies of thermal stability of protein monolayers and multilayers
- 2008
-
Ingår i: Physica Status Solidi. C: Current Topics in Solid State Physics. - Weinheim, Germany : Wiley-VCH Verlagsgesellschaft. - 1862-6351. ; 5:5, s. 1438-1441
-
Tidskriftsartikel (refereegranskat)abstract
- Methodology for studies of effects of heating multilayers of human serum albumin (HSA) and anti-HSA is presented. Multilayers of anti-HSA were prepared on silicon substrates and studied with infrared spectroscopic ellipsometry equipped with a heat stage. The refractive index N = n + ik and the layer thickness are determined and the amide bands are analyzed. It is found that HSA/anti-HSA multilayers are stable for shorter times at temperatures above 100 °C, except for small thickness changes. Also pilot studies of effects of heating monolayers of proteins adsorbed on gold substrates is presented.
|
|
| 3. |
|
|
| 4. |
|
|
| 5. |
- Mock, Alyssa, et al.
(författare)
-
Multiple-layered effective medium approximation approach to modeling environmental effects on alumina passivated highly porous silicon nanostructured thin films measured by in-situ Mueller matrix ellipsometry
- 2017
-
Ingår i: Applied Surface Science. - : ELSEVIER SCIENCE BV. - 0169-4332 .- 1873-5584. ; 421, s. 663-666
-
Tidskriftsartikel (refereegranskat)abstract
- Optical changes in alumina passivated highly porous silicon slanted columnar thin films during controlled exposure to toluene vapor are reported. Electron-beam evaporation glancing angle deposition and subsequent atomic layer deposition are utilized to deposit alumina passivated nanostructured porous silicon thin films. In-situ Mueller matrix generalized spectroscopic ellipsometry in an environmental cell is then used to determine changes in optical properties of the nanostructured thin films by inspection of individual Mueller matrix elements, each of which exhibit sensitivity to adsorption. The use of a multiple-layered effective medium approximation model allows for accurate description of the inhomogeneous nature of toluene adsorption onto alumina passivated highly porous silicon slanted columnar thin films. (C) 2016 Elsevier B.V. All rights reserved.
|
|
| 6. |
- Zangooie, Shahin
(författare)
-
Fabrication, Characterization and Applications of Porous Silicon Thin Films and Multilayered Systems
- 1999
-
Doktorsavhandling (övrigt vetenskapligt/konstnärligt)abstract
- Variable angle spectroscopic ellipsometry was used for characterization of single- as well as multilayered systems of porous silicon. In addition to the complex structures such as Bragg reflectors and Fabry-Pérot filters, more advanced continuos porosity profiles were manufactured in a controlled manner. Furthermore, the active role of HCl as an additional component in the HF-based electrolytes and its effects on the microstructural properties of the material were investigated. Generalized ellipsometry was employed in order to investigate optical anisotropy of the material. The effects of thermal oxidation on the microstructural as well as optical properties of various types of porous silicon structures were investigated. In addition, an improvement of the vapor sensitivity at temperatures lower than room-temperature was observed. Ellipsometry was utilized to in a quantitative manner investigate adsorption of proteins in the material.
|
|
