SwePub
Sök i SwePub databas

  Utökad sökning

Träfflista för sökning "WFRF:(Yakimova Rositsa 1942 ) "

Sökning: WFRF:(Yakimova Rositsa 1942 )

  • Resultat 1-10 av 80
Sortera/gruppera träfflistan
   
NumreringReferensOmslagsbildHitta
1.
  •  
2.
  • Kasic, A., et al. (författare)
  • Characterization of crack-free relaxed GaN grown on 2″ sapphire
  • 2005
  • Ingår i: Journal of Applied Physics. - : AIP Publishing. - 0021-8979 .- 1089-7550. ; 98:7, s. 73525-
  • Tidskriftsartikel (refereegranskat)abstract
    • We demonstrate the growth of high-quality and virtually strain-free bulklike GaN by hydride vapor-phase epitaxy in a vertical atmospheric-pressure reactor with a bottom-fed design. The 300‐μm-thick GaN layer was grown on a 2″ (0 0 0 1) sapphire substrate buffered with a ∼ 2‐μm-thick GaN layer grown by metal-organic chemical-vapor deposition. During the cool down process to room temperature, cracking was induced in the sapphire substrate, thereby allowing the bulklike GaN layer to relax without provoking cracking of itself. The crystalline quality and the residual strain in the 2″ GaN wafer were investigated by various characterization techniques. The lateral homogeneity of the wafer was monitored by low-temperature photoluminescence mapping. High-resolution x-ray diffraction and photoluminescence measurements proved the high crystalline quality of the material grown. The position of the main near-band-gap photoluminescence line and the phonon spectra obtained from infrared spectroscopic ellipsometry show consistently that the 2″ crack-free GaN is virtually strain-free over a diameter of approximately 4 cm.
  •  
3.
  • Yakimova, Rositsa, 1942-, et al. (författare)
  • Preface
  • 2007
  • Ingår i: First International Symposium on Growth of Nitrides ISGN-1,2006. - Journal of Crystal Growth, Vol. 300 : Elsevier Science.
  • Konferensbidrag (refereegranskat)
  •  
4.
  • Backes, Claudia, et al. (författare)
  • Production and processing of graphene and related materials
  • 2020
  • Ingår i: 2D Materials. - : IOP Publishing. - 2053-1583. ; 7:2
  • Tidskriftsartikel (refereegranskat)abstract
    • We present an overview of the main techniques for production and processing of graphene and related materials (GRMs), as well as the key characterization procedures. We adopt a 'hands-on' approach, providing practical details and procedures as derived from literature as well as from the authors' experience, in order to enable the reader to reproduce the results. Section I is devoted to 'bottom up' approaches, whereby individual constituents are pieced together into more complex structures. We consider graphene nanoribbons (GNRs) produced either by solution processing or by on-surface synthesis in ultra high vacuum (UHV), as well carbon nanomembranes (CNM). Production of a variety of GNRs with tailored band gaps and edge shapes is now possible. CNMs can be tuned in terms of porosity, crystallinity and electronic behaviour. Section II covers 'top down' techniques. These rely on breaking down of a layered precursor, in the graphene case usually natural crystals like graphite or artificially synthesized materials, such as highly oriented pyrolythic graphite, monolayers or few layers (FL) flakes. The main focus of this section is on various exfoliation techniques in a liquid media, either intercalation or liquid phase exfoliation (LPE). The choice of precursor, exfoliation method, medium as well as the control of parameters such as time or temperature are crucial. A definite choice of parameters and conditions yields a particular material with specific properties that makes it more suitable for a targeted application. We cover protocols for the graphitic precursors to graphene oxide (GO). This is an important material for a range of applications in biomedicine, energy storage, nanocomposites, etc. Hummers' and modified Hummers' methods are used to make GO that subsequently can be reduced to obtain reduced graphene oxide (RGO) with a variety of strategies. GO flakes are also employed to prepare three-dimensional (3d) low density structures, such as sponges, foams, hydro- or aerogels. The assembly of flakes into 3d structures can provide improved mechanical properties. Aerogels with a highly open structure, with interconnected hierarchical pores, can enhance the accessibility to the whole surface area, as relevant for a number of applications, such as energy storage. The main recipes to yield graphite intercalation compounds (GICs) are also discussed. GICs are suitable precursors for covalent functionalization of graphene, but can also be used for the synthesis of uncharged graphene in solution. Degradation of the molecules intercalated in GICs can be triggered by high temperature treatment or microwave irradiation, creating a gas pressure surge in graphite and exfoliation. Electrochemical exfoliation by applying a voltage in an electrolyte to a graphite electrode can be tuned by varying precursors, electrolytes and potential. Graphite electrodes can be either negatively or positively intercalated to obtain GICs that are subsequently exfoliated. We also discuss the materials that can be amenable to exfoliation, by employing a theoretical data-mining approach. The exfoliation of LMs usually results in a heterogeneous dispersion of flakes with different lateral size and thickness. This is a critical bottleneck for applications, and hinders the full exploitation of GRMs produced by solution processing. The establishment of procedures to control the morphological properties of exfoliated GRMs, which also need to be industrially scalable, is one of the key needs. Section III deals with the processing of flakes. (Ultra)centrifugation techniques have thus far been the most investigated to sort GRMs following ultrasonication, shear mixing, ball milling, microfluidization, and wet-jet milling. It allows sorting by size and thickness. Inks formulated from GRM dispersions can be printed using a number of processes, from inkjet to screen printing. Each technique has specific rheological requirements, as well as geometrical constraints. The solvent choice is critical, not only for the GRM stability, but also in terms of optimizing printing on different substrates, such as glass, Si, plastic, paper, etc, all with different surface energies. Chemical modifications of such substrates is also a key step. Sections IV-VII are devoted to the growth of GRMs on various substrates and their processing after growth to place them on the surface of choice for specific applications. The substrate for graphene growth is a key determinant of the nature and quality of the resultant film. The lattice mismatch between graphene and substrate influences the resulting crystallinity. Growth on insulators, such as SiO2, typically results in films with small crystallites, whereas growth on the close-packed surfaces of metals yields highly crystalline films. Section IV outlines the growth of graphene on SiC substrates. This satisfies the requirements for electronic applications, with well-defined graphene-substrate interface, low trapped impurities and no need for transfer. It also allows graphene structures and devices to be measured directly on the growth substrate. The flatness of the substrate results in graphene with minimal strain and ripples on large areas, allowing spectroscopies and surface science to be performed. We also discuss the surface engineering by intercalation of the resulting graphene, its integration with Si-wafers and the production of nanostructures with the desired shape, with no need for patterning. Section V deals with chemical vapour deposition (CVD) onto various transition metals and on insulators. Growth on Ni results in graphitized polycrystalline films. While the thickness of these films can be optimized by controlling the deposition parameters, such as the type of hydrocarbon precursor and temperature, it is difficult to attain single layer graphene (SLG) across large areas, owing to the simultaneous nucleation/growth and solution/precipitation mechanisms. The differing characteristics of polycrystalline Ni films facilitate the growth of graphitic layers at different rates, resulting in regions with differing numbers of graphitic layers. High-quality films can be grown on Cu. Cu is available in a variety of shapes and forms, such as foils, bulks, foams, thin films on other materials and powders, making it attractive for industrial production of large area graphene films. The push to use CVD graphene in applications has also triggered a research line for the direct growth on insulators. The quality of the resulting films is lower than possible to date on metals, but enough, in terms of transmittance and resistivity, for many applications as described in section V. Transfer technologies are the focus of section VI. CVD synthesis of graphene on metals and bottom up molecular approaches require SLG to be transferred to the final target substrates. To have technological impact, the advances in production of high-quality large-area CVD graphene must be commensurate with those on transfer and placement on the final substrates. This is a prerequisite for most applications, such as touch panels, anticorrosion coatings, transparent electrodes and gas sensors etc. New strategies have improved the transferred graphene quality, making CVD graphene a feasible option for CMOS foundries. Methods based on complete etching of the metal substrate in suitable etchants, typically iron chloride, ammonium persulfate, or hydrogen chloride although reliable, are time- and resource-consuming, with damage to graphene and production of metal and etchant residues. Electrochemical delamination in a low-concentration aqueous solution is an alternative. In this case metallic substrates can be reused. Dry transfer is less detrimental for the SLG quality, enabling a deterministic transfer. There is a large range of layered materials (LMs) beyond graphite. Only few of them have been already exfoliated and fully characterized. Section VII deals with the growth of some of these materials. Amongst them, h-BN, transition metal tri- and di-chalcogenides are of paramount importance. The growth of h-BN is at present considered essential for the development of graphene in (opto) electronic applications, as h-BN is ideal as capping layer or substrate. The interesting optical and electronic properties of TMDs also require the development of scalable methods for their production. Large scale growth using chemical/physical vapour deposition or thermal assisted conversion has been thus far limited to a small set, such as h-BN or some TMDs. Heterostructures could also be directly grown. Section VIII discusses advances in GRM functionalization. A broad range of organic molecules can be anchored to the sp(2) basal plane by reductive functionalization. Negatively charged graphene can be prepared in liquid phase (e.g. via intercalation chemistry or electrochemically) and can react with electrophiles. This can be achieved both in dispersion or on substrate. The functional groups of GO can be further derivatized. Graphene can also be noncovalently functionalized, in particular with polycyclic aromatic hydrocarbons that assemble on the sp(2) carbon network by pi-pi stacking. In the liquid phase, this can enhance the colloidal stability of SLG/FLG. Approaches to achieve noncovalent on-substrate functionalization are also discussed, which can chemically dope graphene. Research efforts to derivatize CNMs are also summarized, as well as novel routes to selectively address defect sites. In dispersion, edges are the most dominant defects and can be covalently modified. This enhances colloidal stability without modifying the graphene basal plane. Basal plane point defects can also be modified, passivated and healed in ultra-high vacuum. The decoration of graphene with metal nanoparticles (NPs) has also received considerable attention, as it allows to exploit synergistic effects between NPs and graphene. Decoration can be either achieved chemically or in the gas phase. All LMs,
  •  
5.
  • Beshkova, Milena, et al. (författare)
  • Low-pressure sublimation epitaxy of AlN films - growth and characterization
  • 2004
  • Ingår i: Vacuum. - : Elsevier BV. - 0042-207X .- 1879-2715. ; 76, s. 143-146
  • Tidskriftsartikel (refereegranskat)abstract
    • Epitaxial layers of aluminum nitride have been grown at temperatures 1900-2400degreesC on 10 x 10 mm(2) 4H-SiC substrate via sublimation recondensation in an RF heated graphite furnace. The source material was polycrystalline sintered AlN. A maximum growth rate of about 100 mum/h was achieved at 2400degreesC and seed to source distance of 1 mm. The surface morphology reflects the hexagonal symmetry of the seed suggesting an epitaxial growth. This was confirmed by X-ray diffraction (XRD). The spectra showed very strong and well-defined (0002) reflection position at around 36.04degrees in symmetric Theta-2Thetascans for all samples. Micro-Raman spectroscopy reveals that the films have a wurtzite structure. It is evidenced by the appearance of the A(1) (TO) (at 601 cm(-1)) and E-2((2)) (at 651 cm(-1)) lines in the spectra. Secondary-ion mass spectroscopy (SIMS) results showed a low concentration of carbon incorporation in the AlN films. A correlation between the growth conditions and properties of the AlN layers was established.
  •  
6.
  •  
7.
  • Beshkova, Milena, 1975-, et al. (författare)
  • Structural Properties of 3C-SiC Grown by Sublimation Epitaxy
  • 2009
  • Ingår i: ECSCRM2009,2009. - Materials Science Forum Vols. 615-617 : Trans Tech Publications. - 9780878493340 ; , s. 181-184
  • Konferensbidrag (refereegranskat)abstract
    • The present paper deals with morphological and structural investigation of 3C-SiC layers grown by sublimation epitaxy on on axis 6H-SiC(0001) at source temperature 2000 °C, under vacuum conditions (<10-5 mbar) and different temperature gradients in the range of 5-8 °C/mm. The layer grown at a temperature gradient 6 °C/mm has the largest average domain size of 0.4 mm2 assessed by optical microscope in transmission mode. The rocking curve full width at half maximum (FWHM) of (111) reflection is 43 arcsec which suggests good crystalline quality. The AFM image of the same layer shows steps with height 0.25 nm and 0.75 nm which are characteristic of a stacking fault free 3C-SiC surface and c-axis repeat height, respectively.
  •  
8.
  • Ciechonski, Rafal, 1976-, et al. (författare)
  • Evaluation of MOS structures processed on 4H–SiC layers grown by PVT epitaxy
  • 2005
  • Ingår i: Solid-State Electronics. - : Elsevier BV. - 0038-1101 .- 1879-2405. ; 49:12, s. 1917-1920
  • Tidskriftsartikel (refereegranskat)abstract
    • MOS capacitors have been fabricated on 4H–SiC epilayers grown by physical vapor transport (PVT) epitaxy. The properties were compared with those on similar structures based on chemical vapor deposition (CVD) layers. Capacitance–voltage (C–V) and conductance measurements (G–V) were performed in the frequency range of 1 kHz to 1 MHz and also at temperatures up to 475 K. Detailed investigations of the PVT structures indicate a stable behaviour of the interface traps from room temperature up to 475 K. The amount of positive oxide charge QO is 6.83 × 109 cm−2 at room temperature and decreases with temperature increase. This suggests that the processed devices are temperature stable. The density of interface states Dit obtained by Nicollian–Brews conductance method is lower in the structure based on the PVT grown sample.
  •  
9.
  •  
10.
  • Ewing, D.J., et al. (författare)
  • Inhomogeneous electrical characteristics in 4H-SiC Schottky diodes
  • 2007
  • Ingår i: Semiconductor Science and Technology. - : IOP Publishing. - 0268-1242 .- 1361-6641. ; 22:12, s. 1287-1291
  • Tidskriftsartikel (refereegranskat)abstract
    • Hundreds of current-voltage (I-V) measurements of Ni, Pt and Ti Schottky diodes on 4H-SiC were conducted at low applied voltages. The SiC substrates contained homoepitaxial layers grown by either chemical vapor deposition or sublimation. While near-ideal contacts were fabricated on all samples, a significant percentage of diodes (∼7%-50% depending on the epitaxial growth method and the diode size) displayed a non-ideal, or inhomogeneous, barrier height. These 'non-ideal' diodes occurred regardless of growth technique, pre-deposition cleaning method, or contact metal. In concurrence with our earlier reports in which the non-ideal diodes were modeled as two Schottky barriers in parallel, the lower of the two Schottky barriers, when present, was predominantly centered at one of the three values: ∼0.60, 0.85 or 1.05 eV. The sources of these non-idealities were investigated using electron-beam- induced current (EBIC) and deep-level transient spectroscopy (DLTS) to determine the nature and energy levels of the defects. DLTS revealed a defect level that corresponds with the low- (non-ideal) barrier height, at ∼0.60 eV. It was also observed that the I-V characteristics tended to degrade with increasing deep-level concentration and that inhomogeneous diodes tended to contain defect clusters. Based on the results, it is proposed that inhomogeneities, in the form of one or more low-barrier height regions within a high-barrier height diode, are caused by defect clusters that locally pin the Fermi level. © 2007 IOP Publishing Ltd.
  •  
Skapa referenser, mejla, bekava och länka
  • Resultat 1-10 av 80
Typ av publikation
konferensbidrag (42)
tidskriftsartikel (33)
bokkapitel (2)
samlingsverk (redaktörskap) (1)
doktorsavhandling (1)
patent (1)
visa fler...
visa färre...
Typ av innehåll
refereegranskat (73)
övrigt vetenskapligt/konstnärligt (6)
populärvet., debatt m.m. (1)
Författare/redaktör
Yakimova, Rositsa, 1 ... (79)
Syväjärvi, Mikael, 1 ... (36)
Uvdal, Kajsa, 1961- (10)
Ivanov, Ivan Gueorgu ... (9)
Yazdi, Gholamreza, 1 ... (8)
Janzén, Erik, 1954- (7)
visa fler...
Petoral, Rodrigo Jr, ... (7)
Lloyd Spetz, Anita, ... (7)
Lloyd-Spets, Anita, ... (7)
Svensson, B. G. (6)
Jokubavicius, Valdas ... (5)
Khranovskyy, V. (5)
Nguyen, Son Tien, 19 ... (4)
Lebedev, A.A. (4)
Eriksson, Jens, 1979 ... (4)
Grossner, U. (4)
Monemar, Bo, 1942- (3)
Kakanakova-Georgieva ... (3)
Birch, Jens, 1960- (3)
Puglisi, Donatella, ... (3)
Henry, Anne, 1959- (3)
Beshkova, Milena, 19 ... (3)
Vasiliauskas, Remigi ... (3)
Ciechonski, Rafal, 1 ... (3)
Lazorenko, V (3)
Ohshima, T. (2)
Kuznetsov, A. (2)
Willander, Magnus, 1 ... (2)
Svensson, B (2)
Käll, Per-Olov, 1947 ... (2)
Zakharov, Alexei A. (2)
Eriksson, Jens (2)
Tegenkamp, Christoph (2)
Itoh, H. (2)
Wahab, Qamar-ul, 195 ... (2)
Isoya, J. (2)
Chen, Weimin, 1959- (2)
Zhao, Qing Xiang, 19 ... (2)
Buyanova, Irina, 196 ... (2)
Izadifard, Morteza, ... (2)
Rodner, Marius, 1991 ... (2)
Gogova, Daniela (2)
Eickhoff, M. (2)
Lashkarev, G. (2)
Ivanov, A M (2)
Strokan, N B (2)
Shi, Yuchen (2)
Kalabukhova, E.N. (2)
Lukin, S.N. (2)
Lashkarev, G V (2)
visa färre...
Lärosäte
Linköpings universitet (80)
Lunds universitet (3)
Chalmers tekniska högskola (2)
Språk
Engelska (80)
Forskningsämne (UKÄ/SCB)
Naturvetenskap (14)
Teknik (4)

År

Kungliga biblioteket hanterar dina personuppgifter i enlighet med EU:s dataskyddsförordning (2018), GDPR. Läs mer om hur det funkar här.
Så här hanterar KB dina uppgifter vid användning av denna tjänst.

 
pil uppåt Stäng

Kopiera och spara länken för att återkomma till aktuell vy