| 1. |
- Lubenschenko, A., et al.
(författare)
-
XPS Study of Niobium and Niobium-Nitride Nanofilms
- 2018
-
Ingår i: Journal of Surface Investigation. - 1819-7094 .- 1027-4510. ; 12:4, s. 692-700
-
Tidskriftsartikel (refereegranskat)abstract
- A new, XPS-based approach to quantitative and nondestructive determination of the chemical and phase layer composition of multicomponent multilayer films is proposed. It includes a new method for subtracting the background of repeatedly inelastically scattered photoelectrons, taking into account the inhomogeneity of inelastic scattering over depth; a new way of decomposing a photoelectron line into component peaks, taking into account the physical nature of various decomposition parameters; solution of the problem of subtracting the background and decomposing the photoelectron line simultaneously; and determination of the thickness of the layers of a multilayer target using a simple equation. The phase-layer composition of nanoscale Nb and NbN films is determined, and the thicknesses of these layers are calculated.
|
|
| 2. |
- Perrichon, Adrien, 1988, et al.
(författare)
-
Neutron Ray-Tracing Simulations of a New Supermirror Guide for the Osiris Spectrometer
- 2020
-
Ingår i: Journal of Surface Investigation. - : PLEIADES PUBLISHING INC. - 1819-7094 .- 1027-4510. ; 14, s. S169-S174
-
Tidskriftsartikel (refereegranskat)abstract
- A new supermirror guide has been proposed to replace the current neutron guide of the indirect time-of-flight near-backscattering spectrometer OSIRIS at the ISIS facility. Here we present an extensive Monte Carlo simulation study for the design and optimisation of a new guide system. Among the several guide geometry assessed, a curved guide with elliptical defocusing and focusing sections is shown to perform best. The estimated gain in intensity is a factor of 5–6 at the sample position with a homogeneous distribution of the divergence. The elliptic geometry results in a smaller beam spot and smaller samples will particularly benefit from this upgrade. The proposed guide replacement will ensure that the OSIRIS spectrometer will remain competitive in the years to come.
|
|
| 3. |
- Stepanova, K. V., et al.
(författare)
-
Influence of annealing on the structure of nanoporous oxide films on the surface of titanium‒aluminum powder alloy
- 2016
-
Ingår i: Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques. - Moscow : Maik Nauka/Interperiodica. - 1027-4510. ; 10:5, s. 933-941
-
Tidskriftsartikel (refereegranskat)abstract
- Oxide films obtained during anodization of Ti‒40% Al sintered powder samples in fluorine-containing electrolytes are investigated. With scanning electron microscopy and X-ray phase analysis, it is demonstrated that an X-ray amorphous nanoporous anodic oxide film is formed on the surface of the powder microparticles under optimal anodization conditions. After annealing at T = 1093 K in air and vacuum (10‒2 Pa), the oxide films are revealed to crystallize with its regular porous structure retained. The composition of the polycrystalline anodic-oxide films annealed in air is a mixture involving TiO2 (anatase and rutile) and α- and γ-Al2O3 phases and Ti2O3 and Al2TiO5 traces. The vacuum annealing process makes it possible to identify TiO2, in which anatase is the main phase, α- and γ-Al2O3, and Ti2O3 and TiO traces. However, rutile is not revealed. The presented results indicate that the application of the anodic nanostructuring of Ti‒40% Al powders is promising for the obtainment of new photocatalytic active nanomaterials. © 2016, Pleiades Publishing, Ltd.
|
|
| 4. |
- Tsetlin, M. B., et al.
(författare)
-
Investigation of Epitaxial Nd1.85Ce0.15CuO4-y Film Surface by Low Energy Electron Diffractometry
- 2008
-
Ingår i: Journal Of Surface Investigation-X-Ray Synchrotron And Neutron Techniques. - 1027-4510. ; 2:6, s. 928-930
-
Tidskriftsartikel (refereegranskat)abstract
- The surface of epitaxial Nd1.85Ce0.15CuO4-y(001) (NCCO) film has been studied by low energy electron diffractometry (LEED) and photoelectron spectroscopy. Ar+ ion etching of a surface with subsequent annealing in oxygen at atmosphere pressure has been found to lead to the ordered structure restoration of surface layers with the symmetry type and lattice parameters corresponding to the NCCO phase. Annealing in vacuum at temperatures close to the boundary of thermodynamic phase stability results in the formation of epitaxial Ce0.5Nd0.5O1.75 phase on a surface that is indicated in the LEED pattern as additional spots corresponding to the surface lattice (root 2 x root 2) R45 degrees.
|
|
| 5. |
- Tsetlin, M. B., et al.
(författare)
-
Spatial Structures Formed during High-Temperature Vacuum Annealing of Diamond-Like Film Deposited on a Silicon Substrate
- 2009
-
Ingår i: Journal Of Surface Investigation-X-Ray Synchrotron And Neutron Techniques. - 1027-4510. ; 3:5, s. 752-755
-
Tidskriftsartikel (refereegranskat)abstract
- The process of an ultrahigh vacuum annealing of a diamond-like carbon film deposited on a silicon substrate has been studied in situ using a photoemission microscope mounted at the MAX-lab synchrotron's radiation source. After the annealing the film was examined ex situ using an atomic force microscope. It is revealed that the graphitization of the film occurs and round formations of several microns in size with a core of similar to 0.2 mu m in size appear on its surface at the temperature exceeding 1000 degrees C. Photoemission images of these formations have shown the presence of silicon on their surface. Apparently, the interaction between the carbon film and silicon substrate begins in the middle of the formation and spreads to the adjacent region at the following stage.
|
|
