| 1. |
- Shard, A. G., et al.
(författare)
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Measuring Compositions in Organic Depth Profiling: Results from a VAMAS Interlaboratory Study
- 2015
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Ingår i: Journal of Physical Chemistry B. - : American Chemical Society (ACS). - 1520-6106 .- 1520-5207. ; 119:33, s. 10784-10797
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Tidskriftsartikel (refereegranskat)abstract
- We report the results of a VAMAS (Versailles Project on Advanced Materials and Standards) interlaboratory study on the measurement of composition in organic depth profiling. Layered samples with known binary compositions of Irganox 1010 and either Irganox 1098 or Fmoc-pentafluoro-L-phenylalanine in each layer were manufactured in a single batch and distributed to more than 20 participating laboratories. The samples were analyzed using argon cluster ion sputtering and either X-ray photoelectron spectroscopy (XPS) or time-of-flight secondary ion mass spectrometry (ToF-SIMS) to generate depth profiles. Participants were asked to estimate the volume fractions in two of the layers and were provided with the compositions of all other layers. Participants using XPS provided volume fractions within 0.03 of the nominal values. Participants using ToF-SIMS either made no attempt, or used various methods that gave results ranging in error from 0.02 to over 0.10 in volume fraction, the latter representing a 50% relative error for a nominal volume fraction of 0.2. Error was predominantly caused by inadequacy in the ability to compensate for primary ion intensity variations and the matrix effect in SIMS. Matrix effects in these materials appear to be more pronounced as the number of atoms in both the primary analytical ion and the secondary ion increase. Using the participants' data we show that organic SIMS matrix effects can be measured and are remarkably consistent between instruments. We provide recommendations for identifying and compensating for matrix effects. Finally, we demonstrate, using a simple normalization method, that virtually all ToF-SIMS participants could have obtained estimates of volume fraction that were at least as accurate and consistent as XPS.
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| 2. |
- Aoyagi, M., et al.
(författare)
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Systematic effects on a Compton polarimeter at the focus of an X-ray mirror
- 2024
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Ingår i: Astroparticle physics. - : Elsevier BV. - 0927-6505 .- 1873-2852. ; 158
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Tidskriftsartikel (refereegranskat)abstract
- XL-Calibur is a balloon-borne Compton polarimeter for X-rays in the ∼15–80 keV range. Using an X-ray mirror with a 12 m focal length for collecting photons onto a beryllium scattering rod surrounded by CZT detectors, a minimum-detectable polarization as low as ∼3% is expected during a 24-hour on-target observation of a 1 Crab source at 45° elevation. Systematic effects alter the reconstructed polarization as the mirror focal spot moves across the beryllium scatterer, due to pointing offsets, mechanical misalignment or deformation of the carbon-fiber truss supporting the mirror and the polarimeter. Unaddressed, this can give rise to a spurious polarization signal for an unpolarized flux, or a change in reconstructed polarization fraction and angle for a polarized flux. Using bench-marked Monte-Carlo simulations and an accurate mirror point-spread function characterized at synchrotron beam-lines, systematic effects are quantified, and mitigation strategies discussed. By recalculating the scattering site for a shifted beam, systematic errors can be reduced from several tens of percent to the few-percent level for any shift within the scattering element. The treatment of these systematic effects will be important for any polarimetric instrument where a focused X-ray beam is impinging on a scattering element surrounded by counting detectors.
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| 3. |
- Kawashima, T., et al.
(författare)
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Examination of fragment ions of polystyrene in TOF-SIMS spectra using MS/MS
- 2014
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Ingår i: Surface and Interface Analysis. - : Wiley. - 0142-2421 .- 1096-9918. ; 46, s. 92-95
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Tidskriftsartikel (refereegranskat)abstract
- In this study, tendencies of ionization and cleavage processes of time-of-flight (TOF)-SIMS were examined using MS/MS, which enables an easy qualitative analysis of organic matters, to clarify the fragment ions showing structures of the organic materials. In this paper, a result of reviewing fragment ions in TOF-SIMS spectra for polystyrene (PS) as the representative material is shown. Samples were measured with collision induced dissociation (CID)-MS/MS of 1200L (Varian Inc., USA) and TOF-SIMS J105 (Ionoptika Ltd, UK) for the examination of fragment ions of the PS in TOF-SIMS spectra. The use of CID MS/MS with a wide range of energy distribution is effective for the study of the ionization and cleavage process of TOF-SIMS. As a result, the fragment ions representing the PS structure were clarified, which is useful for the material definition. The qualitative analysis was also applied to the fragment ions particularly obtained in this examination. It is suggested that the examination of the fragmentation process using MS/MS is useful for the mass spectra analysis of organic materials in TOF-SIMS. Copyright (c) 2014 John Wiley & Sons, Ltd.
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| 4. |
- Yokoyama, Y., et al.
(författare)
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Peptide Fragmentation and Surface Structural Analysis by Means of ToF-SIMS Using Large Cluster Ion Sources
- 2016
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Ingår i: Analytical Chemistry. - : American Chemical Society (ACS). - 0003-2700 .- 1520-6882. ; 88:7, s. 3592-3597
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Tidskriftsartikel (refereegranskat)abstract
- Peptide or protein structural analysis is crucial for the evaluation of biochips and biodevices, therefore an analytical technique with the ability to detect and identify protein and peptide species directly from surfaces with high lateral resolution is required. In this report, the efficacy of ToF-SIMS to analyze and identify proteins directly from surfaces is evaluated. Although the physics governing the SIMS bombardment process precludes the ability for researchers to detect intact protein or larger peptides of greater than a few thousand mass unit directly, it is possible to obtain information on the partial structures of peptides or proteins using low energy per atom argon duster ion beams. Large cluster ion beams, such as Ar dusters and C-60 ion beams, produce spectra similar to those generated by tandem MS. The SIMS bombardment process also produces peptide fragment ions not detected by conventional MS/MS techniques. In order to clarify appropriate measurement conditions for peptide structural analysis, peptide fragmentation dependency on the energy of a primary ion beam and ToF-SIMS specific fragment ions are evaluated. It was found that the energy range approximately 6 <= E/n <= 10 eV/atom is most effective for peptide analysis based on peptide fragments and [M + H] ions. We also observed the cleaving of side chain moieties at extremely low-energy E/n <= 4 eV/atom.
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| 5. |
- Aoyagi, Satoka, et al.
(författare)
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Peptide structural analysis using continuous Ar cluster and C60 ion beams
- 2013
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Ingår i: Analytical and Bioanalytical Chemistry. - : Springer Science and Business Media LLC. - 1618-2642 .- 1618-2650. ; 405:21, s. 6621-6628
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Tidskriftsartikel (refereegranskat)abstract
- A novel application of time-of-flight secondary ion mass spectrometry (ToF-SIMS) with continuous Ar cluster beams to peptide analysis was investigated. In order to evaluate peptide structures, it is necessary to detect fragment ions related to multiple neighbouring amino acid residues. It is, however, difficult to detect these using conventional ToF-SIMS primary ion beams such as Bi cluster beams. Recently, C60 and Ar cluster ion beams have been introduced to ToF-SIMS as primary ion beams and are expected to generate larger secondary ions than conventional ones. In this study, two sets of model peptides have been studied: (des-Tyr)-Leuenkephalin and (des-Tyr)-Met-enkephalin (molecular weights are approximately 400 Da), and [Asn1 Val5]-angiotensin II and [Val5]-angiotensin I (molecular weights are approximately 1,000 Da) in order to evaluate the usefulness of the large cluster ion beams for peptide structural analysis. As a result, by using the Ar cluster beams, peptide molecular ions and large fragment ions, which are not easily detected using conventional ToF-SIMS primary ion beams such as Bi3+, are clearly detected. Since the large fragment ions indicating amino acid sequences of the peptides are detected by the large cluster beams, it is suggested that the Ar cluster and C60 ion beams are useful for peptide structural analysis.
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| 6. |
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| 7. |
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| 8. |
- Nakano, Shusuke, et al.
(författare)
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Evaluation of biomolecular distributions in rat brain tissues by means of ToF-SIMS using a continuous beam of Ar clusters
- 2016
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Ingår i: Biointerphases. - : American Vacuum Society. - 1559-4106 .- 1934-8630. ; 11:2
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Tidskriftsartikel (refereegranskat)abstract
- Time-of-flight secondary ion mass spectrometry (ToF-SIMS) provides detailed chemical structure information and high spatial resolutionimages. Therefore, ToF-SIMS is useful for studying biological phenomena such as ischemia. In this study, in order to evaluate cerebral microinfarction, the distribution of biomolecules generated by ischemia was measured with ToF-SIMS. ToF-SIMS data sets were analyzed by means of multivariate analysis for interpreting complex samples containing unknown information and to obtain biomolecular mapping indicated by fragment ions from the target biomolecules. Using conventional ToF-SIMS (primary ion source: Bi cluster ion), it is difficult to detect secondary ions beyond approximately 1000 u. Moreover, the intensity of secondary ions related to biomolecules is not always high enough for imaging because of low concentration even if the masses are lower than 1000 u. However, for the observation of biomolecular distributions in tissues, it is important to detect low amounts of biological molecules from a particular area of tissue. Rat braintissue samples were measured with ToF-SIMS (J105, Ionoptika, Ltd., Chandlers Ford, UK), using a continuous beam of Ar clusters as a primary ion source. ToF-SIMS with Ar clusters efficiently detects secondary ions related to biomolecules and larger molecules. Molecules detected by ToF-SIMS were examined by analyzing ToF-SIMS data using multivariate analysis. Microspheres (45μm diameter) were injected into the rat unilateral internal carotid artery (MS rat) to cause cerebral microinfarction. The rat brain was sliced and then measured with ToF-SIMS. The brain samples of a normal rat and the MS rat were examined to find specific secondary ions related to important biomolecules, and then the difference between them was investigated. Finally, specific secondary ions were found around vessels incorporating microspheres in the MS rat. The results suggest that important biomolecules related to cerebral microinfarction can be detected by ToF-SIMS.
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| 9. |
- Petersson, A, et al.
(författare)
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Compositional variation of AlGaN epitaxial films on 6H-SiC substrates determined by cathodoluminescence.
- 2002
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Ingår i: MRS Internet Journal of Nitride Semiconductor Research. - 1092-5783. ; 7:5
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Tidskriftsartikel (refereegranskat)abstract
- High quality epitaxial films of A(l)xGa(1-x)N, grown on SiC substrates, were investigated using spatially resolved cathodoluminescence (CL), scanning electron microscopy, and atomic force microscopy. A variation in the observed peak energy position of the CL was related to alloy fluctuations. CL was used to reveal relative alloy fluctuations of approximately 1% on a sub-micrometer scale, with a precision difficult to surpass with other available techniques. By correlating data from the different techniques, a model was derived. The main feature of it is an alloy fluctuation on the micrometer scale, seeded during the initial growth and extending through the epitaxial film. These alloy fluctuations seems to be related to terrace steps ( approximate to5 nm in height), formed preferentially at scratches on the SiC surface. This investigation indicates that the initial growth of epitaxial films is critical and structures formed at the beginning of the growth tend to persist throughout the growth. Further, a strain gradient from the SiC interface extending towards the surface, was observed.
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| 10. |
- Stark, T. H., et al.
(författare)
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Generalization of Classic Question Order Effects Across Cultures
- 2020
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Ingår i: Sociological Methods & Research. - : SAGE Publications. - 0049-1241 .- 1552-8294. ; 49:3, s. 567-602
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Tidskriftsartikel (refereegranskat)abstract
- Questionnaire design is routinely guided by classic experiments on question form, wording, and context conducted decades ago. This article explores whether two question order effects (one due to the norm of evenhandedness and the other due to subtraction or perceptual contrast) appear in surveys of probability samples in the United States and 11 other countries (Canada, Denmark, Germany, Iceland, Japan, the Netherlands, Norway, Portugal, Sweden, Taiwan, and the United Kingdom;N= 25,640). Advancing theory of question order effects, we propose necessary conditions for each effect to occur, and found that the effects occurred in the nations where these necessary conditions were met. Surprisingly, the abortion question order effect even appeared in some countries in which the necessary condition was not met, suggesting that the question order effect there (and perhaps elsewhere) was not due to subtraction or perceptual contrast. The question order effects were not moderated by education. The strength of the effect due to the norm of evenhandedness was correlated with various cultural characteristics of the nations. Strong support was observed for the form-resistant correlation hypothesis.
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