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Träfflista för sökning "WFRF:(Favre Nicolin V.) "

Search: WFRF:(Favre Nicolin V.)

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  • Eymery, J., et al. (author)
  • X-ray measurements of the strain and shape of dielectric/metallic wrap-gated InAs nanowires
  • 2009
  • In: Applied Physics Letters. - : AIP Publishing. - 0003-6951 .- 1077-3118. ; 94:13
  • Journal article (peer-reviewed)abstract
    • Wrap-gate (111) InAs nanowires (NWs) were studied after HfO2 dielectric coating and Cr metallic deposition by a combination of grazing incidence x-ray techniques. In-plane and out-of-plane x-ray diffraction (crystal truncation rod analysis) allow determining the strain tensor. The longitudinal contraction, increasing with HfO2 and Cr deposition, is significantly larger than the radial dilatation. For the Cr coating, the contraction along the growth axis is quite large (-0.95%), and the longitudinal/radial deformation ratio is >10, which may play a role on the NW transport properties. Small angle x-ray scattering shows a smoothening of the initial hexagonal bare InAs NW shape and gives the respective core/shell thicknesses, which are compared to flat surface values.
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3.
  • Favre-Nicolin, V., et al. (author)
  • Analysis of strain and stacking faults in single nanowires using Bragg coherent diffraction imaging
  • 2010
  • In: New Journal of Physics. - : IOP Publishing. - 1367-2630. ; 12
  • Journal article (peer-reviewed)abstract
    • Coherent diffraction imaging (CDI) on Bragg reflections is a promising technique for the study of three-dimensional (3D) composition and strain fields in nanostructures, which can be recovered directly from the coherent diffraction data recorded on single objects. In this paper, we report results obtained for single homogeneous and heterogeneous nanowires with a diameter smaller than 100 nm, for which we used CDI to retrieve information about deformation and faults existing in these wires. We also discuss the influence of stacking faults, which can create artefacts during the reconstruction of the nanowire shape and deformation.
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