| 1. |
|
|
| 2. |
|
|
| 3. |
|
|
| 4. |
|
|
| 5. |
|
|
| 6. |
|
|
| 7. |
|
|
| 8. |
- Isidorsson, J, et al.
(författare)
-
Electrochromism in lithiated Sn oxide: Mossbauer spectroscopy data on valence state changes
- 1996
-
Ingår i: JOURNAL OF APPLIED PHYSICS. - : AMER INST PHYSICS. - 0021-8979. ; 80:4, s. 2367-2371
-
Tidskriftsartikel (övrigt vetenskapligt/konstnärligt)abstract
- Lithiated Sn oxide films, denoted LixSnO2, were produced by reactive rf magnetron sputtering of Sn and electrochemical post-treatment. Optical transmittance and Mossbauer spectra were recorded for progressively increased lithiation. Increasing x from
|
|
| 9. |
|
|
| 10. |
|
|
| 11. |
|
|
| 12. |
|
|
| 13. |
- Isidorsson, J, et al.
(författare)
-
Optical properties of MgH2 measured in situ by ellipsometry and spectrophotometry
- 2003
-
Ingår i: Physical Review B. Condensed Matter and Materials Physics. - 1098-0121 .- 1550-235X. ; 68:11
-
Tidskriftsartikel (refereegranskat)abstract
- The dielectric properties of alpha-MgH2 are investigated in the photon energy range between 1 and 6.5 eV. For this purpose, a sample configuration and experimental setup are developed that allow both optical transmission and ellipsometric measurements of a transparent thin film in equilibrium with hydrogen. We show that alpha-MgH2 is a transparent, color neutral insulator with a band gap of 5.6+/-0.1 eV. It has an intrinsic transparency of about 80% over the whole visible spectrum. The dielectric function found in this work confirms very recent band-structure calculations using the GW approximation by Alford and Chou (unpublished). As Pd is used as a cap layer we report also the optical properties of PdHx thin films.
|
|
| 14. |
- Isidorsson, J, et al.
(författare)
-
Tunable Reflectance Mg-Ni-H films
- 2002
-
Ingår i: Appl. Phys. Lett.. ; 80, s. 2305-
-
Tidskriftsartikel (övrigt vetenskapligt/konstnärligt)
|
|
| 15. |
|
|
| 16. |
|
|
| 17. |
|
|
| 18. |
- Rönnow, Daniel, et al.
(författare)
-
Surface roughness of oxidised copper films studied by atomic force microscopy and spectroscopic light scattering
- 1998
-
Ingår i: Thin Solid Films. - 0040-6090 .- 1879-2731. ; 325:1-2, s. 92-98
-
Tidskriftsartikel (refereegranskat)abstract
- The interface roughness of Cu2O films produced by thermal oxidation of Cu was studied by spectroscopic elastic light scattering and atomic force microscopy. No correlation could be found between the roughness of the two interfaces, although the amplitude and the length scale of the roughness changed in the same way with film thickness for both interfaces. Both interfaces were found to have a fractal dimension of two. A first order perturbation theory was used to analyse the light scattering data; theory and experiment are in good agreement within the limits of the theory.
|
|
| 19. |
- Rönnow, Daniel, et al.
(författare)
-
Surface Roughness of Sputtered ZrO2 Films Studied by Atomic Force Microscopy and Spectroscopic Light Scattering
- 1996
-
Ingår i: Physical Review E. Statistical, Nonlinear, and Soft Matter Physics. - 1063-651X .- 1095-3787. ; 54:4 Suppl. B, s. 4021-4026
-
Tidskriftsartikel (refereegranskat)abstract
- ZrO2 films were prepared by reactive sputtering. Elastic light scattering was used to determine the cross correlation of the substrate and film interface roughness. Surface profiles were measured with atomic-force microscopy. The power spectral density functions could be fitted by the K-correlation model, suggesting self-affine fractal surfaces. The roughness of the film front surfaces was of the same order of magnitude as the substrate roughness. We have derived a replication factor from experimental data that gives information on the evolution of the contribution of the substrate roughness.
|
|
| 20. |
|
|
| 21. |
- Rönnow, Daniel, et al.
(författare)
-
Yttrium hydride layer with switchable microwave properties
- 2004
-
Ingår i: Thin Solid Films. - : Elsevier BV. - 0040-6090 .- 1879-2731. ; 467:1-2, s. 186-189
-
Tidskriftsartikel (refereegranskat)abstract
- We report on switching properties in the microwave region of yttrium hydride. A microstrip line of gold on a quartz substrate was used. A gap in the gold had an yttrium hydride layer of 1.0 ÎŒm thickness with a cap layer of 5 nm palladium and 2 nm aluminium oxide. The yttrium hydride was switched between a metallic and a semiconducting state with the exchange of hydrogen. The transmission (S21) and reflection (S11) coefficients were measured in the range 10 MHz-20 GHz. In the metallic state, the sample works like a microwave transmission line and in its semiconducting state, like a microwave resistor. The transmission coefficient was also measured at 5.0 GHz during hydrogenation and de-hydrogenation.
|
|
| 22. |
|
|
| 23. |
- Strömme Mattsson, M, et al.
(författare)
-
A theoretical analysis of chronoamperometric electrochemical ion intercalation
- 1999
-
Ingår i: JOURNAL OF THE ELECTROCHEMICAL SOCIETY. - : ELECTROCHEMICAL SOC INC. - 0013-4651. ; 146:7, s. 2613-2615
-
Tidskriftsartikel (refereegranskat)abstract
- We propose that the intercalation of ions from a liquid electrolyte into a solid material can be analyzed in terms of a model [J. Appl. Phys., 55, 3341 (1984)] developed for the release of alkali ions from interface traps in a metal-oxide silicon structur
|
|
