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- Pennetta, C, et al.
(författare)
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Thermal effects on the electrical degradation of thin film resistors
- 1999
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Ingår i: PHYSICA A. - : ELSEVIER SCIENCE BV. - 0378-4371. ; 266:1-4, s. 214-217
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Tidskriftsartikel (övrigt vetenskapligt/konstnärligt)abstract
- Recently we introduced a biased percolation model to study the electrical failure of thin-film resistors. Here we extend this model by allowing thermal interactions among first neighbour elemental resistances and accounting for the dependence of each elem
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