| 1. |
- Klangtakai, Pawinee, et al.
(författare)
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Anomalous excitation-power-dependent photoluminescence of InGaAsN/GaAs T-shaped quantum wire
- 2014
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Ingår i: Physica Status Solidi (a) applications and materials science. - : Wiley-VCH Verlag. - 1862-6300 .- 1862-6319. ; 211:8, s. 1740-1744
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Tidskriftsartikel (refereegranskat)abstract
- The selected InGaAsN/GaAs T-shaped quantum wire (T-QWR) fabricated by metal organic vapor phase epitaxy has been investigated by microphotoluminescence (m-PL) and excitation-power-dependent mu-PL. The optical characteristics of one-dimensional structure were taken at low-temperature (4 K) and room temperature (RT) to clarify the intersection of two familiar quantum wells (QWs) in the [001] and [110] directions, named QW1 and QW2, respectively. For the excitation-power-dependent measurement, the intensity of the excitation source was used in the range of 0.001I(0) to I-0. The result shows that all of emissions related to QW1 and QWR peaks have a nonsymmetric line shape as evidenced by the tailing on the lower-energy side. All peaks shift to higher-energy side (blueshift) with the increase of the excitation power intensity. The blueshift and the low-energy tailing of PL peaks are attributed to the alloying effect. However, the emission peak related to QWR region shows a larger blueshift rate than that of QW1 on increasing of the excitation power intensity. This is an anomalous characteristic for the low-dimensional structure, affected by the large fluctuation state in the QWR region. This fluctuation state is combined of both edges of QWs (QW1 and QW2).
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| 2. |
- Mopoung, Kunpot, et al.
(författare)
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Investigation of in situ annealing effect on the thermal stability and crystallinity of IrMn thin films by X-ray diffraction and electron energy loss spectroscopy
- 2022
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Ingår i: Thin Solid Films. - : ELSEVIER SCIENCE SA. - 0040-6090 .- 1879-2731. ; 762
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Tidskriftsartikel (refereegranskat)abstract
- The crystal reorganization of the IrMn thin film was observed by the in situ thermal annealing in the X-ray diffraction (XRD) and electron energy loss spectroscopy. From room temperature to 700 degrees C, the in situ annealing measurements identify the different Mn diffusion effects in three temperature ranges. First, between room temperature and 300 degrees C, the XRD profiles show the reorganization of Mn atoms from interstitials to IrMn lattice points. Second, between 300 and 400 degrees C, we observed the diffusion of Mn atoms from the IrMn thin film to the surface, causing the atomic Mn/Ir ratio to drop from 10 to 7. The MnO appeared on the film surface in this temperature range. Third, from 400 to 700 degrees C, the O content in the IrMn thin film increases to 8%, while the Mn/ Ir ratio continuously decreases from 7 to 5. The scanning transmission electron microscopy images also show that the crystal structure of IrMn thin film completely degrades to another structure.
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