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  • Andersson, Stefan, 1975-, et al. (author)
  • Direct experimental verification of shot noise in short channel MOS transistors
  • 2005
  • In: Electronics Letters. - : Institution of Engineering and Technology (IET). - 0013-5194 .- 1350-911X. ; 41:15, s. 869-871
  • Journal article (peer-reviewed)abstract
    • Drain noise current was measured at an extended temperature range on n-MOS transistors of various lengths made in a 0.18 urn process. A comparison with theoretical noise models strongly indicates the mechanism of shot noise produced near the source by diffusion currents, as proposed by Obrecht et al. © IEE 2005.
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Type of publication
journal article (1)
Type of content
peer-reviewed (1)
Author/Editor
Svensson, Christer, ... (1)
Andersson, Stefan, 1 ... (1)
University
Linköping University (1)
Language
English (1)
Year
2005 (1)

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