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  • Hourahine, B., et al. (author)
  • Molecular hydrogen traps within silicon
  • 1999
  • In: Materials Science & Engineering. - 0921-5107 .- 1873-4944. ; 58:1-2, s. 24-25
  • Journal article (peer-reviewed)abstract
    • We present the results of first principle calculations on the behaviour of molecular hydrogen within crystalline silicon, both as an isolated species, and within defects in the material. These results are compared with recent experimental infra-red and Raman data obtained for silicon treated by either hydrogen plasma or soaked in hydrogen gas. The effect of Fermi-level position on the diffusion barrier of molecular hydrogen within silicon is also discussed
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  • Result 1-1 of 1
Type of publication
journal article (1)
Type of content
peer-reviewed (1)
Author/Editor
Jones, R. (1)
Briddon, P. R. (1)
Öberg, Sven (1)
Hourahine, B. (1)
University
Luleå University of Technology (1)
Language
English (1)
Research subject (UKÄ/SCB)
Natural sciences (1)
Year
1999 (1)

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