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- Qiu, Zhijun, et al.
(författare)
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Role of Si implantation in control of underlap length in Schottky-barrier source/drain MOSFETs on ultrathin body SOI
- 2008
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Ingår i: Proceedings of ULIS. - NEW YORK : IEEE. ; , s. 175-178, s. 175-178
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Konferensbidrag (refereegranskat)abstract
- This works demonstrates a novel approach using Si implantation prior to Pt deposition and PtSi formation to control the underlap length between the PtSi source/drain regions to the gate in Schottky-Barrier (SB-) MOSFETs. Dopant segregation at the PtSi/Si interface is used to enhance device performance. With the lon /Ioff current ratio as an indicator, optimized Si implant doses are found for both n- and p-channel SB-MOSFETs. Through an effective barrier width, the underlap length has direct implication on the leakage current.
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