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  • Thungström, Göran, 1960-, et al. (author)
  • Investigation of radiation hardness in lateral position sensitive detector, irradiated with 13.5 nm photons
  • 2018
  • In: Journal of Instrumentation. - : IOP PUBLISHING LTD. - 1748-0221. ; 13
  • Journal article (peer-reviewed)abstract
    • Radiation hardness measurements have been done by irradiating lateral position sensitive (Si) detectors (LPSD) with 93 eV photons. Three different passivation layers have been investigated, SiO2, oxynitride and deposited 4 nm titanium-layer, on p in n-substrate LPSD and deposited 4 nm titanium layer on n in p-substrate LPSD. Best radiation hardness for 93 eV photon is obtained by using a 4 nm titanium layer. Only a slight decrease in response can be seen in the p in n-substrate LPSD. The best radiation hardness is achieved by using the n in p-substrate LPSD, which show no significant decrease in response. Scanning after irradiation with 93 eV gives only a variation in response of 0.26% in the surrounding area of exposure. No decrease in response can be detected during the scan. Test with a 108 eV photon beam gives an increased variation in response of 0.7%, caused by the shallower absorption in Si.
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  • Result 1-1 of 1
Type of publication
journal article (1)
Type of content
peer-reviewed (1)
Author/Editor
Fröjdh, Christer, 19 ... (1)
Thungström, Göran, 1 ... (1)
Lundgren, A. (1)
Westerberg, Lars (1)
Menk, R. H. (1)
University
Uppsala University (1)
Mid Sweden University (1)
Language
English (1)
Research subject (UKÄ/SCB)
Natural sciences (1)
Engineering and Technology (1)
Year
2018 (1)

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