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Numrering	Referens	Omslagsbild	Hitta
1.	Jeppson, Kjell, 1947, et al. (författare) Hotspot test structures for evaluating carbon nanotube microfin coolers and graphene-like heat spreaders 2016 Ingår i: 29th IEEE International Conference on Microelectronic Test Structures (ICMTS), Yokohama, Japan, Mar 28-31, 2016. - 1071-9032. ; , s. 32-36 Konferensbidrag (refereegranskat)abstract The design, fabrication, and use of a hotspot-producing and temperature-sensing test structure for evaluating the thermal properties of carbon nanotubes, graphene and boron nitride for cooling of electronic devices in applications like 3D integrated chip-stacks, power amplifiers and light-emitting diodes is described. The test structure is a simple meander-shaped metal resistor serving both as the hotspot and the temperature thermo-meter. By use of this test structure, the influence of emerging materials like those mentioned above on the temperature of the hotspot has been evaluated with good accuracy).

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