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  • Avolio, G., et al. (author)
  • Identification technique of FET model based on vector nonlinear measurements
  • 2011
  • In: Electronics Letters. - : Institution of Engineering and Technology (IET). - 1350-911X .- 0013-5194. ; 47:24, s. 1323-U37
  • Journal article (peer-reviewed)abstract
    • A new modelling approach which exploits only vector nonlinear measurements is described. The parameters of the I-V and Q-V nonlinear constitutive functions are identified by combining low-and high-frequency large-signal measurements with a numerical optimisation routine. Low-frequency dispersion manifesting in the I-V characteristics is also correctly accounted for. As a case study a gallium nitride HEMT on silicon carbide substrate is considered and very good agreement between measurements and simulation is achieved.
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  • Result 1-1 of 1
Type of publication
journal article (1)
Type of content
peer-reviewed (1)
Author/Editor
Avolio, G. (1)
Angelov, Iltcho, 194 ... (1)
Vannini, G (1)
Schreurs, D. (1)
Raffo, A. (1)
Crupi, G. (1)
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Nauwelaers, B. (1)
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University
Chalmers University of Technology (1)
Language
English (1)
Research subject (UKÄ/SCB)
Engineering and Technology (1)
Year
2011 (1)

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