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Träfflista för sökning "(hsv:(TEKNIK OCH TEKNOLOGIER) hsv:(Materialteknik)) srt2:(1970-1979) srt2:(1977)"

Sökning: (hsv:(TEKNIK OCH TEKNOLOGIER) hsv:(Materialteknik)) srt2:(1970-1979) > (1977)

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  • Easterling, K.E. (författare)
  • Metallurgical applications of scanning transmission electron microscopy
  • 1977
  • Ingår i: Journal of Materials Science. - 0022-2461 .- 1573-4803. ; 12:5, s. 857-868
  • Tidskriftsartikel (refereegranskat)abstract
    • It is shown that scanning transmission microscopy (STEM) has followed two main lines of development, the pure STEM based upon a field emission electron source in which the emphasis is given to high resolution, and a combined system in which STEM is an attachment to a conventional transmission microscope (TEM+STEM). When used in combination with an energy dispersive X-ray spectrometer, the combined TEM+STEM system is shown to be extremely versatile and possibly the more useful for the applied metallurgist. The high vacuum requirements of pure STEM, however, make this system suitable to be used in conjunction with an Auger spectrometer. Examples of the various microanalysis facilities of STEM are given in the article, including micro-diffraction, rocking-beam channelling patterns, qualitative and quantitative X-ray spectroscopy analysis, particle analysis, and in situ experimentation. The controversial subject of whether thicker specimens can be studied in STEM compared with conventional TEM is also discussed
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  • Easterling, K. E. (författare)
  • Recent developments in quantitative electron microscopy
  • 1977
  • Ingår i: International Metals Review. - : Informa UK Limited. - 0308-4590. ; 22:1, s. 1-24
  • Tidskriftsartikel (refereegranskat)abstract
    • Recent developments across the whole field of electron microscopy and associated equipment and techniques are reviewed with particular emphasis on quantitative measurements and analysis. The review is intended to cover a wide field embracing transmission, scanning, and scanning transmission microscopy as well as X-ray spectroscopy, on-line image analysis, and in situ experimentation, with the object of seeing how and to what effect quantitative electron microscopy is serving materials technology.
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