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- Galnander, B, et al.
(författare)
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Non-destructive chemical analysis of sandwich structures by means of soft X-ray emission
- 1999
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Ingår i: THIN SOLID FILMS. - : ELSEVIER SCIENCE SA. - 0040-6090. ; 344, s. 35-38
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Tidskriftsartikel (övrigt vetenskapligt/konstnärligt)abstract
- Soft X-ray emission spectroscopy provides information about elemental composition, including the light elements, as well as the chemical bonding. The probe depth reaches hundreds of nanometers but under certain conditions considerable surface sensitivity
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