| 1. |
- Bordag, Michael, et al.
(författare)
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Casimir force for a sphere in front of a plane beyond proximity force approximation
- 2008
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Ingår i: Journal of Physics A. - Bristol : Institute of Physics Publishing (IOPP). - 1751-8113 .- 1751-8121. ; 41:16, s. 164002-
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Tidskriftsartikel (refereegranskat)abstract
- For the configuration of a sphere in front of a plane, we calculate the first two terms of the asymptotic expansion for small separation of the Casimir force. We consider both Dirichlet and Neumann boundary conditions.
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| 2. |
- Conache, Gabriela, et al.
(författare)
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AFM-based manipulation of InAs nanowires
- 2008
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Ingår i: Proceedings of the IVC-17 (17th International Vacuum Congress) [also] ICSS-13 (13th International Conference on Surface Science) [also] ICN+T-2007 (International Conference on Nanoscience and Technology). - Bristol : Institute of Physics (IOP). ; 100, s. 052051-052051
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Konferensbidrag (refereegranskat)abstract
- A controlled method of manipulation of nanowires was found using the tip of an Atomic Force Microscope (AFM). Manipulation is done in the ‘Retrace Lift’ mode, where feedback is turned off for the reverse scan and the tip follows a nominal path. The effective manipulation force during the reverse scan can be changed by varying an offset in the height of the tip over the surface. Using this method, we have studied InAs nanowires on different substrates. We have also investigated interactions between wires and with gold features patterned onto the substrates.
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| 3. |
- Pettersson, Håkan, et al.
(författare)
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Friction measurements on InAs NWs by AFM manipulation
- 2008
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Konferensbidrag (refereegranskat)abstract
- We discuss a new approach to measure the friction force between elastically deformed nanowires and a surface. The wires are bent, using an AFM, into an equilibrium shape determined by elastic restoring forces within the wire and friction between the wire and the surface. From measurements of the radius of curvature of the bent wires, elasticity theory allows the friction force per unit length to be calculated. We have studied friction properties of InAs nanowires deposited on SiO2, silanized SiO2 and Si3N4 substrates. The wires were typically from 0.5 to a few microns long, with diameters varying between 20 and 80 nm. Manipulation is done in a `Retrace Lift' mode, where feedback is turned off for the reverse scan and the tip follows a nominal path. The effective manipulation force during the reverse scan can be changed by varying an offset in the height of the tip over the surface. We will report on interesting static- and sliding friction experiments with nanowires on the different substrates, including how the friction force per unit length varies with the diameter of the wires.
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