| 1. |
- Philipps, Jan M., et al.
(författare)
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Recharging behavior of nitrogen-centers in ZnO
- 2014
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Ingår i: Journal of Applied Physics. - : AIP Publishing. - 0021-8979 .- 1089-7550. ; 116:063701
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Tidskriftsartikel (refereegranskat)abstract
- Electron Paramagnetic Resonance was used to study N2-centers in ZnO, which show a 5-line spectrum described by the hyperfine interaction of two nitrogen nuclei (nuclear spin I = 1, 99.6% abundance). The recharging of this center exhibits two steps, a weak onset at about 1.4 eV and a strongly increasing signal for photon energies above 1.9 eV. The latter energy coincides with the recharging energy of NO centers (substitutional nitrogen atoms on oxygen sites). The results indicate that the N2-centers are deep level defects and therefore not suitable to cause significant hole-conductivity at room temperature.
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| 2. |
- Buyanova, M., et al.
(författare)
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Influence of secondary emission yield on the saturation properties of multipactor discharges between two parallel metal plates
- 2010
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Ingår i: Physics of Plasmas. - : AIP Publishing. - 1089-7674 .- 1070-664X. ; 17:4, s. 043504 -
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Tidskriftsartikel (refereegranskat)abstract
- A detailed numerical simulation analysis is made of the saturation stage of multipactor discharges between two infinite parallel metal plates in vacuum exposed to a rf voltage. The main physical effect causing saturation of the multipactor discharge is increased space charge, as the electron density becomes large. It is found that the properties of the saturation stage depend crucially on the value of the secondary emission yield of the metal surfaces. Below a certain threshold value, the discharge has a two-sided character, but at this threshold the discharge makes an abrupt transition into two decoupled single-sided multipactor discharges containing significantly increased electron densities. The result of the numerical simulations gives a good picture of the saturation properties of the multipactor discharge and is also supplemented by an approximate analytical investigation that highlights and explains the characteristic properties of the observed saturation behavior.
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| 3. |
- Chen, Shula
(författare)
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Excitonic Effects and Energy Upconversion in Bulk and Nanostructured ZnO
- 2014
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Doktorsavhandling (övrigt vetenskapligt/konstnärligt)abstract
- Zinc Oxide (ZnO), a II-VI wurtzite semiconductor, has been drawing enormous research interest for decades as an electronic material for numerous applications. It has a wide and direct band gap of 3.37eV and a large exciton binding energy of 60 meV that leads to intense free exciton (FX) emission at room temperature. As a result, ZnO is currently considered among the key materials for UV light emitting devices with tailored dimensionality and solid state white lighting. Full exploration of ZnO in various applications requires detailed knowledge of its fundamental and materialrelated properties, which remains incomplete. The research work summarized in this thesis addresses a selection of open issues on optical properties of ZnO based on (but not limited to) detailed time-resolved photoluminescence (PL) and magneto-optical studies of various excitonic transitions as specified below.Papers 1 and 2 analyze recombination dynamics of FX and donor bound excitons (DX) in bulk and tetrapod ZnO with the aim to evaluate contributions of radiative and nonradiative carrier recombination processes in the total carrier lifetime. We show that changes in relative contributions of these processes in “bulk” and near-surface areas are responsible for bi-exponential exciton decays typically observed in these materials. The radiative FX lifetime is found to be relatively long, i.e. >1 ns at 77 K and >14 ns at room temperature. In the case of DX, the radiative lifetime depends on exciton localization. Radiative recombination is concluded to dominate the exciton dynamics in “bulk regions” of high-quality materials. It leads to appearance of a slow component in the decays of no-phonon (NP) FX and DX lines, which also determines the dynamics of the longitudinal optical (LO) phonon-assisted and two-electronsatellite DX transitions. On the other hand, the fast component of the exciton decays is argued to be a result of surface recombination.Paper 3 evaluates exciton-phonon coupling in bulk and tetrapod ZnO. It is found that, in contrast to bulk ZnO, the NP FX emission in ZnO tetrapods is weak as compared with the LO phonon assisted transitions. We show that the observed high intensity of the FX-1LO emission does not reflect enhanced exciton-phonon coupling in nanostructured ZnO. Instead, it is a result of stronger suppression of the NP FX emission in faceted regions of the tetrapods as revealed from spatially resolved cathodoluminescence (CL) studies. This is attributed to enhanced re-absorption due to multiple internal reflections, which become especially pronounced in the vicinity of the FX resonance.Effects of exciton-photon coupling on light propagation through the ZnO media are studied in Papers 4 and 5. By employing the time-of-flight spectroscopy, in Paper 4 we demonstrate that the group velocity of laser pulses propagating through bulk ZnO can be slowed down to as low as 2044 km/s when photon energies approach the optical absorption edge of the material. The magnitude of this decrease can be manipulated by changing light polarization. In Paper 5 we show that the observed slow-down is caused by the formation of free exciton-polaritons and is determined by their dispersion. On the other hand, contributions of DX polaritons become important only in the proximity to their corresponding resonances.Excitonic effects can also be utilized to investigate fundamental properties and defect formation in ZnO. In Paper 6, we employ DX to study magneto-optical properties of the B valence band (B-VB) states as well as dynamics of inter-VB energy relaxation. We show that PL decays of the emissions involving the B-VB holes are faster than that of their counterparts involving the A-VB holes, which is interpreted as being due to energy relaxation of the holes assisted by acoustic phonons. Values of effective Landé g factors for the B-VB holes are also accurately determined. In paper 7, we uncover the origin of a new class of bound exciton lines detected within the nearband-edge region. Based on their magnetic behavior we show that these lines do not stem from DXs bound to either ionized or neutral donors but instead arise from an exciton bound to an isoelectronic center with a hole-attractive local potential.In Paper 8, DX emissions are used to monitor energy upconversion in bulk and nanorod ZnO. Based on excitation power dependent PL measurements performed with different energies of excitation photons, the physical processes responsible for the upconversion are assigned to two-photon-absorption (TPA) via virtual states and twostep TPA (TS-TPA) via real states. In the former case the observed threshold energy for the TPA process is larger than half of that for one-photon absorption across the bandgap, which can be explained by the different selection rules between the involved optical transitions. It is also concluded that the TS-TPA process occurs via a defect/impurity with an energy level lying within 1.14-1.56 eV from one of the band edges, likely a zinc vacancy.
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| 4. |
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| 5. |
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| 6. |
- Dagnelund, Daniel, et al.
(författare)
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Effect of postgrowth hydrogen treatment on defects in GaNP
- 2011
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Ingår i: APPLIED PHYSICS LETTERS. - : American Institute of Physics. - 0003-6951 .- 1077-3118. ; 98:14, s. 141920-
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Tidskriftsartikel (refereegranskat)abstract
- Effect of postgrowth hydrogen treatment on defects and their role in carrier recombination in GaNP alloys is examined by photoluminescence (PL) and optically detected magnetic resonance. We present direct experimental evidence for effective activation of several defects by low-energy subthreshold hydrogen treatment (andlt;= 100 eV H ions). Among them, two defect complexes are identified to contain a Ga interstitial. Possible mechanisms for the H-induced defect activation and creation are discussed. Carrier recombination via these defects is shown to efficiently compete with the near band-edge PL, explaining the observed degraded optical quality of the alloys after the H treatment.
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| 7. |
- Dagnelund, Daniel, et al.
(författare)
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Effect of thermal annealing on defects in post-growth hydrogenated GaNP
- 2013
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Ingår i: Physica Status Solidi. C, Current topics in solid state physics. - : John Wiley & Sons. - 1610-1634 .- 1610-1642. ; 10:4, s. 561-563
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Tidskriftsartikel (refereegranskat)abstract
- Effect of thermal annealing on paramagnetic centers in post-growth hydrogenated GaN0.0081P0.9919 epilayer is examined by means of photoluminescence and optically detected magnetic resonance (ODMR) techniques. In recent studies, several Ga-interstitial (Gai) related centers were found to be activated by the presence of hydrogen in the hydrogenated GaNP alloys. These centers compete with near-band edge radiative recombination. Annealing at 400 ºC in Ar-ambient is found to cause quenching of the Gai-related ODMR signals that were activated by post-growth hydrogenation. We tentatively ascribe this effect to dissociation of the H-Gai complexes and subsequent out-diffusion of H.
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| 8. |
- Dagnelund, Daniel, et al.
(författare)
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Effects of hydrogenation on non-radiative defects in GaNP and GaNAs alloys: An optically detected magnetic resonance study
- 2012
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Ingår i: Journal of Applied Physics. - : American Institute of Physics (AIP). - 0021-8979 .- 1089-7550. ; 111:023501
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Tidskriftsartikel (refereegranskat)abstract
- Photoluminescence and optically detected magnetic resonance techniques are utilized to study defect properties of GaNP and GaNAs alloys subjected to post-growth hydrogenation by low-energy sub-threshold ion beam irradiation. It is found that in GaNP H incorporation leads to activation of new defects, which has a Ga interstitial (Ga-i) atom at its core and may also involve a H atom as a partner. The observed activation critically depends on the presence of N in the alloy, as it does not occur in GaP with a low level of N doping. In sharp contrast, in GaNAs hydrogen is found to efficiently passivate Ga-i-related defects present in the as-grown material. A possible mechanism responsible for the observed difference in the H behavior in GaNP and GaNAs is discussed.
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| 9. |
- Dagnelund, Daniel, 1980-, et al.
(författare)
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Evidence for a phosphorus-related interfacial defect complex at a GaP/GaNP heterojunction
- 2010
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Ingår i: Physical Review B. Condensed Matter and Materials Physics. - : The American Physical Society. - 1098-0121 .- 1550-235X. ; 81, s. 115334-
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Tidskriftsartikel (refereegranskat)abstract
- Optically detected magnetic resonance (ODMR) studies of molecular beam epitaxial GaNP/GaP structures reveal presence of a P-related complex defect, evident from its resolved hyperfine interaction between an unpaired electronic spin (S=1/2) and a nuclear spin (I = ½) of a 31P atom. The principal axis of the defect is concluded to be along a <111> crystallographic direction from angular dependence of the ODMR spectrum, restricting the P atom (either a PGa antisite or a Pi interstitial) and its partner in the complex defect to be oriented along this direction. The principal values of the electronic g-tensor and hyperfine interaction tensor are determined as: g┴=2.013, g║=2.002, and A┴=130´10-4 cm-1, A║=330´10-4 cm-1, respectively. The interface nature of the defect is clearly manifested by the absence of the ODMR lines originating from two out of four equivalent <111> orientations. Defect formation is shown to be facilitated by nitrogen ion bombardment under non-equilibrium growth conditions and the defect is thermally stable upon post-growth thermal annealing.
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| 10. |
- Dagnelund, Daniel, et al.
(författare)
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Identification of an isolated arsenic antisite defect in GaAsBi
- 2014
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Ingår i: Applied Physics Letters. - : American Institute of Physics (AIP). - 0003-6951 .- 1077-3118. ; 104:5, s. 052110-
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Tidskriftsartikel (refereegranskat)abstract
- Optically detected magnetic resonance and photoluminescence spectroscopy are employed to study grown-in defects in GaAs0.985Bi0.015 epilayers grown by molecular beam epitaxy. The dominant paramagnetic defect is identified as an isolated arsenic antisite, As-Ga, with an electron g-factor of 2.03 +/- 0.01 and an isotropic hyperfine interaction constant A (900 +/- 620) x 10(-4) cm(-1). The defect is found to be preferably incorporated during the growth at the lowest growth temperature of 270 degrees C, but its formation can be suppressed upon increasing growth temperature to 315 degrees C. The As-Ga concentration is also reduced after post-growth rapid thermal annealing at 600 degrees C.
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