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Träfflista för sökning "WFRF:(Daniel J. G.) srt2:(1975-1999)"

Sökning: WFRF:(Daniel J. G.) > (1975-1999)

  • Resultat 1-5 av 5
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1.
  • Köhler, Th., et al. (författare)
  • Precision measurement of strong interaction isotope effects in antiprotonic 16O, 17O, and 18O atoms
  • 1986
  • Ingår i: Physics Letters B. - : Elsevier BV. - 0370-2693 .- 1873-2445. ; 176:3-4, s. 327-333
  • Tidskriftsartikel (refereegranskat)abstract
    • The strong-interaction effects in antiprotonic 16O, 17O, and 18O atoms were measured at the CERN antiproton facility, LEAR. The shifts ε{lunate} and the widths Γ of the 3d level were determined to be -112±20 eV (16O), -140±46 eV (17O), -195±20 eV (18O), and 495±45 eV (16O), 540±150 (17O), 640±40 eV (18O), respectively. © 1986.
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2.
  • Bremer, Kåre, et al. (författare)
  • An ordinal classification for the families of flowering plants
  • 1998
  • Ingår i: ANNALS OF THE MISSOURI BOTANICAL GARDEN. - : MISSOURI BOTANICAL GARDEN. - 0026-6493. ; 85:4, s. 531-553
  • Tidskriftsartikel (övrigt vetenskapligt/konstnärligt)abstract
    • Recent cladistic analyses are revealing the phylogeny of flowering plants in increasing detail, and there is support for the monophyly of many major groups above the family level. With many elements of the major branching sequence of phylogeny established
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4.
  • Rönnow, Daniel, et al. (författare)
  • Surface roughness of oxidised copper films studied by atomic force microscopy and spectroscopic light scattering
  • 1998
  • Ingår i: Thin Solid Films. - 0040-6090 .- 1879-2731. ; 325:1-2, s. 92-98
  • Tidskriftsartikel (refereegranskat)abstract
    • The interface roughness of Cu2O films produced by thermal oxidation of Cu was studied by spectroscopic elastic light scattering and atomic force microscopy. No correlation could be found between the roughness of the two interfaces, although the amplitude and the length scale of the roughness changed in the same way with film thickness for both interfaces. Both interfaces were found to have a fractal dimension of two. A first order perturbation theory was used to analyse the light scattering data; theory and experiment are in good agreement within the limits of the theory.
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5.
  • Rönnow, Daniel, et al. (författare)
  • Surface Roughness of Sputtered ZrO2 Films Studied by Atomic Force Microscopy and Spectroscopic Light Scattering
  • 1996
  • Ingår i: Physical Review E. Statistical, Nonlinear, and Soft Matter Physics. - 1063-651X .- 1095-3787. ; 54:4 Suppl. B, s. 4021-4026
  • Tidskriftsartikel (refereegranskat)abstract
    • ZrO2 films were prepared by reactive sputtering. Elastic light scattering was used to determine the cross correlation of the substrate and film interface roughness. Surface profiles were measured with atomic-force microscopy. The power spectral density functions could be fitted by the K-correlation model, suggesting self-affine fractal surfaces. The roughness of the film front surfaces was of the same order of magnitude as the substrate roughness. We have derived a replication factor from experimental data that gives information on the evolution of the contribution of the substrate roughness.
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  • Resultat 1-5 av 5

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