| 2. |
- Sales, Claudomiro, et al.
(författare)
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Line Topology Identification Using Multiobjective Evolutionary Computation
- 2010
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Ingår i: IEEE Transactions on Instrumentation and Measurement. - 0018-9456. ; 59:3, s. 715-729
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Tidskriftsartikel (refereegranskat)abstract
- The broadband capacity of the twisted-pair lines strongly varies within the copper access network. It is therefore important to assess the ability of a digital subscriber line (DSL) to support the DSL services prior to deployment. This task is handled by the line qualification procedures, where the identification of the line topology is an important part. This paper presents a new method, denoted topology identification via model-based evolutionary computation (TIMEC), for line topology identification, where either one-port measurements or both one-and two-port measurements are utilized. The measurements are input to a model-based multiobjective criterion that is minimized by a genetic algorithm to provide an estimate of the line topology. The inherent flexibility of TIMEC enables the incorporation of a priori information, e. g., the total line length. The performance of TIMEC is evaluated by computer simulations with varying degrees of information. Comparison with a state-of-art method indicates that TIMEC achieves better results for all the tested lines when only one-port measurements are used. The results are improved when employing both one-and two-port measurements. If a rough estimate of the total length is also used, near-perfect estimation is obtained for all the tested lines.
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| 3. |
- Svensson, Stefan, 1985-, et al.
(författare)
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ESEM as a Tool for Studying High Temperature Electronics
- 2011
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Ingår i: IMAPS High Temperature Electronics Network (HiTEN 2011), July 18-20, 2011 ,Oxford, UK.
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Konferensbidrag (refereegranskat)abstract
- Researchers studying materials and processes at high temperatures are often restricted to do evaluation afterwards and at room temperature using e.g. scanning electron microscopy (SEM). Limited by high vacuum, outgassing and non-conducting samples are difficult to study with SEM. For such samples, environmental scanning electron microscope (ESEM) is an alternative that is particularly suited also for high temperature in-situ studies. The electron detector in the ESEM make use of otherwise unwanted scattering of electrons as an amplifier of the signal, and by using differential pumping, it is possible to introduce several mbar of either oxygen, water vapor, or a gas of choice into the sample chamber while still maintaining the high-vacuum in the electron column. The auxiliary gas neutralizes surface charges built up by the electron beam, which makes it possible to image non-conductive and outgassing samples, thus making it possible to study e.g. polymeric and high temperature materials. Our ESEM, FEI XL30, have a heating stage making it possible to reach temperatures up to 1500°C. Equipped with electrical feed- throughs, the instrument can be used to study high temperature phenomena on electrically activated components.ESEM is an instrument that has found its use for biological and organic samples. However, less work has been done using it for high temperature processes. Here, we show real-time imaging of the sintering of dielectric and Ag thick-film prints on AlN substrates. The use of the electrical feed-throughs to activate electrical components and study them at high temperatures is also demonstrated. ESEM is a versatile tool for high temperature studies and in-situ analysis of electrical components, solder processes and different die-attach materials.
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