PerFail 2024 : Third International Workshop on Negative Results in Pervasive Computing - Welcome and Committees

Peltonen, Ella (editor)

University of Oulu, Finland

Mohan, Nitinder (editor)

Technical University of Munich, Germany

Zdankin, Peter (editor)

University of Duisburg-Essen, Germany

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Josten, Malte (editor)

University of Duisburg-Essen, Germany

Shreedar, Tanya (editor)

University of Edinburgh, United Kingdom

Shreedhar, Tanya (editor)

University of Edinburgh, United Kingdom

Bayhan, Suzan (editor)

University of Twente, Netherlands

Berrocal, Javier (editor)

University of Extremadura, Spain

Chakraborty, Sandip (editor)

Indian Institute of Technology Kharagpur, India

Crowcroft, Jon (editor)

University of Cambridge, United Kingdom

Ding, Aaron Yi (editor)

TU Delft, University of Helsinki, Netherlands; University of Bamberg, Germany

Ferlin, Simone (editor)

Karlstads universitet,Institutionen för matematik och datavetenskap (from 2013),Red Hat, Sweden; Technische Universität München, Germany

Gasser, Oliver (editor)

University of Duisburg-Essen, Germany; Max Planck Institute for Informatics, Germany

Holz, Ralph G. (editor)

University of Twente, Netherlands; University of Münster, Germany; Aalto University, Finland

Kangasharju, Jussi (editor)

University of Helsinki, Finland; NEC Laboratories Europe, Germany

Kolcun, Roman (editor)

University of Cambridge, United Kingdom

Nicklas, Daniela (editor)

TU Delft, University of Helsinki, Netherlands; University of Bamberg, Germany

Ott, Jörg (editor)

Karlstads universitet,Red Hat, Sweden; Technische Universität München, Germany

Schiele, Gregor (editor)

University of Duisburg-Essen, Germany; Max Planck Institute for Informatics, Germany

Sigg, Stephan (editor)

University of Münster, Germany; Aalto University, Finland

Solmaz, Gürkan (editor)

University of Helsinki, Finland; NEC Laboratories Europe, Germany

Eleni, Eirini (editor)

Tsiropoulou University of New Mexico, United States

Weis, Torben (editor)

Universität Duisburg-Essen, Germany

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 (creator_code:org_t)

ISBN 9798350304367

IEEE, 2024

English.

Related links:

https://urn.kb.se/re...

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https://doi.org/10.1...

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• Editorial proceedings (peer-reviewed)