A method for measuring exchange stiffness in ferromagnetic films

• An exchange stiffness, A(ex), in ferromagnetic films is obtained by fitting the M(H) dependence of two ferromagnetic layers antiferromagnetically coupled across a nonmagnetic spacer layer with a simple micromagnetic model. In epitaxial and textured structures this method allows measuring A(ex) between the crystallographic planes perpendicular to the growth direction of ferromagnetic films. Our results show that A(ex) between [0001] planes in textured Co grains is 1.54 +/- 0.12 x 10(-11) J/m.

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