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Träfflista för sökning "WFRF:(Ivanova O) srt2:(2005-2009)"

Sökning: WFRF:(Ivanova O) > (2005-2009)

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1.
  • Avdeev, S. V., et al. (författare)
  • Preliminary results of studying the effect of heavy charged particles on the human central nervous system in experiments SilEye and Alteino
  • 2005
  • Ingår i: Bulletin of the Russian Academy of Sciences: Physics. - 1062-8738. ; 69:3, s. 512-514
  • Tidskriftsartikel (refereegranskat)abstract
    • A series of experiments were carried out in the period 1995 to 2002 to study the phenomenon of light flashes (LFs) which arose in the eyes of astronauts. These experiments were made onboard the Mir orbital station (SilEye, SilEye-2) and on the Russian segment of the International Space Station (SilEye-3/Alteino). As a result of investigation it is reliably demonstrated that the majority of light flashes under conditions of a space flight are caused by nuclei of cosmic rays. Electric signals from brain, recorded during LF occurrence, were an important final result of these studies.
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  • Rangelow, I. W., et al. (författare)
  • Piezoresistive and self-actuated 128-cantilever arrays for nanotechnology applications
  • 2007
  • Ingår i: Microelectronic Engineering. - : Elsevier BV. - 0167-9317 .- 1873-5568. ; 84:5-8, s. 1260-1264
  • Tidskriftsartikel (refereegranskat)abstract
    • A major limitation for future nanotechnology, particularly for bottom-up manufacturing is the non-availability of 2-dimensional massively parallel probe arrays. Scanning proximity probes are uniquely powerful tools for analysis, manipulation and bottom-up synthesis: they are capable of addressing and engineering surfaces at the atomic level and are the key to unlocking the full potential of Nanotechnology. Generic massively parallel intelligent cantilever-probe platforms is demonstrated through a number of existing and ground-breaking techniques. A packaged VLSI NEMS-chip (Very Large Scale Integrated Nano Electro Mechanical System) incorporating 128 proximal probes, fully addressable with control and readout interconnects and advanced software will be presented.
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