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Träfflista för sökning "WFRF:(Kuznetsov P.) srt2:(1996-1999)"

Sökning: WFRF:(Kuznetsov P.) > (1996-1999)

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1.
  • Calén, H., et al. (författare)
  • Detector setup for a storage ring with an internal target
  • 1996
  • Ingår i: Nuclear Instruments and Methods in Physics Research Section A. - : Elsevier BV. - 0168-9002 .- 1872-9576. ; 379:1, s. 57-75
  • Tidskriftsartikel (refereegranskat)abstract
    • A detector setup for the cooler storage ring CELSIUS is described. The setup detects particles produced in interactions between the internal beam and a cluster-jet target. Particles emitted in the forward direction are measured by means of arrays of plastic scintillators and proportional counters. Particles, particularly photons, emitted more isotropically are measured by means of two calorimeters containing CsI(Na) crystals. The performance of the setup is given for neutral meson production in proton-proton and proton-deuteron interactions in the energy range 290-1360 MeV.
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2.
  • Morvan, E, et al. (författare)
  • Channeling implantations of Al+ into 6H silicon carbide
  • 1999
  • Ingår i: Applied Physics Letters. - : AIP Publishing. - 0003-6951 .- 1077-3118. ; 74, s. 3990-3992
  • Tidskriftsartikel (refereegranskat)abstract
    • A strong channeling effect of Al+ ions implanted into crystalline SiC has been observed by Monte Carlo simulations and experiments especially designed to demonstrate this phenomenon have been performed. Depth distributions of implanted Al were measured for on- and controlled off-axis Al implantations using secondary ion mass spectrometry (SIMS). Much deeper and wider profiles are obtained for the on-axis implantations as compared to off-axis implants. For higher doses, the experiment also reveals the growth of an intermediate peak slightly deeper than the random peak. The origin of the intermediate peak can be understood by combining SIMS results with Monte Carlo simulations, which motivates the development of advanced simulation tools for the ion implantation process in SiC. (C) 1999 American Institute of Physics. [S0003-6951(99)01426-6].
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