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- Kvashnina, K.O., et al.
(författare)
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Electronic structure of complex copper systems probed by resonant inelastic X-ray scattering at Cu L3 edge
- 2009
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Ingår i: Physica. B, Condensed matter. - : Elsevier B.V.. - 0921-4526 .- 1873-2135. ; 404:20, s. 3559-3566
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Tidskriftsartikel (refereegranskat)abstract
- We have used X-ray absorption (XA) and resonant inelastic X-ray scattering (RIXS) spectroscopies to study a series of copper compounds, namely Cu2O, CuO, Cu(OH)2, CuCl2, Cu2S, CuSO4, malachite (Cu2(CO3)2(OH)2) and atacamite (CuCl2·3Cu(OH)2). Cu 2p XA spectra provide information about oxidation states. Divalent copper gives a single narrow line due to excitations into the empty 3d state, whereas monovalent copper gives a broad band at higher energy due to transitions to 4s states. Chemical shifts of the main line in the Cu2+ XA spectra of different compounds are observed but in some cases they are too small to make a clear distinction between the species. It is shown that RIXS at the Cu 2p edge has a great potential to distinguish between the species due to large differences in spectral shapes for the same energy of the incident photon beam. First evidence for the possibility of detecting chemical composition of copper compounds is presented and discussed in details.
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| 2. |
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| 3. |
- Modin, A., et al.
(författare)
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Electronic structure of Cu3N films studied by soft x-ray spectroscopy
- 2008
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Ingår i: Journal of Physics. - : IOP Publishing. - 0953-8984 .- 1361-648X. ; 20:23
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Tidskriftsartikel (refereegranskat)abstract
- Soft x- ray emission spectroscopy was used to characterize the electronic structure of seven copper nitride films, one synthesized with atomic layer deposition ( ALD) and six grown with chemical vapor deposition ( CVD) at different preparation temperatures. Interpretation of the x- ray emission spectra was supported by calculations of the electronic structure for bulk pure Cu3N and Cu3N with: an excess of Cu atoms, oxygen or carbon impurities, and N vacancies. The calculations are shown to describe the experimental spectra quite well. Analysis of the x- ray spectra suggests that films grown in copper rich environments and above a cut- off temperature of approximately 360 degrees C have a growing fraction of copper enriched areas, while films prepared below this temperature do not have these areas with excess copper.
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