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- Wei, Liu-Ying, et al.
(författare)
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Solidification behaviour and phase constituents of cast Mg-Zn-misch metal alloys
- 1997
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Ingår i: Journal of Materials Science. - 0022-2461 .- 1573-4803. ; 32:12, s. 3335-3340
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Tidskriftsartikel (refereegranskat)abstract
- The solidification path and phase constituents of alloys in the magnesium-rich corner of the Mg-Zn-misch metal (MM) pseudo-ternary system have been investigated by a combination of differential thermal analysis, analytical electron microscopy and X-ray diffraction. The solidification behaviour diagram for this system was found to be dominated by a large two-phase ( -Mg plus T-phase) field in which the lowest eutectic temperature was 500°C. T-phase has a c-centred orthorhombic crystal structure and exhibits a wide range of stoichiometry. The interdendritic eutectic phase in the pseudo-binary Mg-MM system is Mg12MM which has the same b c t structure as Mg12Ce. The eutectic temperature here is 593°C.
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- Wei, Liu-Ying, et al.
(författare)
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Ultramicrotomy of powder material for TEM/STEM study
- 1997
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Ingår i: Microscopy research and technique (Print). - 1059-910X .- 1097-0029. ; 36:5, s. 380-381
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Tidskriftsartikel (refereegranskat)abstract
- This paper summarizes methods conventionally used to prepare thin foil samples of powder materials for transmission electron microscopy (TEM) and introduces another variant, ultramicrotomy, for the preparation of TEM samples of industrial dust powder. The choice of ultramicrotoming in the present work was based on two features of this technique: (1) it can produce thin-sectioned specimens with a uniform thickness; (2) it can retain the original elemental distribution in phases of the sample during sectioning. Dust powder preparation and the sectioning procedure are described in this paper. The results of the method are illustrated by examples of TEM/STEM micrographs of industrial dust.
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- Westman, Anna-Karin, et al.
(författare)
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Preparation for TEM of layered samples with fragile microstructure and weak layer interface
- 1999
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Ingår i: Microscopy research and technique (Print). - 1059-910X .- 1097-0029. ; 45:3, s. 198-202
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Tidskriftsartikel (refereegranskat)abstract
- The objective of this work was to prepare for transmission electron microscopy (TEM) a layered structure of materials with fragile microstructure. The samples consisted of two layers of different materials, silicon nitride and borosilicate glass, loosely bonded together. The low strength of the sample resulted in fragmentation during more conventional preparation. However, it was possible to prepare the fragments by mounting them in a titanium specimen carrier with aluminium strips as support. After grinding and polishing, a technique of low-angle ion milling was used to obtain electron beam transparent areas at the nitride/glass interface.
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