| 1. |
- Miljkovic, Vladimir, 1982, et al.
(författare)
-
Simulating light scattering from supported plasmonic nanowires
- 2012
-
Ingår i: Optics Express. - : Optical Society of America. - 1094-4087 .- 1094-4087. ; 20:10, s. 10816-10826
-
Tidskriftsartikel (refereegranskat)abstract
- We present a method for calculating the differential scattering cross sections from nanostructures close to an interface separating two semi-infinitive dielectric media. The method combines a fast finite element software (Comsol multiphysics), used for calculations of the fields around and inside the structure, and the Green's functions method, which is used to find the far field distribution from the calculated total fields inside the nanostructure. We apply the method to calculations of scattering spectra from silver nanowires supported by an air-glass interface, a system that is of high current interest in relation to various nanophotonics applications. The results are analyzed in relation to analytical models and compared to experimentally measured spectra, to which we find a good agreement.
|
|
| 2. |
- Schwind, Markus, 1983, et al.
(författare)
-
Diffraction from Arrays of Plasmonic Nanoparticles with Short-Range Lateral Order
- 2012
-
Ingår i: ACS Nano. - : American Chemical Society (ACS). - 1936-086X .- 1936-0851. ; 6:11, s. 9455-9465
-
Tidskriftsartikel (refereegranskat)abstract
- We have measured the angular distribution of light scattered off 2D plasmonic Al nanoparticle ensembles. We created.. these samples with disk-like nanoparticles, 175 and 500 nm in diameter, respectively, using hole-mask colloidal lithography and electron beam lithography. The nanoparticle arrangements In the samples display the Short-range order (but no long-range order) characteristic for an ensemble formed by random sequential adsorption. As a consequence of this, the ensemble scattering patterns can be quantitatively well described by combining the single-particle scattering pattern with a static structure factor that carries information about the diffraction effects caused by the short-range order of the ensemble. We also performed sensing experiments in which we monitored changes in the angle-resolved scattering intensity for a fixed wavelength as a function of the thickness of an ultrathin SiO2 coating covering the Al nanoparticles. The data show that the angle and strength of the main diffraction peak vary linearly, with SiO2 coating thickness In the range 1.5-4.5 nm and suggest that measurements of the scattering profile could be a competitive alternative to traditional transmission measurements in terms of sensitivity.
|
|
