| 1. |
- Garte, S, et al.
(författare)
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Metabolic gene polymorphism frequencies in control populations
- 2001
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Ingår i: Cancer epidemiology, biomarkers & prevention : a publication of the American Association for Cancer Research, cosponsored by the American Society of Preventive Oncology. - 1055-9965. ; 10:12, s. 1239-1248
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Tidskriftsartikel (refereegranskat)
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| 2. |
- Ohya, K., et al.
(författare)
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Modeling of erosion and deposition patterns on C-W and W-Ta twin limiters exposed to the TEXTOR edge plasmas
- 2004
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Ingår i: Journal of Nuclear Materials. - : Elsevier BV. - 0022-3115 .- 1873-4820. ; 329-33, s. 732-736
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Tidskriftsartikel (refereegranskat)abstract
- The erosion and deposition patterns on tungsten and tantalum test limiters exposed to the TEXTOR deuterium plasma containing a small amount of C impurity are simulated with the modified EDDY code. At the very top of the W and Ta limiters, there occurs neither erosion nor deposition, but the erosion proceeds slowly along the surface. When approaching the edge, the surface is covered by a thick C layer, which shows a very sharp boundary similar to the observation in surface measurements. In the erosion zone, the re-deposited carbon forms a W (Ta)-C mixed layer with small C concentration. Assumptions for chemical erosion yields of similar to0.01 for W and
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| 3. |
- Ohya, K., et al.
(författare)
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Simulation calculations of mutual contamination between tungsten and carbon and its impact on plasma surface interactions
- 2001
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Ingår i: Journal of Nuclear Materials. - 0022-3115 .- 1873-4820. ; 290, s. 303-307
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Tidskriftsartikel (refereegranskat)abstract
- Mutual contamination between C and W, resulting from the simultaneous use of these materials as plasma facing components, is simulated by means of a computer simulation code, Erosion and Deposition based on Dynamic model (EDDY). W deposition on C rapidly increases the reflection coefficient for D and C impurity. In comparison between the calculation and a C-W twin test limiter experiment in TEXTOR-94, C release from the C side of the limiter is dominated by reflection of C impurity from the W deposits, in addition to physical sputtering of C; chemical erosion is strongly suppressed. Due to the dynamic effect which makes C-W mixed layer, C deposition on W gradually changes the reflection coefficient and sputter yields. Formation of a sharp boundary between erosion and C deposition zones on the W side of the limiter is well reproduced by simulation. Local redeposition patterns of C and W on the limiter surface are also calculated.
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| 4. |
- Ohya, K., et al.
(författare)
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Simulation study of carbon and tungsten deposition on W/C twin test limiter in TEXTOR-94
- 2000
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Ingår i: Journal of Nuclear Materials. - 0022-3115 .- 1873-4820. ; 283, s. 1182-1186
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Tidskriftsartikel (refereegranskat)abstract
- In order to investigate the impurity release and surface modification on a W/C twin test limiter, made of a half of W and the other half of C, exposed to the edge plasma of TEXTOR-94, simulation calculations of ion-surface interaction are conducted by a Monte Carlo code. According to the calculations, experimentally observed spatial distributions of WI and CII line intensities around the W side of the limiter can be explained by physical sputtering of W, reflection of bombarding C ions and physical sputtering of implanted C. The CII line emission, resulting from thermal C atoms, around the C side of the limiter is suppressed by deposition of W, and the reflection of C ions from W deposited on C causes the CII intensity to decay more slowly than that from C without the deposition. Bombardment with deuterium edge plasmas, containing impurity W, produces a thick W layer on the C side of the limiter, whereas C implanted in the W side is strongly sputtered due to impact of most constituent D ions.
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| 5. |
- Pospieszczyk, A., et al.
(författare)
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Operation of TEXTOR-94 with tungsten poloidal main limiters
- 2001
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Ingår i: Journal of Nuclear Materials. - 0022-3115 .- 1873-4820. ; 290, s. 947-952
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Tidskriftsartikel (refereegranskat)abstract
- In TEXTOR-93, experiments have been performed with the upper and lower poloidal limiter blocks made of vapour sprayed (VSP) tungsten (about 0.5 mm) deposited on graphite with a rhenium interlayer. A series of discharge conditions have been performed (density scan, scan of the auxiliary heating power, radius scan). There has been found no restriction for operation at any density with auxiliary heating. For Ohmic conditions the same density with testlimiters could be reached. Under siliconized conditions no severe accumulation of tungsten in the plasma centre could be detected. The blocks could in general stand surface temperatures below 1700 K. Most of them survived also temperatures above 3000 K without exfoliation. However, some blocks showed severe damage by melting or exfoliation probably due to insufficient contact of the tungsten layer with the graphite.
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| 6. |
- Takahashi, M., et al.
(författare)
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Oxygen annealing effect of photoelectron spectra in SrBi2Ta2O9 film
- 2002
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Ingår i: Japanese Journal of Applied Physics. - 0021-4922 .- 1347-4065. ; 41:11B, s. 6797-6802
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Tidskriftsartikel (refereegranskat)abstract
- Photoelectron spectra have been studied to clarify O-2-annealing effects on the band diagram of the metal-SrBi2Ta2O9 (SBT) junction and ionization energy of SBT films deposited by the pulsed laser, deposition (PLD) method. Photoemission spectra obtained by ultraviolet light irradiation have a threshold of 5.90 eV for the as-deposited SBT film and 5.56 eV for the O-2-annealed one. This shift of the threshold indicates that the annealing treatment has increased the Fermi level by 0.34 eV. On the assumption of a 4.2 eV band gap and 3.5 eV electron affinity for the SBT, as-deposited SBT has been estimated to give a 0.60 eV lower barrier height for holes than that for electrons, which is possibly because of, insufficiently oxidized (Bi2O2)(2+) layers as indicated by X-ray photoelectron spectroscopy (XPS). After annealing in O-2, however, barrier height energies for holes and electrons become closer to each other. These results agree with our previous studies which have reported that the O-2-annealing suppressed the leakage current through SBT and improved the retention characteristics of the metal-ferroelectric-insulator-semiconductor structure.
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| 7. |
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