| 1. |
- Andersen, Jesper N., et al.
(författare)
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Core level binding energy shifts in interfaces between 4d and alkali metals
- 1995
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Ingår i: Journal of Electron Spectroscopy and Related Phenomena. - : Elsevier BV. - 0368-2048. ; 75:C, s. 225-232
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Tidskriftsartikel (refereegranskat)abstract
- High resolution core level photoemission measurements are reported of the binding energy shifts of the 3d core level of Mo, Rh and Pd atoms in interfaces between these 4d metals and alkali metals. The core level binding energies of the interface 4d atoms are found to be almost equal to those of the clean surface atoms for Mo and Rh. For Pd a large alkali induced shift towards higher binding energy is found. The implications of these results for the information derivable from core level binding energy shifts in metallic interfaces are discussed and it is demonstrated that the present results are explained by established total energy based models for core level binding energy shifts in metallic systems.
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| 2. |
- Mancini, Derrick C., et al.
(författare)
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Design of a compact varied-line space grating monochromator for enhanced flux at MAXLAB
- 1995
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Ingår i: Review of Scientific Instruments. - : AIP Publishing. - 0034-6748 .- 1089-7623. ; 66:2, s. 2157-2159
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Tidskriftsartikel (refereegranskat)abstract
- For soft x-ray fluorescence spectroscopy with selective energy excitation, it is desirable to have maximum flux at moderate resolution. A plane grating monochromator with varied line spacing can be used in the convergent beam of an ellipsoidal focusing mirror to provide moderate resolution with a large collection angle and minimum number of reflecting surfaces. We determine the design parameters for a varied-line-space grating monochromator to provide light in the 200-1000 eV range. The results of modeling are discussed with respect to the optimal choices of monochromator for our experimental requirements. A novel mechanical design is proposed for constructing the monochromator in a compact form with the minimum number of moving parts and alignments.
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| 3. |
- Schäfers, Franz, et al.
(författare)
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Soft-x-ray polarimeter with multilayer optics : Complete analysis of the polarization state of light
- 1999
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Ingår i: Applied Optics. - 1559-128X. ; 38:19, s. 4074-4088
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Tidskriftsartikel (refereegranskat)abstract
- The design of a versatile high-precision eight-axis ultrahigh-vacuum-compatible polarimeter is presented. This multipurpose instrument can be used as a self-calibrating polarization detector for linearly and circularly polarized UV and soft-x-ray light. It can also be used for the characterization of reflection or transmission properties (reflectometer) or polarizing and phase-retarding properties (ellipsometer) of any optical element. The polarization properties of Mo/Si, Cr/C, Cr/Sc, and Ni/Ti multilayers used in this polarimeter as polarizers in transmission and as analyzers in reflection have been investigated theoretically and experimentally. In the soft-x-ray range, close to the 2p edges of Sc, Ti, and Cr, resonantly enhanced phase retardation of the transmission polarizers of as much as 18° has been measured. With these newly developed optical elements the complete polarization analysis of soft-x-ray synchrotron radiation can be extended to the water-window range from 300 to 600 eV.
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| 4. |
- Söderholm, S, et al.
(författare)
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A photoemission spectroscopy and X-ray absorption study of Bi(2)Sr(2)CaCu(2)O(8) single crystal with adsorbed Cs: On the origin of states affected by electron doping and evidence for spatially resolved electron doping
- 1996
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Ingår i: Journal of Physics: Condensed Matter. - : IOP Publishing. - 1361-648X .- 0953-8984. ; 8, s. 1307-1320
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Tidskriftsartikel (refereegranskat)abstract
- The influence of electron doping, via deposition of small amounts of Cs, on the electronic structure of has been studied by high-resolution photoelectron spectroscopy (PES) and x-ray absorption spectroscopy (XAS), utilizing synchrotron radiation. The changes in the electronic structure were monitored by PES of the valence band and of the O 1s, Bi 4f, Bi 5d, Ca 2p and Sr 3d core levels, and by XAS at the O 1s, Cu 2p and Ca 2p edges. The experimental data suggest that the loss of the Fermi edge and the loss of spectral intensity down to about 2 eV below the Fermi level, and the substantial loss of spectral intensity of the pre-edge structure in the O 1s XAS spectrum are mainly due to annihilation of states with O 2p character in the Cu - O layer. It is evident from bulk- and surface-sensitive XAS spectra that the electron doping by Cs affects the electronic structure more strongly close to the surface. This implies that the doping occurs locally and that the charge transfer between the different layers in the unit cell is not uniform. Thus it seems possible to alter the electronic properties of locally through spatially resolved electron doping. When larger amounts of Cs are deposited, a chemical reaction occurs which causes a disruption of the Bi - O layer. This deposition regime is characterized by the presence of caesium oxide and reduced (metallic) Bi.
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