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Träfflista för sökning "WFRF:(Pallon J.) srt2:(2015-2019)"

Sökning: WFRF:(Pallon J.) > (2015-2019)

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1.
  • de la Rosa, Nathaly, et al. (författare)
  • Quantification of lithium at ppm level in geological samples using nuclear reaction analysis
  • 2018
  • Ingår i: Journal of Radioanalytical and Nuclear Chemistry. - : Springer Science and Business Media LLC. - 0236-5731 .- 1588-2780. ; 317:1, s. 253-259
  • Tidskriftsartikel (refereegranskat)abstract
    • Proton-induced reaction (p,α) is one type of nuclear reaction analysis (NRA) suitable especially for light element quantification. In the case of lithium quantification presented in this work, accelerated protons with an energy about of 850 keV were used to induce the 7Li(p,α)4He reaction in standard reference and geological samples such as tourmaline and other Li-minerals. It is shown that this technique for lithium quantification allowed for measurement of concentrations down below one ppm. The possibility to relate the lithium content with the boron content in a single analysis was also demonstrated using tourmaline samples, both in absolute concentration and in lateral distribution. In addition, Particle induced X-ray emission (PIXE) was utilized as a complementary IBA technique for simultaneous mapping of elements heavier than sodium.
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2.
  • Pallon, Jan, et al. (författare)
  • A new quantitative X-ray system for micro-PIXE analysis
  • 2017
  • Ingår i: X-Ray Spectrometry. - : Wiley. - 0049-8246. ; 46:5, s. 319-324
  • Tidskriftsartikel (refereegranskat)abstract
    • Particle Induced X-ray Emission is a well-established technique for quantitative elemental analysis down to trace levels. During microbeam analysis, where the beam is collimated and focused into a small spot, the beam current reduces to nA or less. The generation of characteristic X-rays is reduced in the same proportion, leading to long data-acquisition times. This can partly be compensated for by using detectors with a large solid angle. In this work, the performance of an annular eight-element silicon drift detector with a total solid angle of 261 msr is described. The initial calibration of the detector was performed using thin elemental standards. Charge measurement was carried out both in a Faraday Cup positioned after the sample and by a pre-sample electrostatic deflection system sampling the beam charge into another Faraday Cup. The two methods were used in parallel and compared during the calibration measurements. A recently installed Versa Module Europe (VME) based data acquisition system equipped with, for example, multi-hit time-to-digital converters, amplifiers, and 32-channel scalers, was used to record data in event-by-event mode for simultaneous data evaluation on multiple computers. Off-line dead time and pile-up corrections were made on the event data that was sorted into spectra and fitted with the GeoPIXE software. The pre-sample deflection charge measurement gave consistent values for the calibration, and this is an important observation implying that non-conductive and thick samples will be able to quantify without the use of internal standards.
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3.
  • Pallon, J., et al. (författare)
  • Ion beam evaluation of silicon carbide membrane structures intended for particle detectors
  • 2016
  • Ingår i: Nuclear Instruments and Methods in Physics Research Section B. - : Elsevier BV. - 0168-583X .- 1872-9584. ; 371, s. 132-136
  • Tidskriftsartikel (refereegranskat)abstract
    • Thin ion transmission detectors can be used as a part of a telescope detector for mass and energy identification but also as a pre-cell detector in a microbeam system for studies of biological effects from single ion hits on individual living cells. We investigated a structure of graphene on silicon carbide (SiC) with the purpose to explore a thin transmission detector with a very low noise level and having mechanical strength to act as a vacuum window. In order to reach very deep cavities in the SiC wafers for the preparation of the membrane in the detector, we have studied the Inductive Coupled Plasma technique to etch deep circular cavities in 325 μm prototype samples. By a special high temperature process the outermost layers of the etched SiC wafers were converted into a highly conductive graphitic layer. The produced cavities were characterized by electron microscopy, optical microscopy and proton energy loss measurements. The average membrane thickness was found to be less than 40 μm, however, with a slightly curved profile. Small spots representing much thinner membrane were also observed and might have an origin in crystal defects or impurities. Proton energy loss measurement (also called Scanning Transmission Ion Microscopy, STIM) is a well suited technique for this thickness range. This work presents the first steps of fabricating a membrane structure of SiC and graphene which may be an attractive approach as a detector due to the combined properties of SiC and graphene in a monolithic materials structure.
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