| 1. |
- Johansson, Karl-Axel, et al.
(författare)
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The quality assurance process for the ARTSCAN head and neck study - a practical interactive approach for QA in 3DCRT and IMRT.
- 2008
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Ingår i: Radiotherapy and oncology : journal of the European Society for Therapeutic Radiology and Oncology. - : Elsevier BV. - 0167-8140 .- 1879-0887. ; 87:2, s. 290-9
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Tidskriftsartikel (refereegranskat)abstract
- AIM: This paper describes the quality assurance (QA) work performed in the Swedish multicenter ARTSCAN (Accelerated RadioTherapy of Squamous cell CArcinomas in the head and Neck) trial to guarantee high quality in a multicenter study which involved modern radiotherapy such as 3DCRT or IMRT. MATERIALS AND METHODS: The study was closed in June 2006 with 750 randomised patients. Radiation therapy-related data for every patient were sent by each participating centre to the QA office where all trial data were reviewed, analysed and stored. In case of any deviation from the protocol, an interactive process was started between the QA office and the local responsible clinician and/or physicist to increase the compliance to the protocol for future randomised patients. Meetings and workshops were held on a regular basis for discussions on various trial-related issues and for the QA office to report on updated results. RESULTS AND DISCUSSION: This review covers the 734 patients out of a total of 750 who had entered the study. Deviations early in the study were corrected so that the overall compliance to the protocol was very high. There were only negligible variations in doses and dose distributions to target volumes for each specific site and stage. The quality of the treatments was high. Furthermore, an extensive database of treatment parameters was accumulated for future dose-volume vs. endpoint evaluations. CONCLUSIONS: This comprehensive QA programme increased the probability to draw firm conclusions from our study and may serve as a concept for QA work in future radiotherapy trials where comparatively small effects are searched for in a heterogeneous tumour population.
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| 2. |
- Flink, Axel, et al.
(författare)
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Microstructural characterization of the tool-chip interface enabled by focused ion beam and analytical electron microscopy
- 2009
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Ingår i: WEAR. - : Elsevier BV. - 0043-1648. ; 266:11-12, s. 1237-1240
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Tidskriftsartikel (refereegranskat)abstract
- A method based on focused ion beam milling and analytical electron microscopy to investigate the nature of the tool-chip interface is presented. It is employed to study tool-chip interfaces of the rake face of a (Ti0.83Si0.17)N coated PCBN insert after turning of case-hardened steel. Analytical electron microscopy shows the presence of a smeared adhered layer on the coating, which consists of steel elements from the work-piece, oxygen, and Si and N, most likely originating from the coating.
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| 3. |
- Knutsson, Axel, et al.
(författare)
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Thermal decomposition products in arc evaporated TiAlN/TiN multilayers
- 2008
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Ingår i: Applied Physics Letters. - : AIP Publishing. - 0003-6951 .- 1077-3118. ; 93:14, s. 143110-
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Tidskriftsartikel (refereegranskat)abstract
- Cubic metastable Ti0.34Al0.66 N/TiN multilayers were grown by reactive arc evaporation using Ti33-Al67 and Ti cathodes in a N2 atmosphere. X-ray diffractometry and high resolution transmission electron microscopy revealed that metastable c-Ti 0.34Al0.66N partly decomposes after annealing at 900 °C into c-TiN rich and c-AlN rich phases with retained lattice coherency. Elemental mapping by energy dispersive x-ray spectroscopy showed a homogenous distribution of Ti and Al in the as-deposited 25 nm Ti0.34Al 0.66N layers. The annealed Ti0.34Al0.66N layers exhibited coherent 5 nm domains with high Al content surrounded by a high Ti content matrix. This nanostructure formation is discussed in terms of spinodal decomposition. © 2008 American Institute of Physics.
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| 4. |
- Söderberg, Hans, et al.
(författare)
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Growth and characterization of TiN/SiN(001)superlattice films
- 2007
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Ingår i: Journal of Materials Research. - 0884-2914 .- 2044-5326. ; 22:11, s. 3255-3264
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Tidskriftsartikel (refereegranskat)abstract
- We report the layer structure and composition in recently discovered TiN/SiN(001) superlattices deposited by dual-reactive magnetron sputtering on MgO(001) substrates. High-resolution transmission electron microscopy combined with Z-contrast scanning transmission electron microscopy, x-ray reflection, diffraction, and reciprocal-space mapping shows the formation of high-quality superlattices with coherently strained cubic TiN and SiN layers for SiN thickness below 7-10 Å. For increasing SiN layer thicknesses, a transformation from epitaxial to amorphous SiNx (x 1) occurs during growth. Elastic recoil detection analysis revealed an increase in nitrogen and argon content in SiNx layers during the phase transformation. The oxygen, carbon, and hydrogen contents in the multilayers were around the detection limit (∼0.1 at.%) with no indication of segregation to the layer interfaces. Nanoindentation experiments confirmed superlattice hardening in the films. The highest hardness of 40.4 ± 0.8 GPa was obtained for 20-Å TiN with 5-Å-thick SiN(001) interlayers, compared to monolithic TiN at 20.2 ± 0.9 GPa.
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