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Electronic structure of the Si(110)-(16×2) surface : High-resolution ARPES and STM investigation

Sakamoto, Kazuyuki (author)
Chiba University
Setvin, Martin (author)
National Institute of Material Science, Japan
Mawatari, Kenji (author)
Tohoku University
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Eriksson, Johan (author)
Linköpings universitet,Yt- och Halvledarfysik,Tekniska högskolan,Yt- och Halvledarfysik, Surface and Semiconductor Physics
Miki, Kazushi (author)
National Institute of Material Science, Japan
Uhrberg, Roger (author)
Linköpings universitet,Yt- och Halvledarfysik,Tekniska högskolan,Yt- och Halvledarfysik, Surface and Semiconductor Physics
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 (creator_code:org_t)
2009
2009
English.
In: Physical Review B. Condensed Matter and Materials Physics. - 1098-0121 .- 1550-235X. ; 79:4, s. 045304-
  • Journal article (peer-reviewed)
Abstract Subject headings
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  • The electronic structure of a single domain Si(110)-(16×2) surface has been investigated by high-resolution angle-resolved photoelectron spectroscopy and scanning tunneling microscopy (STM). Four semiconducting surface states with flat dispersions, whose binding energies are 0.2, 0.4, 0.75, and 1.0 eV, were observed in the bulk band gap and more than six states were observed within the projected bulk band at binding energies less than 5.2 eV. The origins of the four surface states and of one state at a binding energy of approximately 1.5 eV at the Γ̅ point are discussed based on the local density of states mappings obtained by STM. Further, a structural model that can explain all these five states is proposed.

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NATURVETENSKAP

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