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- Hank, Andrew M., et al.
(författare)
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Comparative Characterisation of CNS/Epoxy and BN/Epoxy Nanodielectrics using Electrical Tree PD Measurements and Atomic Force Microscopy
- 2020
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Ingår i: International Journal of Engineering Research in Africa. - 1663-3571 .- 1663-4144. ; 48, s. 24-37
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Tidskriftsartikel (refereegranskat)abstract
- This paper contributes to the body of knowledge on the efforts to develop nanodielectrics as the next generation of insulation material. The time-to-failure under electrical tree-induced degradation of 1.09-1.35 vol.% hexagonal BN/Epoxy was found to be 3 times longer than in clean epoxy. For 0.31-0.33 vol.% CNS/Epoxy the time-to-failure was 24 times longer than the clean epoxy. The electrical treeing partial discharge behaviour in the BN/Epoxy and CNS/Epoxy showed distinct time-evolution characteristics different from those in the clean epoxy. The improved electrical tree endurance in BN/Epoxy relative to the clean epoxy can be attributed to increased mechanical stiffness. The superiority of the CNS/Epoxy as a nanodielectric is notable. The effect is suggested to be due to the electron affinity properties of the carbon nanospheres at appropriate dispersion levels.
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