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- Thölén, Anders, 1938
(författare)
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Stress fields at boundaries between contacting particles
- 2006
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Ingår i: Journal of Materials Science. - : Springer Science and Business Media LLC. - 0022-2461 .- 1573-4803. ; 41:14, s. 4466-4476
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Tidskriftsartikel (refereegranskat)abstract
- Small metal particles in the size range 0.1Â d fringes near the contacting boundary as observed in the transmission electron microscope. The possible causes for these stress fields are investigated in terms of different models: adhesion, external forces (possibly magnetic), dislocations in the grain boundary area or "squeezed-in" extra material in the grain boundary zone. In all these cases high stresses are expected near the contacting area. Adhesion between particles becomes more apparent the smaller they are and is thus very important in nanotechnology.
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- Yao, Yiming, 1957, et al.
(författare)
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Adhesion between nanoparticles
- 1999
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Ingår i: Nanostructured Materials. ; 12:5-8, s. 661-664
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Tidskriftsartikel (övrigt vetenskapligt/konstnärligt)abstract
- A study of the contact and adhesion between panicles with clean surfaces (free from oxide and other contamination) is important but increasingly more difficult to perform as the particle size is reduced to a nanoscale. A reproducible way of finding such contacts between a large number of nanoparticles has been developed. Cobalt particles within the size range 5–200 nm have been obtained by ageing a solution-treated Cu-2Co (w/o) alloy at 600–800 °C, followed by the carbon film extraction technique. The dipole adhesion stress field was clearly observed in TEM. Convergent beam electron diffraction (CBED) proved that the free panicles were likely to contact with a common interface, and they often orientated in the same direction. This work establishes a solid experimental base for computational image matching of the adhesion properties of nanoparticles.
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- Yao, Yiming, 1957, et al.
(författare)
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Characterization of contacting boundaries between small particles with microdiffraction
- 2002
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Ingår i: Nanotechnology. ; 13:2, s. 169-174
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Tidskriftsartikel (övrigt vetenskapligt/konstnärligt)abstract
- Microdiffraction is used to characterize grain boundaries and misorientationbetween small particles. The incident beam and the trace direction of avertical contacting boundary can be determined from the diffraction spotsand the Kikuchi lines formed simultaneously by a small convergent probe ofthe electron beam. The bicrystal rotation can be obtained and thus theboundary structure of contacting particles can be estimated. The results forsmall particles of cobalt oxide showed that the accuracy of the method,which is mainly dominated by the determination of the trace and theverticality of the boundary, is comparable to that of the standardstereographic method, but the measurement and interpretation proceduresare greatly simplified. This method can be applied for various crystallinematerials including metals and alloys, ceramics, and semiconductorsprovided that the particle size is around 100 nm.
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- Yao, Yiming, 1957, et al.
(författare)
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Electron diffraction contrast from contacting nano-particles
- 1999
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Ingår i: 1999 Annual Scientific Meeting of ESF-NANO Programme “Vapor-Phase Synthesis and Processing of Nanoparticles Materials (NANO)”, Duisburg, Germany. ; , s. 27-31
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Konferensbidrag (refereegranskat)
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