| 1. |
- Allahgholi, A., et al.
(författare)
-
AGIPD 1.0 : The high-speed high dynamic range readout ASIC for the adaptive gain integrating pixel detector at the European XFEL
- 2014
-
Ingår i: 2014 IEEE Nuclear Science Symposium and Medical Imaging Conference, NSS/MIC 2014. - : Institute of Electrical and Electronics Engineers (IEEE). - 9781479960972
-
Konferensbidrag (refereegranskat)abstract
- AGIPD is a hybrid pixel X-ray detector developed by a collaboration between Deutsches Elektronen-Synchrotron (DESY), Paul-Scherrer-Institute (PSI), University of Hamburg and the University of Bonn. The detector is designed to comply with the requirements of the European XFEL. The radiation tolerant Application Specific Integrated Circuit (ASIC) is designed with the following highlights: high dynamic range, spanning from single photon sensitivity up to 104 × 12.4 keV photons, achieved by the use of dynamic gain switching, auto-selecting one of 3 gains of the charge sensitive pre-amplifier. To cope with the unique features of the European XFEL source, image data is stored in 352 analogue memory cells per pixel. The selected gain is stored in the same way and depth, encoded as one of 3 voltage levels. These memories are operated in random-access mode at 4.5MHz frame rate. Data is read out on a row-by-row basis via multiplexers to the DAQ system for digitisation during the 99.4ms gap between the bunch trains of the European XFEL. The AGIPD 1.0 ASIC features 64×64 pixels with a pixel area of 200×200 μm2. It is bump-bonded to a 500 μm thick silicon sensor. The principles of the chip architecture were proven in different experiments and the ASIC characterization was performed with a series of development prototypes. The mechanical concept of the detector system was developed in close contact with the XFEL beamline scientists to ensure a seamless integration into the beamline setup and is currently being manufactured. The first single module system was successfully tested at APS1 the high dynamic range allows imaging of the direct synchrotron beam along with single photon sensitivity and burst imaging of 352 subsequent frames synchronized to the source.
|
|
| 2. |
- Becker, J., et al.
(författare)
-
Architecture and design of the AGIPD detector for the European XFEL
- 2012
-
Konferensbidrag (refereegranskat)abstract
- AGIPD is a hybrid pixel detector developed by DESY, PSI, the University of Bonn and the University of Hamburg. The detector is targeted for use at the European XFEL, a source with unique properties: a bunch train of 2700 pulses with > 1012 photons of 12 keV each, only 100 fs long and with a 220 ns spacing, is repeated at a 10Hz rate. This puts up very demanding requirements: dynamic range has to cover the detection of single photons and extend up to > 104 photons/pixel in the same image, and as many images, as possible have to be recorded in the pixel to be read out between pulse trains. The high photon flux impinging on the detector also calls for a very radiation hard design of sensor and ASIC. The detector will consist of 16 Sensor modules arranged around a central hole for the direct beam. Each made of a single sensor bump-bonded to 2 × 8 readout chips of 64 × 64 pixels in a grid of 200 μm pitch. Each pixel of these ASICs contains a charge sensitive preamplifier featuring adaptive gain switching, changing sensitivity in three ranges, and a buffer to provide correlated double sampling (in the highest sensitivity mode). Most of the pixel area, albeit, is used for an analogue memory to record 352 frames. It is operated in random-access mode: data containing bad frames can be overwritten and the memory can be used in the most efficient way. The readout between two bunch trains is arranged via 4 ports: Data from pixels of one row is read in parallel and serialised by 4 multiplexers at the end of the pixel columns and driven off-chip as differential signals. The operation of the ASIC is controlled via a three-line serial interface, using a command based protocol. It is also used to configure the chip's operational parameters and internal timings. © 2012 IEEE.
|
|
| 3. |
- Becker, J., et al.
(författare)
-
High speed cameras for X-rays : AGIPD and others
- 2013
-
Ingår i: Journal of Instrumentation. - 1748-0221 .- 1748-0221. ; 8:1, s. Art. no. C01042-
-
Tidskriftsartikel (refereegranskat)abstract
- Experiments at high pulse rate Free Electron Laser (FEL) facilities require new cameras capable of acquiring 2D images at high rates, handling large signal dynamic ranges and resolving images from individual pulses. The Adaptive Gain Integrated Pixel Detector (AGIPD) will operated with pulse rates and separations of 27000/s and 220 ns, respectively at European XFEL. Si-sensors, ASICs, PCBs, and FPGA logic are developed for a 1 Mega-pixel camera with 200 μm square pixels with per-pulse occupancies 104. Data from 3520 images/s will be transferred with 80 Gbits/s to a DAQ-system. The electronics have been adapted for use in other synchrotron light source detectors.
|
|
| 4. |
- Becker, J., et al.
(författare)
-
Performance tests of an AGIPD 0.4 assembly at the beamline P10 of PETRA III
- 2013
-
Ingår i: Journal of Instrumentation. - 1748-0221 .- 1748-0221. ; 8:6, s. Art. no. P06007-
-
Tidskriftsartikel (refereegranskat)abstract
- The Adaptive Gain Integrating Pixel Detector (AGIPD) is a novel detector system, currently under development by a collaboration of DESY, the Paul Scherrer Institute in Switzerland, the University of Hamburg and the University of Bonn, and is primarily designed for use at the European XFEL. To verify key features of this detector, an AGIPD 0.4 test chip assembly was tested at the P10 beamline of the PETRA III synchrotron at DESY. The test chip successfully imaged both the direct synchrotron beam and single 7.05 keV photons at the same time, demonstrating the large dynamic range required for XFEL experiments. X-ray scattering measurements from a test sample agree with standard measurements and show the chip's capability of observing dynamics at the microsecond time scale.
|
|
| 5. |
- Becker, J., et al.
(författare)
-
The high speed, high dynamic range camera AGIPD
- 2013
-
Ingår i: IEEE Nuclear Science Symposium Conference Record. - : IEEE conference proceedings. - 9781479905348 ; , s. Art. no. 6829504-
-
Konferensbidrag (refereegranskat)abstract
- The European X-Ray Free Electron Laser (XFEL) will provide ultra short, highly coherent X-ray pulses which will revolutionize scientific experiments in a variety of disciplines spanning physics, chemistry, materials science, and biology. One of the differences between the European XFEL and other free electron laser sources is the high pulse frequency of 4.5 MHz. The European XFEL will provide pulse trains, consisting of up to 2700 pulses separated by 220 ns (600 μs in total) followed by an idle time of 99.4 ms, resulting in a supercycle of 10 Hz. Dedicated fast 2D detectors are being developed, one of which is the Adaptive Gain Integrating Pixel Detector (AGIPD). AGIPD is based on the hybrid pixel technology. The design goals of the recently produced, radiation hard Application Specific Integrated Circuit (ASIC) with dynamic gain switching amplifiers are (for each pixel) a dynamic range of more than 10 4 12.4 keV photons in the lowest gain, single photon sensitivity in the highest gain, an analog memory capable of storing 352 images, and operation at 4.5 MHz frame rate. A vetoing scheme allows to maximize the number of useful images that are acquired by providing the possibility to overwrite any previously recorded image during the pulse train. The AGIPD will feature a pixel size of (200 μm)2 and a silicon sensor with a thickness of 500 μm. The image data is read out and digitized between pulse trains. © 2013 IEEE.
|
|
| 6. |
- Bianco, L., et al.
(författare)
-
The AGIPD System for the European XFEL
- 2013
-
Ingår i: ADVANCES IN X-RAY FREE-ELECTRON LASERS II. - : SPIE. - 9780819495808 ; , s. Art. no. UNSP 87780V-
-
Konferensbidrag (refereegranskat)abstract
- The European XFEL will generate extremely brilliant pulses of X-rays organized in pulse trains consisting of 2700 pulses <100 fs long, with >10(12) photons, and with a 220 ns spacing. The pulse trains are running at a 10Hz repetition rate. The detector to be used under these conditions will have to face several challenges: the dynamic range has to cover the detection of single photons and extend up to >10(4) photons/pixel/pulse in the same image, framing rates of 4.5 MHz (220 ns) are required in order to record one image per pulse, and as many images as possible have to be recorded during the pulse trains. Due to the high flux, the detector will have to withstand a dose up to 1GGy integrated over 3 years. To meet these challenges a consortium, consisting of Deutsches Elektronensynchrotron (DESY), Paul-Scherrer-Institut (PSI), University of Hamburg and University of Bonn, is developing the Adaptive Gain Integrating Pixel Detector (AGIPD). It is a hybrid-pixel detector, featuring a charge integrating amplifier with dynamic gain switching to cope with the extended dynamic range, and an analogue on-pixel memory for image storage at the required 4.5 MHz frame rate. The readout chip consists of 64x64 pixels of (200 mu m)(2), 8x2 of these readout chips are bump-bonded to a monolithic silicon sensor to form the basic module with 512 x 128 pixels. 4 of these modules are stacked to form a quadrant of the 1k x 1k detector system. Each quadrant is independently moveable in order to adjust a central hole, needed for the direct beam to pass through. Special designs are employed for both the sensor and the readout chip to withstand the integrated dose for 3 years.
|
|
| 7. |
- Greiffenberg, D., et al.
(författare)
-
Optimization of the noise performance of the AGIPD prototype chips
- 2013
-
Ingår i: Journal of Instrumentation. - 1748-0221 .- 1748-0221. ; 8:10, s. Art. no. P10022-
-
Tidskriftsartikel (refereegranskat)abstract
- The charge integrating readout electronics AGIPD (adaptive gain integrating pixel detector) is a hybrid detector system developed for the European XFEL. It features a threefold dynamic gain switching to be able to resolve single photons and to cover a dynamic range of 104·12.4 keV photons. As a result of dynamic gain switching, single photon resolution will be achieved in the high gain stage, while the maximum dynamic range will be reached in the low gain stage. The specification to resolve single photons requires a signal-over-noise ratio of at least 10 for a single incoming photon with an energy of 12.4 keV. When using a silicon sensor, that translates to an equivalent noise charge of less than 343 e-. Several AGIPD prototype chips have been designed and characterized, particularly focusing on the noise performance. During the testing phase, the dominant noise sources were identified and the corresponding circuit blocks were improved in the subsequent ASICs. This paper reports on the procedures to identify the dominating noise sources, the optimization process of the circuit blocks and discusses the effect of the optimization on the noise performance.© 2013 IOP Publishing Ltd and Sissa Medialab srl.
|
|
| 8. |
- Greiffenberg, D., et al.
(författare)
-
Towards AGIPD1.0 : Optimization of the dynamic range and investigation of a pixel input protection
- 2014
-
Ingår i: Journal of Instrumentation. - 1748-0221 .- 1748-0221. ; 9:6, s. Art. no. P06001-
-
Tidskriftsartikel (refereegranskat)abstract
- AGIPD is a charge integrating, hybrid pixel readout ASIC, which is under development for the European XFEL [1,2]. A dynamic gain switching logic at the output of the preamplifier (preamp) is used to provide single photon resolution as well as covering a dynamic range of at least 104·12.4 keV photons [3,4]. Moreover, at each point of the dynamic range the electronics noise should be lower than the Poisson fluctuations, which is especially challenging at the points of gain switching. This paper reports on the progress of the chip design on the way to the first full-scale chip AGIPD1.0, focusing on the optimization of the dynamic range and the implementation of protection circuits at the preamplifier input to avoid pixel destruction due to high intense spots. © 2014 IOP Publishing Ltd and Sissa Medialab srl.
|
|
| 9. |
- Marras, A., et al.
(författare)
-
Front end electronics for European XFEL sensor : The AGIPD project
- 2013
-
Ingår i: Nuclear Instruments and Methods in Physics Research Section A. - : Elsevier BV. - 0168-9002 .- 1872-9576. ; 731, s. 79-82
-
Tidskriftsartikel (refereegranskat)abstract
- The AGIPD (Adaptive Gain Integrating Pixel Detector) is a detector under development, to be used in the European X-ray Free-Electron Laser (XFEL). The constraints imposed by the XFEL source are discussed, and the solutions implemented to cope with them are explained. The present status of the project is reported, along with results achieved in terms of noise, memory depth, and radiation tolerance. © 2013 Elsevier B.V.
|
|
| 10. |
- Marras, A., et al.
(författare)
-
Vertically integrated circuits : Example of an application to an x-ray detector
- 2014
-
Ingår i: 2014 21st IEEE International Conference on Electronics, Circuits and Systems, ICECS 2014. - 9781479942428 ; , s. 243-246
-
Konferensbidrag (refereegranskat)abstract
- Replacing planar circuits with vertically integrated ones allows to increment circuit functionalities on a given silicon area, while avoiding some of the problems associated with aggressively scaled technology nodes. This is particularly true for applications likely to subject circuits to high doses of ionizing radiation (such of x-ray detectors to be used in synchrotron rings and Free Electron Lasers), since the degradation mechanisms of some of the innovative materials to be used in most recent nodes have not been fully characterized yet. In this paper, an evolution is presented for the readout ASIC of a pixelated x-ray detector to be used for such applications. The readout circuit is distributed in a stack of two vertically interconnected tiers, thus doubling the circuitry resident in each pixel without increasing the pixel pitch (and thus compromising spatial resolution of the detector). A first prototype has been designed and manufactured, using a commercial 130 nm CMOS technology. Design issues are discussed, along with preliminary characterization results. © 2014 IEEE.
|
|
