1. |
- Vagovič, Patrik, et al.
(författare)
-
Megahertz x-ray microscopy at x-ray free-electron laser and synchrotron sources
- 2019
-
Ingår i: Optica. - 2334-2536. ; 6:9, s. 1106-1109
-
Tidskriftsartikel (refereegranskat)abstract
- Modern emerging technologies, such as additive manufacturing, bioprinting, and new material production, require novel metrology tools to probe fundamental high-speed dynamics happening in such systems. Here we demonstrate the application of the megahertz (MHz) European X-ray Free-Electron Laser (EuXFEL) to image the fast stochastic processes induced by a laser on water-filled capillaries with micrometer-scale spatial resolution. The EuXFEL provides superior contrast and spatial resolution compared to equivalent state-of-the-art synchrotron experiments. This work opens up new possibilities for the characterization of MHz stochastic processes on the nanosecond to microsecond time scales with object velocities up to a few kilometers per second using XFEL sources.
|
|